DE69425898D1 - Hochpräzisionswaage und positionssensor - Google Patents

Hochpräzisionswaage und positionssensor

Info

Publication number
DE69425898D1
DE69425898D1 DE69425898T DE69425898T DE69425898D1 DE 69425898 D1 DE69425898 D1 DE 69425898D1 DE 69425898 T DE69425898 T DE 69425898T DE 69425898 T DE69425898 T DE 69425898T DE 69425898 D1 DE69425898 D1 DE 69425898D1
Authority
DE
Germany
Prior art keywords
position sensor
high precision
precision scale
scale
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69425898T
Other languages
English (en)
Other versions
DE69425898T2 (de
Inventor
A Bonin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bruker Nano Inc
Original Assignee
Hysitron Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hysitron Inc filed Critical Hysitron Inc
Application granted granted Critical
Publication of DE69425898D1 publication Critical patent/DE69425898D1/de
Publication of DE69425898T2 publication Critical patent/DE69425898T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04Fine scanning or positioning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/22Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in capacitance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G7/00Weighing apparatus wherein the balancing is effected by magnetic, electromagnetic, or electrostatic action, or by means not provided for in the preceding groups
    • G01G7/06Weighing apparatus wherein the balancing is effected by magnetic, electromagnetic, or electrostatic action, or by means not provided for in the preceding groups by electrostatic action
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/14Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/125Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0286Miniature specimen; Testing on microregions of a specimen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647Image analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Power Engineering (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DE69425898T 1993-10-01 1994-10-03 Hochpräzisionswaage und positionssensor Expired - Lifetime DE69425898T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13140593A 1993-10-01 1993-10-01
PCT/US1994/011184 WO1995010021A1 (en) 1993-10-01 1994-10-03 High precision scale and position sensor

Publications (2)

Publication Number Publication Date
DE69425898D1 true DE69425898D1 (de) 2000-10-19
DE69425898T2 DE69425898T2 (de) 2001-04-05

Family

ID=22449326

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69425898T Expired - Lifetime DE69425898T2 (de) 1993-10-01 1994-10-03 Hochpräzisionswaage und positionssensor

Country Status (5)

Country Link
EP (1) EP0721564B1 (de)
JP (1) JP3672921B2 (de)
AU (1) AU7963694A (de)
DE (1) DE69425898T2 (de)
WO (1) WO1995010021A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001343294A (ja) * 2000-05-31 2001-12-14 Ishida Co Ltd ロードセル及び秤
JP4365264B2 (ja) * 2004-04-28 2009-11-18 日本電信電話株式会社 電子部品装置
JP2017053801A (ja) * 2015-09-11 2017-03-16 藤倉ゴム工業株式会社 ストレッチャブル静電容量型センサ
JP2019512084A (ja) * 2016-02-03 2019-05-09 ハッチンソン テクノロジー インコーポレイテッドHutchinson Technology Incorporated 一体型リードを備えた小型圧力・力センサ
CN113028972B (zh) * 2021-02-26 2022-11-01 哈尔滨芯明天科技有限公司 一种闭环控制的纳米级三维精密定位台

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3307407A (en) * 1964-07-30 1967-03-07 Otto E Berg Micro-particle impact sensing apparatus
US3314493A (en) * 1964-11-04 1967-04-18 Kennedy James Patrick Electrical weigh scale with capacitive transducer
US4694687A (en) * 1986-04-17 1987-09-22 Vericom Corporation Vehicle performance analyzer
US4970374A (en) * 1988-09-02 1990-11-13 Matsushita Electric Industrial Co., Ltd. Automatic heating appliance with weight sensor
US5115291A (en) * 1989-07-27 1992-05-19 Honeywell Inc. Electrostatic silicon accelerometer
US4991283A (en) * 1989-11-27 1991-02-12 Johnson Gary W Sensor elements in multilayer ceramic tape structures
US5253526A (en) * 1990-05-30 1993-10-19 Copal Company Limited Capacitive acceleration sensor with free diaphragm
US5134886A (en) * 1991-04-16 1992-08-04 Ball Kenneth H Capacitive pressure transducer for use in respirator apparatus
US5174159A (en) * 1991-06-21 1992-12-29 University Of Utah Research Foundation Linear displacement and strain measuring apparatus
EP0623824B1 (de) * 1993-05-05 1996-11-06 LITEF GmbH Mikromechanische Beschleunigungsmessvorrichtung und Verfahren zu deren Herstellung

Also Published As

Publication number Publication date
EP0721564A4 (de) 1998-11-11
WO1995010021A1 (en) 1995-04-13
AU7963694A (en) 1995-05-01
JP3672921B2 (ja) 2005-07-20
EP0721564A1 (de) 1996-07-17
JPH09503864A (ja) 1997-04-15
DE69425898T2 (de) 2001-04-05
EP0721564B1 (de) 2000-09-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: 2K PATENTANWAELTE BLASBERG KEWITZ & REICHEL, PARTN