DE69618904T2 - Probenanalyse - Google Patents

Probenanalyse

Info

Publication number
DE69618904T2
DE69618904T2 DE69618904T DE69618904T DE69618904T2 DE 69618904 T2 DE69618904 T2 DE 69618904T2 DE 69618904 T DE69618904 T DE 69618904T DE 69618904 T DE69618904 T DE 69618904T DE 69618904 T2 DE69618904 T2 DE 69618904T2
Authority
DE
Germany
Prior art keywords
electrodes
detector
sample
internal volume
surface layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69618904T
Other languages
German (de)
English (en)
Other versions
DE69618904D1 (de
Inventor
Robert D. Brittain
Mingda Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Inc
Original Assignee
Varian Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Inc filed Critical Varian Inc
Application granted granted Critical
Publication of DE69618904D1 publication Critical patent/DE69618904D1/de
Publication of DE69618904T2 publication Critical patent/DE69618904T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/025Detectors specially adapted to particle spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/32559Protection means, e.g. coatings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69618904T 1995-11-03 1996-11-01 Probenanalyse Expired - Lifetime DE69618904T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/552,417 US5633497A (en) 1995-11-03 1995-11-03 Surface coating to improve performance of ion trap mass spectrometers

Publications (2)

Publication Number Publication Date
DE69618904D1 DE69618904D1 (de) 2002-03-14
DE69618904T2 true DE69618904T2 (de) 2002-10-31

Family

ID=24205249

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69618904T Expired - Lifetime DE69618904T2 (de) 1995-11-03 1996-11-01 Probenanalyse

Country Status (5)

Country Link
US (1) US5633497A (enExample)
EP (1) EP0772224B1 (enExample)
JP (1) JP3753813B2 (enExample)
CA (1) CA2189483C (enExample)
DE (1) DE69618904T2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5629519A (en) * 1996-01-16 1997-05-13 Hitachi Instruments Three dimensional quadrupole ion trap
US6037587A (en) * 1997-10-17 2000-03-14 Hewlett-Packard Company Chemical ionization source for mass spectrometry
US6608318B1 (en) 2000-07-31 2003-08-19 Agilent Technologies, Inc. Ionization chamber for reactive samples
US7411187B2 (en) 2005-05-23 2008-08-12 The Regents Of The University Of Michigan Ion trap in a semiconductor chip
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US12033843B2 (en) * 2020-03-26 2024-07-09 Agilent Technologies, Inc. Mass spectrometry ION source

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4126781A (en) * 1977-05-10 1978-11-21 Extranuclear Laboratories, Inc. Method and apparatus for producing electrostatic fields by surface currents on resistive materials with applications to charged particle optics and energy analysis
JPS5830056A (ja) * 1981-08-14 1983-02-22 Hitachi Ltd 四重極質量分析計の柱状電極
US4605946A (en) * 1984-08-16 1986-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Fet charge sensor and voltage probe
CN85102774B (zh) * 1985-04-01 1987-11-04 复旦大学 利用封闭边界产生静电四极场的结构
US5021654A (en) * 1989-04-28 1991-06-04 Environmental Technologies Group, Inc. All ceramic ion mobility spectrometer cell
US5283436A (en) * 1990-01-08 1994-02-01 Bruker-Franzen Analytik Gmbh Generation of an exact three-dimensional quadrupole electric field and superposition of a homogeneous electric field in trapping-exciting mass spectrometer (TEMS)
US5055678A (en) * 1990-03-02 1991-10-08 Finnigan Corporation Metal surfaces for sample analyzing and ionizing apparatus
GB2262649B (en) * 1991-12-13 1995-03-01 Marconi Gec Ltd Energy analyser

Also Published As

Publication number Publication date
JP3753813B2 (ja) 2006-03-08
CA2189483A1 (en) 1997-05-04
EP0772224B1 (en) 2002-01-30
EP0772224A1 (en) 1997-05-07
US5633497A (en) 1997-05-27
CA2189483C (en) 2001-10-23
JPH09229903A (ja) 1997-09-05
DE69618904D1 (de) 2002-03-14

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