DE69419999D1 - Optimierung der Emissionscharakteristik eines Lasers mit externem Resonator - Google Patents
Optimierung der Emissionscharakteristik eines Lasers mit externem ResonatorInfo
- Publication number
- DE69419999D1 DE69419999D1 DE69419999T DE69419999T DE69419999D1 DE 69419999 D1 DE69419999 D1 DE 69419999D1 DE 69419999 T DE69419999 T DE 69419999T DE 69419999 T DE69419999 T DE 69419999T DE 69419999 D1 DE69419999 D1 DE 69419999D1
- Authority
- DE
- Germany
- Prior art keywords
- optimization
- laser
- emission characteristics
- external resonator
- resonator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/105—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0287—Facet reflectivity
- H01S5/0288—Detuned facet reflectivity, i.e. reflectivity peak is different from gain maximum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08059—Constructional details of the reflector, e.g. shape
- H01S3/08063—Graded reflectivity, e.g. variable reflectivity mirror
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0287—Facet reflectivity
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/134,424 US5434874A (en) | 1993-10-08 | 1993-10-08 | Method and apparatus for optimizing output characteristics of a tunable external cavity laser |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69419999D1 true DE69419999D1 (de) | 1999-09-16 |
DE69419999T2 DE69419999T2 (de) | 1999-12-16 |
Family
ID=22463346
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69419999T Expired - Fee Related DE69419999T2 (de) | 1993-10-08 | 1994-10-04 | Optimierung der Emissionscharakteristik eines Lasers mit externem Resonator |
Country Status (4)
Country | Link |
---|---|
US (1) | US5434874A (de) |
EP (1) | EP0647995B1 (de) |
JP (1) | JP3637081B2 (de) |
DE (1) | DE69419999T2 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5642375A (en) * | 1995-10-26 | 1997-06-24 | Hewlett-Packard Company | Passively-locked external optical cavity |
US6100975A (en) * | 1996-05-13 | 2000-08-08 | Process Instruments, Inc. | Raman spectroscopy apparatus and method using external cavity laser for continuous chemical analysis of sample streams |
GB9614494D0 (en) * | 1996-07-10 | 1996-09-04 | Cookson Matthey Ceramics Plc | Improvements in printing |
US6529328B1 (en) * | 1998-08-07 | 2003-03-04 | Jds Fitel Inc. | Optical filter |
DE19942470B4 (de) * | 1998-09-08 | 2013-04-11 | Fujitsu Ltd. | Optisches Halbeitermodul und Verfahren zum Herstellen eines optischen Halbleitermoduls |
US6438150B1 (en) * | 1999-03-09 | 2002-08-20 | Telecordia Technologies, Inc. | Edge-emitting semiconductor laser having asymmetric interference filters |
US6295308B1 (en) | 1999-08-31 | 2001-09-25 | Corning Incorporated | Wavelength-locked external cavity lasers with an integrated modulator |
US6856632B1 (en) * | 1999-09-20 | 2005-02-15 | Iolon, Inc. | Widely tunable laser |
JP2001320131A (ja) * | 2000-03-01 | 2001-11-16 | Sony Corp | 多波長半導体レーザ素子アレイ及びその作製方法 |
JP2001284715A (ja) * | 2000-03-30 | 2001-10-12 | Ando Electric Co Ltd | 外部共振器型レーザ光源 |
US6956886B1 (en) * | 2001-11-02 | 2005-10-18 | Patel C Kumar N | Discreetly tunable semiconductor laser arrangement for wavelength division multiplex communication systems |
JP3729170B2 (ja) | 2002-10-18 | 2005-12-21 | 住友電気工業株式会社 | 半導体レーザ |
DE20317902U1 (de) * | 2003-11-19 | 2005-03-24 | Sacher Joachim | Laserdioden-Anordnung mit externem Resonator |
JP2006222399A (ja) * | 2005-02-14 | 2006-08-24 | Hamamatsu Photonics Kk | 半導体レーザ装置 |
JP4574413B2 (ja) * | 2005-03-30 | 2010-11-04 | アンリツ株式会社 | 外部共振器型レーザ用半導体発光素子の信頼性試験方法 |
CN1963435B (zh) * | 2006-12-13 | 2011-08-24 | 中国科学院光电技术研究所 | 高反镜反射率测量方法 |
CN100559147C (zh) * | 2007-04-26 | 2009-11-11 | 中国科学院光电技术研究所 | 基于半导体激光器自混合效应的高反射率测量方法 |
CN102053007B (zh) * | 2009-10-29 | 2012-09-05 | 龙兴武 | 一种高反射率膜片膜内损耗参数的绝对测量方法 |
US20140091198A1 (en) * | 2011-10-11 | 2014-04-03 | Mitsubishi Electric Corporation | Laser output measurement mechanism |
EP2904671B1 (de) * | 2012-10-05 | 2022-05-04 | David Welford | Systeme und verfahren zum verstärken von licht |
JP2015103740A (ja) * | 2013-11-27 | 2015-06-04 | キヤノン株式会社 | 面発光レーザ、およびそれを用いた光干渉断層計 |
CN105375255A (zh) * | 2015-09-14 | 2016-03-02 | 北京理工大学 | 基于变透过率腔镜的激光器输出功率优化方法 |
JP6650961B2 (ja) * | 2018-04-25 | 2020-02-19 | キヤノン株式会社 | 面発光レーザ、およびそれを用いた光干渉断層計 |
WO2019224601A2 (en) * | 2018-05-24 | 2019-11-28 | Panasonic intellectual property Management co., Ltd | Exchangeable laser resonator modules with angular adjustment |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6046837B2 (ja) * | 1980-03-11 | 1985-10-18 | 日本電気株式会社 | レ−ザ装置 |
DD256439A3 (de) * | 1986-01-09 | 1988-05-11 | Halle Feinmech Werke Veb | Verfahren zur steuerung der inneren und unterdrueckung der aeusseren strahlungsrueckkopplung eines co tief 2-hochleistungslasers |
US4726030A (en) * | 1986-07-21 | 1988-02-16 | Gte Laboratories Incorporated | External-coupled-cavity diode laser |
DE3728305A1 (de) * | 1987-08-25 | 1989-03-09 | Standard Elektrik Lorenz Ag | Halbleiterlaser mit konstanter differentieller quantenausbeute oder konstanter optischer ausgangsleistung |
US4873692A (en) * | 1988-08-12 | 1989-10-10 | Spectra-Physics | Pulsed tunable solid state laser |
GB2225482B (en) * | 1988-11-23 | 1992-10-14 | Stc Plc | Multichannel cavity laser |
US5050179A (en) * | 1989-04-20 | 1991-09-17 | Massachusetts Institute Of Technology | External cavity semiconductor laser |
DE3943470A1 (de) * | 1989-05-29 | 1990-12-13 | Rainer Thiessen | Gegenstands-naeherungs und troepfchendetektor |
FR2661785A1 (fr) * | 1990-05-02 | 1991-11-08 | Thomson Csf | Laser accordable et procede de fabrication. |
US5263037A (en) * | 1990-08-01 | 1993-11-16 | Hewlett-Packard Company | Optical oscillator sweeper |
US5140599A (en) * | 1990-08-01 | 1992-08-18 | Hewlett-Packard Company | Optical oscillator sweeper |
JPH04107976A (ja) * | 1990-08-28 | 1992-04-09 | Mitsubishi Electric Corp | 半導体レーザ装置 |
US5161165A (en) * | 1991-09-26 | 1992-11-03 | Hewlett-Packard Company | Multimode stabilized external cavity laser |
US5301059A (en) * | 1992-03-03 | 1994-04-05 | Matsushita Electric Industrial Co., Ltd. | Short-wavelength light generating apparatus |
-
1993
- 1993-10-08 US US08/134,424 patent/US5434874A/en not_active Expired - Fee Related
-
1994
- 1994-09-26 JP JP22961194A patent/JP3637081B2/ja not_active Expired - Fee Related
- 1994-10-04 DE DE69419999T patent/DE69419999T2/de not_active Expired - Fee Related
- 1994-10-04 EP EP94307263A patent/EP0647995B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0647995B1 (de) | 1999-08-11 |
JP3637081B2 (ja) | 2005-04-06 |
EP0647995A1 (de) | 1995-04-12 |
US5434874A (en) | 1995-07-18 |
JPH07170016A (ja) | 1995-07-04 |
DE69419999T2 (de) | 1999-12-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8339 | Ceased/non-payment of the annual fee |