DE69414500T2 - Wellenlängenabstimmbare Lichtquelle mit Interferometer als optisches Filter innerhalb des externen Resonators - Google Patents
Wellenlängenabstimmbare Lichtquelle mit Interferometer als optisches Filter innerhalb des externen ResonatorsInfo
- Publication number
- DE69414500T2 DE69414500T2 DE69414500T DE69414500T DE69414500T2 DE 69414500 T2 DE69414500 T2 DE 69414500T2 DE 69414500 T DE69414500 T DE 69414500T DE 69414500 T DE69414500 T DE 69414500T DE 69414500 T2 DE69414500 T2 DE 69414500T2
- Authority
- DE
- Germany
- Prior art keywords
- interferometer
- wavelength
- light source
- optical filter
- tunable light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
- H01S3/1062—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using a controlled passive interferometer, e.g. a Fabry-Perot etalon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06209—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in single-section lasers
- H01S5/0622—Controlling the frequency of the radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/0687—Stabilising the frequency of the laser
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5232231A JPH0766482A (ja) | 1993-08-26 | 1993-08-26 | 可変波長光源 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69414500D1 DE69414500D1 (de) | 1998-12-17 |
DE69414500T2 true DE69414500T2 (de) | 1999-06-17 |
Family
ID=16936034
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69414500T Expired - Fee Related DE69414500T2 (de) | 1993-08-26 | 1994-08-25 | Wellenlängenabstimmbare Lichtquelle mit Interferometer als optisches Filter innerhalb des externen Resonators |
Country Status (4)
Country | Link |
---|---|
US (1) | US5444724A (de) |
EP (1) | EP0641052B1 (de) |
JP (1) | JPH0766482A (de) |
DE (1) | DE69414500T2 (de) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0799359A (ja) * | 1993-09-27 | 1995-04-11 | Ando Electric Co Ltd | 外部共振器型周波数可変半導体レーザ光源 |
EP0979547B1 (de) * | 1996-07-26 | 2005-01-12 | The Perkin-Elmer Corporation | Abstimmbarer diodenlaser mit externem resonator |
EP0864298A3 (de) * | 1997-03-14 | 2001-02-28 | Egawa Corporation | Gerät und Material zur Verbesserung der Zahnbeschichtung |
US5953467A (en) * | 1997-09-23 | 1999-09-14 | Lucent Technologies Inc. | Switchable optical filter |
AU5588700A (en) | 1999-05-24 | 2000-12-12 | Brimrose Corporation Of America | Device and method for optical path length measurement |
US6879619B1 (en) | 1999-07-27 | 2005-04-12 | Intel Corporation | Method and apparatus for filtering an optical beam |
US6853654B2 (en) * | 1999-07-27 | 2005-02-08 | Intel Corporation | Tunable external cavity laser |
US6856632B1 (en) | 1999-09-20 | 2005-02-15 | Iolon, Inc. | Widely tunable laser |
US6847661B2 (en) * | 1999-09-20 | 2005-01-25 | Iolon, Inc. | Tunable laser with microactuator |
CA2380374A1 (en) * | 1999-09-28 | 2001-04-05 | Gregory A. Fish | Integrated wavelength tunable single and two-stage all-optical wavelength converter |
CA2333436C (en) * | 2000-03-03 | 2006-12-05 | Hitachi Cable, Ltd. | Optical multiplexer/ demultiplexer |
US7120176B2 (en) * | 2000-07-27 | 2006-10-10 | Intel Corporation | Wavelength reference apparatus and method |
US6690687B2 (en) * | 2001-01-02 | 2004-02-10 | Spectrasensors, Inc. | Tunable semiconductor laser having cavity with ring resonator mirror and mach-zehnder interferometer |
GB0101985D0 (en) * | 2001-01-25 | 2001-03-14 | Marconi Comm Ltd | Optical component |
US6658031B2 (en) * | 2001-07-06 | 2003-12-02 | Intel Corporation | Laser apparatus with active thermal tuning of external cavity |
US6816516B2 (en) | 2001-03-21 | 2004-11-09 | Intel Corporation | Error signal generation system |
EP1198041A1 (de) * | 2001-05-15 | 2002-04-17 | Agilent Technologies, Inc. (a Delaware corporation) | Abstimmbarer Laser mit geradem Resonator |
US6901088B2 (en) * | 2001-07-06 | 2005-05-31 | Intel Corporation | External cavity laser apparatus with orthogonal tuning of laser wavelength and cavity optical pathlength |
US6804278B2 (en) | 2001-07-06 | 2004-10-12 | Intel Corporation | Evaluation and adjustment of laser losses according to voltage across gain medium |
US6822979B2 (en) | 2001-07-06 | 2004-11-23 | Intel Corporation | External cavity laser with continuous tuning of grid generator |
US6788724B2 (en) * | 2001-07-06 | 2004-09-07 | Intel Corporation | Hermetically sealed external cavity laser system and method |
US7230959B2 (en) * | 2002-02-22 | 2007-06-12 | Intel Corporation | Tunable laser with magnetically coupled filter |
US6763047B2 (en) * | 2002-06-15 | 2004-07-13 | Intel Corporation | External cavity laser apparatus and methods |
US6845121B2 (en) * | 2002-06-15 | 2005-01-18 | Intel Corporation | Optical isolator apparatus and methods |
US20040202223A1 (en) * | 2003-04-08 | 2004-10-14 | Eric Crosson | External cavity laser having improved single mode operation |
JP4494401B2 (ja) * | 2004-03-17 | 2010-06-30 | 日本電信電話株式会社 | 光伝送システム、光伝送システムの光送信装置及び光受信装置 |
US7305158B2 (en) * | 2004-04-15 | 2007-12-04 | Davidson Instruments Inc. | Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a Fabry-Perot interferometer |
US7492463B2 (en) * | 2004-04-15 | 2009-02-17 | Davidson Instruments Inc. | Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor |
US7864329B2 (en) | 2004-12-21 | 2011-01-04 | Halliburton Energy Services, Inc. | Fiber optic sensor system having circulators, Bragg gratings and couplers |
EP1681540A1 (de) | 2004-12-21 | 2006-07-19 | Davidson Instruments, Inc. | Mehrkanalarrayprozessor |
EP1869737B1 (de) | 2005-03-16 | 2021-05-12 | Davidson Instruments, Inc. | Hochintensitäts-fabry-perot-sensor |
WO2007033069A2 (en) | 2005-09-13 | 2007-03-22 | Davidson Instruments Inc. | Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same |
US7684051B2 (en) * | 2006-04-18 | 2010-03-23 | Halliburton Energy Services, Inc. | Fiber optic seismic sensor based on MEMS cantilever |
DE102006019127A1 (de) * | 2006-04-25 | 2007-10-31 | Carl Zeiss Meditec Ag | Multiwellenlängen-Lasersystem und Verfahren für ophthalmologische Anwendungen |
WO2007126475A2 (en) | 2006-04-26 | 2007-11-08 | Davidson Instruments, Inc. | Fiber optic mems seismic sensor with mass supported by hinged beams |
US8115937B2 (en) | 2006-08-16 | 2012-02-14 | Davidson Instruments | Methods and apparatus for measuring multiple Fabry-Perot gaps |
US7787128B2 (en) | 2007-01-24 | 2010-08-31 | Halliburton Energy Services, Inc. | Transducer for measuring environmental parameters |
JP5536401B2 (ja) | 2008-10-16 | 2014-07-02 | ギガフォトン株式会社 | レーザ装置および極端紫外光光源装置 |
US20130016744A1 (en) * | 2011-07-13 | 2013-01-17 | Oracle International Corporation | Laser source with tunable-grating-waveguide reflections |
CN105181134B (zh) * | 2015-05-26 | 2017-03-15 | 山西大学 | 一种宽带飞秒激光的模式选择与功率放大的装置及方法 |
JP6781867B2 (ja) * | 2016-02-04 | 2020-11-11 | 国立大学法人大阪大学 | 共振器およびレーザ装置 |
CN106451059A (zh) * | 2016-11-21 | 2017-02-22 | 中国电子科技集团公司第四十四研究所 | 激光器单模稳定性控制装置及方法 |
US11855412B1 (en) * | 2020-03-31 | 2023-12-26 | Acacia Communications, Inc. | Tunable laser |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2402320A1 (fr) * | 1977-09-02 | 1979-03-30 | Anvar | Selecteur de mode pour laser |
JPS6180109A (ja) * | 1984-09-26 | 1986-04-23 | Nippon Telegr & Teleph Corp <Ntt> | 光合分波器 |
EP0216212A3 (de) * | 1985-09-25 | 1989-03-29 | Siemens Aktiengesellschaft | Externer optischer Resonator für einen Halbleiterlaser |
DE3766850D1 (de) * | 1986-01-28 | 1991-02-07 | British Telecomm | Ueberwachung und steuerung der stabilitaet einer strahlungsquelle. |
JPH084179B2 (ja) * | 1987-07-21 | 1996-01-17 | 国際電信電話株式会社 | 半導体レ−ザ |
US4818064A (en) * | 1987-09-24 | 1989-04-04 | Board Of Trustees Stanford Junior University | Sensor array and method of selective interferometric sensing by use of coherence synthesis |
US5285059A (en) * | 1990-10-31 | 1994-02-08 | Canon Kabushiki Kaisha | Method for controlling a tunable filter and an apparatus therefor |
JPH06112583A (ja) * | 1992-09-25 | 1994-04-22 | Ando Electric Co Ltd | 外部共振器型半導体レーザ光源 |
-
1993
- 1993-08-26 JP JP5232231A patent/JPH0766482A/ja active Pending
-
1994
- 1994-08-25 EP EP94113328A patent/EP0641052B1/de not_active Expired - Lifetime
- 1994-08-25 DE DE69414500T patent/DE69414500T2/de not_active Expired - Fee Related
- 1994-08-25 US US08/296,358 patent/US5444724A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0641052B1 (de) | 1998-11-11 |
EP0641052A1 (de) | 1995-03-01 |
JPH0766482A (ja) | 1995-03-10 |
DE69414500D1 (de) | 1998-12-17 |
US5444724A (en) | 1995-08-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |