DE69423278T2 - Aufzeichnungs und Wiedergabeverfahren und Gerät mit einer Rastersonde - Google Patents

Aufzeichnungs und Wiedergabeverfahren und Gerät mit einer Rastersonde

Info

Publication number
DE69423278T2
DE69423278T2 DE69423278T DE69423278T DE69423278T2 DE 69423278 T2 DE69423278 T2 DE 69423278T2 DE 69423278 T DE69423278 T DE 69423278T DE 69423278 T DE69423278 T DE 69423278T DE 69423278 T2 DE69423278 T2 DE 69423278T2
Authority
DE
Germany
Prior art keywords
recording
information
reproducing
recording medium
scanning probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69423278T
Other languages
English (en)
Other versions
DE69423278D1 (de
Inventor
Oguchi Takahiro
Sakai Kunihiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Application granted granted Critical
Publication of DE69423278D1 publication Critical patent/DE69423278D1/de
Publication of DE69423278T2 publication Critical patent/DE69423278T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B19/00—Driving, starting, stopping record carriers not specifically of filamentary or web form, or of supports therefor; Control thereof; Control of operating function ; Driving both disc and head
    • G11B19/02—Control of operating function, e.g. switching from recording to reproducing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/861—Scanning tunneling probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/863—Atomic force probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
    • Y10S977/881—Microscopy or spectroscopy, e.g. sem, tem
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943—Information storage or retrieval using nanostructure
    • Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument

Landscapes

  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DE69423278T 1993-08-26 1994-08-26 Aufzeichnungs und Wiedergabeverfahren und Gerät mit einer Rastersonde Expired - Fee Related DE69423278T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05211779A JP3135753B2 (ja) 1993-08-26 1993-08-26 プローブを用いた記録再生方法および装置

Publications (2)

Publication Number Publication Date
DE69423278D1 DE69423278D1 (de) 2000-04-13
DE69423278T2 true DE69423278T2 (de) 2000-10-19

Family

ID=16611464

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69423278T Expired - Fee Related DE69423278T2 (de) 1993-08-26 1994-08-26 Aufzeichnungs und Wiedergabeverfahren und Gerät mit einer Rastersonde

Country Status (5)

Country Link
US (1) US5481522A (de)
EP (1) EP0640963B1 (de)
JP (1) JP3135753B2 (de)
AT (1) ATE190425T1 (de)
DE (1) DE69423278T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3581475B2 (ja) * 1995-02-13 2004-10-27 キヤノン株式会社 情報処理装置
JPH08287531A (ja) * 1995-04-11 1996-11-01 Hitachi Ltd 高密度情報記録装置
JP3966514B2 (ja) * 2002-05-23 2007-08-29 インターナショナル・ビジネス・マシーンズ・コーポレーション 記憶装置、および記憶装置を操作する方法
EP1365395B1 (de) * 2002-05-23 2012-09-05 International Business Machines Corporation Speichervorrichtung und Betriebsverfahren
US7155964B2 (en) * 2002-07-02 2007-01-02 Veeco Instruments Inc. Method and apparatus for measuring electrical properties in torsional resonance mode

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4133047A (en) * 1975-02-12 1979-01-02 Cyrus Levinthal System for storing and retrieving information at the molecular level
JPS6180536A (ja) * 1984-09-14 1986-04-24 ゼロツクス　コーポレーシヨン 原子規模密度情報記緑および読出し装置並びに方法
US4829507A (en) * 1984-09-14 1989-05-09 Xerox Corporation Method of and system for atomic scale readout of recorded information
DE3679319D1 (de) * 1986-05-27 1991-06-20 Ibm Speichereinheit mit direktem zugriff.
JPS6396756A (ja) * 1986-10-13 1988-04-27 Nippon Telegr & Teleph Corp <Ntt> 記憶装置
JPS63161522A (ja) * 1986-12-24 1988-07-05 Hitachi Maxell Ltd 磁性粉末およびそれを用いた磁気記録媒体
EP0551966B1 (de) * 1986-12-24 1999-04-14 Canon Kabushiki Kaisha Aufzeichnungsgerät und Wiedergabegerät
JP2556492B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 再生装置及び再生法
JPH01118274A (ja) * 1987-10-30 1989-05-10 Canon Inc デジタルデータの記録方式
JP2557964B2 (ja) * 1988-01-22 1996-11-27 インターナシヨナル・ビジネス・マシーンズ・コーポレイーシヨン データ記憶装置
JP2737017B2 (ja) * 1989-01-20 1998-04-08 キヤノン株式会社 光検知装置及び光検知方法
JPH02210633A (ja) * 1989-02-09 1990-08-22 Olympus Optical Co Ltd 走査型トンネル電流演算処理装置
EP0475365B1 (de) * 1990-09-14 1997-04-09 Canon Kabushiki Kaisha Nachführungsmethode für Speichergerät
JP2925771B2 (ja) * 1991-03-08 1999-07-28 キヤノン株式会社 情報記録担体及びこれを使用する情報処理装置
JP2744359B2 (ja) * 1991-04-24 1998-04-28 キヤノン株式会社 情報再生及び／又は情報記録装置
JP2930447B2 (ja) * 1991-05-15 1999-08-03 キヤノン株式会社 情報処理装置
JP3327933B2 (ja) * 1991-08-29 2002-09-24 株式会社リコー 情報記録再生方法及びその装置
CA2108457A1 (en) * 1992-02-14 1993-08-15 Seiji Kobayashi Information recording medium, information recording apparatus, information reproducing apparatus and information recording and reproducing apparatus

Also Published As

Publication number Publication date
EP0640963A1 (de) 1995-03-01
DE69423278D1 (de) 2000-04-13
JP3135753B2 (ja) 2001-02-19
EP0640963B1 (de) 2000-03-08
ATE190425T1 (de) 2000-03-15
US5481522A (en) 1996-01-02
JPH0765417A (ja) 1995-03-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee