DE69518468D1 - Verfahren zum Testen von grossen Speichermatrize während Systeminitialisation - Google Patents
Verfahren zum Testen von grossen Speichermatrize während SysteminitialisationInfo
- Publication number
- DE69518468D1 DE69518468D1 DE69518468T DE69518468T DE69518468D1 DE 69518468 D1 DE69518468 D1 DE 69518468D1 DE 69518468 T DE69518468 T DE 69518468T DE 69518468 T DE69518468 T DE 69518468T DE 69518468 D1 DE69518468 D1 DE 69518468D1
- Authority
- DE
- Germany
- Prior art keywords
- procedure
- large storage
- during system
- system initialization
- testing large
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/254,816 US5479413A (en) | 1994-06-06 | 1994-06-06 | Method for testing large memory arrays during system initialization |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69518468D1 true DE69518468D1 (de) | 2000-09-28 |
DE69518468T2 DE69518468T2 (de) | 2001-05-23 |
Family
ID=22965700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69518468T Expired - Fee Related DE69518468T2 (de) | 1994-06-06 | 1995-06-01 | Verfahren zum Testen von grossen Speichermatrizen während Systeminitialisation |
Country Status (3)
Country | Link |
---|---|
US (1) | US5479413A (de) |
EP (1) | EP0686981B1 (de) |
DE (1) | DE69518468T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5589849A (en) * | 1989-07-03 | 1996-12-31 | Ditzik; Richard J. | Display monitor position adjustment apparatus |
US5657443A (en) * | 1995-05-16 | 1997-08-12 | Hewlett-Packard Company | Enhanced test system for an application-specific memory scheme |
US5539878A (en) * | 1995-06-16 | 1996-07-23 | Elonex Technologies, Inc. | Parallel testing of CPU cache and instruction units |
US6279078B1 (en) * | 1996-06-28 | 2001-08-21 | Compaq Computer Corporation | Apparatus and method for synchronizing a cache mode in a dual controller, dual cache memory system operating in a plurality of cache modes |
US6412082B1 (en) * | 1997-12-17 | 2002-06-25 | Sony Corporation | Method and apparatus for selecting computer programs based on an error detection mechanism |
JP2000021193A (ja) * | 1998-07-01 | 2000-01-21 | Fujitsu Ltd | メモリ試験方法及び装置並びに記憶媒体 |
SE9802800D0 (sv) * | 1998-08-21 | 1998-08-21 | Ericsson Telefon Ab L M | Memory supervision |
US7085973B1 (en) * | 2002-07-09 | 2006-08-01 | Xilinx, Inc. | Testing address lines of a memory controller |
US7062678B2 (en) * | 2002-08-06 | 2006-06-13 | Lsi Logic Corporation | Diagnostic memory interface test |
US7418636B2 (en) * | 2004-12-22 | 2008-08-26 | Alcatel Lucent | Addressing error and address detection systems and methods |
EP2063432B1 (de) * | 2007-11-15 | 2012-08-29 | Grundfos Management A/S | Verfahren zum Prüfen eines Arbeitsspeichers |
JP2010044635A (ja) * | 2008-08-14 | 2010-02-25 | Hitachi Ltd | ファイルサーバシステム及びファイルサーバシステム起動方法 |
WO2011124681A1 (en) * | 2010-04-09 | 2011-10-13 | Verigy (Singapore) Pte. Ltd. | Method and automatic test equipment for performing a plurality of tests of a device under test |
DE102010027287A1 (de) * | 2010-07-16 | 2012-01-19 | Siemens Aktiengesellschaft | Verfahren und Vorrichtung zum prüfen eines Hauptspeichers eines Prozessors |
US8644098B2 (en) * | 2011-03-28 | 2014-02-04 | Peiyuan Liu | Dynamic random access memory address line test technique |
US10147499B1 (en) * | 2016-06-06 | 2018-12-04 | Apple Inc. | Memory power-up testing system |
US11663111B2 (en) * | 2020-01-02 | 2023-05-30 | Texas Instruments Incorporated | Integrated circuit with state machine for pre-boot self-tests |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4891811A (en) * | 1987-02-13 | 1990-01-02 | International Business Machines Corporation | Efficient address test for large memories |
DE3718182A1 (de) * | 1987-05-29 | 1988-12-15 | Siemens Ag | Verfahren und anordnung zur ausfuehrung eines selbsttestes eines wortweise organisierten rams |
US5155844A (en) * | 1990-02-14 | 1992-10-13 | International Business Machines Corporation | Background memory test during system start up |
JPH04271445A (ja) * | 1990-08-02 | 1992-09-28 | Internatl Business Mach Corp <Ibm> | メモリ・テスト装置 |
-
1994
- 1994-06-06 US US08/254,816 patent/US5479413A/en not_active Expired - Fee Related
-
1995
- 1995-06-01 DE DE69518468T patent/DE69518468T2/de not_active Expired - Fee Related
- 1995-06-01 EP EP95303770A patent/EP0686981B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5479413A (en) | 1995-12-26 |
EP0686981B1 (de) | 2000-08-23 |
EP0686981A2 (de) | 1995-12-13 |
EP0686981A3 (de) | 1996-02-07 |
DE69518468T2 (de) | 2001-05-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de | ||
8370 | Indication of lapse of patent is to be deleted | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |