DE69606690T2 - Magnetometrischer Sensor mit zwei aus spinpolarisiertem Material magnetisch isolierten Bereichen und durch dessen Verwendung erhältlicher Magnetkopf - Google Patents
Magnetometrischer Sensor mit zwei aus spinpolarisiertem Material magnetisch isolierten Bereichen und durch dessen Verwendung erhältlicher MagnetkopfInfo
- Publication number
- DE69606690T2 DE69606690T2 DE69606690T DE69606690T DE69606690T2 DE 69606690 T2 DE69606690 T2 DE 69606690T2 DE 69606690 T DE69606690 T DE 69606690T DE 69606690 T DE69606690 T DE 69606690T DE 69606690 T2 DE69606690 T2 DE 69606690T2
- Authority
- DE
- Germany
- Prior art keywords
- spin
- magnetic head
- magnetometric sensor
- magnetically isolated
- polarized material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/332—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using thin films
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/40—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials of magnetic semiconductor materials, e.g. CdCr2S4
- H01F1/401—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials of magnetic semiconductor materials, e.g. CdCr2S4 diluted
- H01F1/407—Diluted non-magnetic ions in a magnetic cation-sublattice, e.g. perovskites, La1-x(Ba,Sr)xMnO3
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measuring Magnetic Variables (AREA)
- Magnetic Heads (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31238095 | 1995-11-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69606690D1 DE69606690D1 (de) | 2000-03-23 |
DE69606690T2 true DE69606690T2 (de) | 2000-09-28 |
Family
ID=18028566
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69606690T Expired - Lifetime DE69606690T2 (de) | 1995-11-30 | 1996-11-27 | Magnetometrischer Sensor mit zwei aus spinpolarisiertem Material magnetisch isolierten Bereichen und durch dessen Verwendung erhältlicher Magnetkopf |
Country Status (3)
Country | Link |
---|---|
US (1) | US5721654A (de) |
EP (1) | EP0777212B1 (de) |
DE (1) | DE69606690T2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6721149B1 (en) * | 2000-02-11 | 2004-04-13 | Western Digital (Fremont), Inc. | Tunneling magnetoresistance spin-valve read sensor with LaNiO3 spacer |
AU2001249845A1 (en) * | 2000-04-06 | 2001-10-23 | Sang-Wook Cheong | Chemical-pressure tailoring of low-field, room temperature magnetoresistance in (ca, sr, ba) fe0.5mo0.5o3 |
AU2002230791A1 (en) * | 2000-10-26 | 2002-05-06 | University Of Iowa Research Foundation | Unipolar spin diode and transistor and the applications of the same |
WO2005060657A2 (en) * | 2003-12-15 | 2005-07-07 | Yale University | Magnetoelectronic devices based on colossal magnetoresistive thin films |
JP6121311B2 (ja) * | 2013-11-14 | 2017-04-26 | アルプス電気株式会社 | 磁気検知装置 |
US9276197B2 (en) * | 2013-11-21 | 2016-03-01 | The United States Of America As Represented By The Secretary Of The Navy | Hybrid domain wall-hall cross device |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5487356A (en) * | 1992-08-07 | 1996-01-30 | Advanced Technology Materials, Inc. | Chemical vapor deposition method of growing oxide films with giant magnetoresistance |
US5432373A (en) * | 1992-12-15 | 1995-07-11 | Bell Communications Research, Inc. | Magnetic spin transistor |
JP3364309B2 (ja) * | 1993-03-15 | 2003-01-08 | 株式会社東芝 | 磁気抵抗効果素子および磁気記録装置 |
US5493465A (en) * | 1993-03-15 | 1996-02-20 | Kabushiki Kaisha Toshiba | Magnetoresistance effect element and magnetic recording apparatus |
DE4425356C2 (de) * | 1993-09-29 | 1998-07-02 | Siemens Ag | Magnetoresistiver Sensor unter Verwendung eines Sensormaterials mit perowskitähnlicher Kristallstruktur |
US5411814A (en) * | 1994-01-26 | 1995-05-02 | At&T Corp. | Article comprising magnetoresistive oxide of La, Ca, Mn additionally containing either of both of Sr and Ba |
GB2291205A (en) * | 1994-06-18 | 1996-01-17 | Univ Sheffield | Magnetic field responsive device |
US5652445A (en) * | 1995-04-21 | 1997-07-29 | Johnson; Mark B. | Hybrid hall effect device and method of operation |
US5654566A (en) * | 1995-04-21 | 1997-08-05 | Johnson; Mark B. | Magnetic spin injected field effect transistor and method of operation |
-
1996
- 1996-11-21 US US08/754,809 patent/US5721654A/en not_active Expired - Lifetime
- 1996-11-27 DE DE69606690T patent/DE69606690T2/de not_active Expired - Lifetime
- 1996-11-27 EP EP96118991A patent/EP0777212B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0777212A2 (de) | 1997-06-04 |
US5721654A (en) | 1998-02-24 |
EP0777212B1 (de) | 2000-02-16 |
EP0777212A3 (de) | 1998-01-28 |
DE69606690D1 (de) | 2000-03-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: TDK CORP., TOKIO/TOKYO, JP |
|
8320 | Willingness to grant licences declared (paragraph 23) |