DE69429959D1 - Optisches System für eine Reflexionsmessungsvorrichtung mit hoher Empfindlichkeit - Google Patents
Optisches System für eine Reflexionsmessungsvorrichtung mit hoher EmpfindlichkeitInfo
- Publication number
- DE69429959D1 DE69429959D1 DE69429959T DE69429959T DE69429959D1 DE 69429959 D1 DE69429959 D1 DE 69429959D1 DE 69429959 T DE69429959 T DE 69429959T DE 69429959 T DE69429959 T DE 69429959T DE 69429959 D1 DE69429959 D1 DE 69429959D1
- Authority
- DE
- Germany
- Prior art keywords
- optical system
- measuring device
- high sensitivity
- reflection measuring
- reflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 title 1
- 230000035945 sensitivity Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0019—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having reflective surfaces only (e.g. louvre systems, systems with multiple planar reflectors)
- G02B19/0023—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having reflective surfaces only (e.g. louvre systems, systems with multiple planar reflectors) at least one surface having optical power
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0085—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with both a detector and a source
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with infrared radiation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Toxicology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28859193A JP3390063B2 (ja) | 1993-10-25 | 1993-10-25 | 高感度反射測定装置用の光学系 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69429959D1 true DE69429959D1 (de) | 2002-04-04 |
DE69429959T2 DE69429959T2 (de) | 2002-10-10 |
Family
ID=17732243
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69429959T Expired - Lifetime DE69429959T2 (de) | 1993-10-25 | 1994-10-21 | Optisches System für eine Reflexionsmessungsvorrichtung mit hoher Empfindlichkeit |
Country Status (4)
Country | Link |
---|---|
US (1) | US5483350A (de) |
EP (1) | EP0650043B1 (de) |
JP (1) | JP3390063B2 (de) |
DE (1) | DE69429959T2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4392270B2 (ja) * | 2004-03-05 | 2009-12-24 | 日本分光株式会社 | 高感度反射測定装置 |
CN1257414C (zh) * | 2004-05-11 | 2006-05-24 | 罗筱泠 | 曲面反射镜 |
DE102015213147B4 (de) * | 2015-07-14 | 2023-09-28 | Carl Zeiss Spectroscopy Gmbh | Verfahren zur Bestimmung und Messkopf zur Erfassung einer Oberflächeneigenschaft genau einer Seite einer lichtdurchlässigen Probe |
CN106525249B (zh) * | 2016-10-26 | 2023-04-18 | 中国科学院云南天文台 | 一种镜面红外测温装置及测温方法 |
KR101894798B1 (ko) | 2017-06-15 | 2018-09-04 | 서울과학기술대학교 산학협력단 | 망원경을 이용한 유해물질 검출용 광송수신부 |
CN112986189B (zh) * | 2021-02-24 | 2022-02-11 | 中国科学院长春光学精密机械与物理研究所 | 反射测量装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5719647A (en) * | 1980-07-11 | 1982-02-01 | Hitachi Ltd | Inspecting device for sample of face plate |
DE3147689C2 (de) * | 1981-12-02 | 1984-04-26 | Bruker Analytische Meßtechnik GmbH, 7512 Rheinstetten | Zusatzgerät zur Durchführung von Reflexionsmessungen mit einem IR-Spektrometer |
US4747684A (en) * | 1986-09-30 | 1988-05-31 | The United States Of America As Represented By The Secretary Of The Army | Method of and apparatus for real-time crystallographic axis orientation determination |
DE68907519T2 (de) * | 1988-05-10 | 1993-10-21 | Amersham Int Plc | Biosensoren. |
EP0341928A1 (de) * | 1988-05-10 | 1989-11-15 | AMERSHAM INTERNATIONAL plc | Oberflächen-Resonanzplasmawellen-Sensoren |
US5093580A (en) * | 1990-03-02 | 1992-03-03 | Spectra-Tech, Inc. | ATR objective and method for sample analyzation using an ATR crystal |
US5019715A (en) * | 1990-03-02 | 1991-05-28 | Spectra-Tech, Inc. | Optical system and method for sample analyzation |
US5106196A (en) * | 1990-08-21 | 1992-04-21 | Brierley Philip R | Single adjustment specular reflection accessory for spectroscopy |
JPH05340870A (ja) * | 1992-06-04 | 1993-12-24 | Shimadzu Corp | 全反射吸収スペクトル測定装置 |
US5392175A (en) * | 1993-06-09 | 1995-02-21 | Maxtor Corporation | PCMCIA type HDD connector mount |
-
1993
- 1993-10-25 JP JP28859193A patent/JP3390063B2/ja not_active Expired - Lifetime
-
1994
- 1994-10-21 DE DE69429959T patent/DE69429959T2/de not_active Expired - Lifetime
- 1994-10-21 EP EP19940307746 patent/EP0650043B1/de not_active Expired - Lifetime
- 1994-10-24 US US08/328,087 patent/US5483350A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0650043B1 (de) | 2002-02-27 |
EP0650043A1 (de) | 1995-04-26 |
DE69429959T2 (de) | 2002-10-10 |
JP3390063B2 (ja) | 2003-03-24 |
US5483350A (en) | 1996-01-09 |
JPH07120379A (ja) | 1995-05-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |