JP3753813B2 - 質量分析計の性能を改良するための表面コーティング - Google Patents

質量分析計の性能を改良するための表面コーティング Download PDF

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Publication number
JP3753813B2
JP3753813B2 JP30083096A JP30083096A JP3753813B2 JP 3753813 B2 JP3753813 B2 JP 3753813B2 JP 30083096 A JP30083096 A JP 30083096A JP 30083096 A JP30083096 A JP 30083096A JP 3753813 B2 JP3753813 B2 JP 3753813B2
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JP
Japan
Prior art keywords
sample
detector
coating
electric field
ion trap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP30083096A
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English (en)
Japanese (ja)
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JPH09229903A5 (enExample
JPH09229903A (ja
Inventor
ロバート・ディー・ブリタイン
ミンダ・ワング
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Inc
Original Assignee
Varian Inc
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Publication date
Application filed by Varian Inc filed Critical Varian Inc
Publication of JPH09229903A publication Critical patent/JPH09229903A/ja
Publication of JPH09229903A5 publication Critical patent/JPH09229903A5/ja
Application granted granted Critical
Publication of JP3753813B2 publication Critical patent/JP3753813B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32532—Electrodes
    • H01J37/32559—Protection means, e.g. coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP30083096A 1995-11-03 1996-10-28 質量分析計の性能を改良するための表面コーティング Expired - Fee Related JP3753813B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/552,417 US5633497A (en) 1995-11-03 1995-11-03 Surface coating to improve performance of ion trap mass spectrometers
US552417 1995-11-03

Publications (3)

Publication Number Publication Date
JPH09229903A JPH09229903A (ja) 1997-09-05
JPH09229903A5 JPH09229903A5 (enExample) 2004-08-19
JP3753813B2 true JP3753813B2 (ja) 2006-03-08

Family

ID=24205249

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30083096A Expired - Fee Related JP3753813B2 (ja) 1995-11-03 1996-10-28 質量分析計の性能を改良するための表面コーティング

Country Status (5)

Country Link
US (1) US5633497A (enExample)
EP (1) EP0772224B1 (enExample)
JP (1) JP3753813B2 (enExample)
CA (1) CA2189483C (enExample)
DE (1) DE69618904T2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5629519A (en) * 1996-01-16 1997-05-13 Hitachi Instruments Three dimensional quadrupole ion trap
US6037587A (en) * 1997-10-17 2000-03-14 Hewlett-Packard Company Chemical ionization source for mass spectrometry
US6608318B1 (en) 2000-07-31 2003-08-19 Agilent Technologies, Inc. Ionization chamber for reactive samples
US7411187B2 (en) 2005-05-23 2008-08-12 The Regents Of The University Of Michigan Ion trap in a semiconductor chip
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US12033843B2 (en) * 2020-03-26 2024-07-09 Agilent Technologies, Inc. Mass spectrometry ION source

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4126781A (en) * 1977-05-10 1978-11-21 Extranuclear Laboratories, Inc. Method and apparatus for producing electrostatic fields by surface currents on resistive materials with applications to charged particle optics and energy analysis
JPS5830056A (ja) * 1981-08-14 1983-02-22 Hitachi Ltd 四重極質量分析計の柱状電極
US4605946A (en) * 1984-08-16 1986-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Fet charge sensor and voltage probe
CN85102774B (zh) * 1985-04-01 1987-11-04 复旦大学 利用封闭边界产生静电四极场的结构
US5021654A (en) * 1989-04-28 1991-06-04 Environmental Technologies Group, Inc. All ceramic ion mobility spectrometer cell
US5283436A (en) * 1990-01-08 1994-02-01 Bruker-Franzen Analytik Gmbh Generation of an exact three-dimensional quadrupole electric field and superposition of a homogeneous electric field in trapping-exciting mass spectrometer (TEMS)
US5055678A (en) * 1990-03-02 1991-10-08 Finnigan Corporation Metal surfaces for sample analyzing and ionizing apparatus
GB2262649B (en) * 1991-12-13 1995-03-01 Marconi Gec Ltd Energy analyser

Also Published As

Publication number Publication date
CA2189483A1 (en) 1997-05-04
EP0772224B1 (en) 2002-01-30
EP0772224A1 (en) 1997-05-07
DE69618904T2 (de) 2002-10-31
US5633497A (en) 1997-05-27
CA2189483C (en) 2001-10-23
JPH09229903A (ja) 1997-09-05
DE69618904D1 (de) 2002-03-14

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