DE69406154D1 - Method for measuring the depth of fully cut raster trenches using an ultrasound detector and cutting device for carrying out the method - Google Patents
Method for measuring the depth of fully cut raster trenches using an ultrasound detector and cutting device for carrying out the methodInfo
- Publication number
- DE69406154D1 DE69406154D1 DE69406154T DE69406154T DE69406154D1 DE 69406154 D1 DE69406154 D1 DE 69406154D1 DE 69406154 T DE69406154 T DE 69406154T DE 69406154 T DE69406154 T DE 69406154T DE 69406154 D1 DE69406154 D1 DE 69406154D1
- Authority
- DE
- Germany
- Prior art keywords
- trenches
- raster
- depth
- measuring
- carrying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Dicing (AREA)
- Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5033406A JP2868384B2 (en) | 1993-02-23 | 1993-02-23 | Dicing groove depth measuring method and dicing device |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69406154D1 true DE69406154D1 (en) | 1997-11-20 |
DE69406154T2 DE69406154T2 (en) | 1998-04-23 |
Family
ID=12385722
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69406154T Expired - Fee Related DE69406154T2 (en) | 1993-02-23 | 1994-02-14 | Method for measuring the depth of fully cut raster trenches using an ultrasound detector and cutting device for carrying out the method |
Country Status (4)
Country | Link |
---|---|
US (1) | US5501104A (en) |
EP (1) | EP0612978B1 (en) |
JP (1) | JP2868384B2 (en) |
DE (1) | DE69406154T2 (en) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5668062A (en) * | 1995-08-23 | 1997-09-16 | Texas Instruments Incorporated | Method for processing semiconductor wafer with reduced particle contamination during saw |
US6294439B1 (en) * | 1997-07-23 | 2001-09-25 | Kabushiki Kaisha Toshiba | Method of dividing a wafer and method of manufacturing a semiconductor device |
US5863813A (en) * | 1997-08-20 | 1999-01-26 | Micron Communications, Inc. | Method of processing semiconductive material wafers and method of forming flip chips and semiconductor chips |
US6120351A (en) * | 1998-08-31 | 2000-09-19 | Ingersoll-Rand Company | Automatic machinability measuring and machining methods and apparatus therefor |
US6021682A (en) * | 1998-08-31 | 2000-02-08 | Ingersoll-Rand Company | Automatic machinability measuring and machining methods and apparatus therefor |
US6244927B1 (en) | 1998-08-31 | 2001-06-12 | Ingersoll-Rand Company | Multi-functional sensing methods and apparatus therefor |
US6357330B1 (en) * | 1999-01-07 | 2002-03-19 | Intel Corporation | Method and apparatus for cutting a wafer |
JP4669162B2 (en) * | 2001-06-28 | 2011-04-13 | 株式会社ディスコ | Semiconductor wafer dividing system and dividing method |
DE10160809B4 (en) * | 2001-12-11 | 2007-12-27 | Robert Bosch Gmbh | Method for the contactless measurement of the removal during the internal surface finishing of a bore introduced into a workpiece |
JP4509578B2 (en) | 2004-01-09 | 2010-07-21 | 浜松ホトニクス株式会社 | Laser processing method and laser processing apparatus |
JP4601965B2 (en) | 2004-01-09 | 2010-12-22 | 浜松ホトニクス株式会社 | Laser processing method and laser processing apparatus |
JP4598407B2 (en) | 2004-01-09 | 2010-12-15 | 浜松ホトニクス株式会社 | Laser processing method and laser processing apparatus |
ITMI20042528A1 (en) * | 2004-01-10 | 2005-03-28 | Saurer Gmbh & Co Kg | METHOD AND DEVICE TO DETECT THE FILLING OF A FIBER AND FIBER CUTTING MACHINE |
JP4879012B2 (en) * | 2006-12-28 | 2012-02-15 | 株式会社ディスコ | Cutting blade tip shape inspection method |
JP2008307646A (en) * | 2007-06-15 | 2008-12-25 | Disco Abrasive Syst Ltd | Cutting apparatus |
FR2973935A1 (en) * | 2011-04-11 | 2012-10-12 | St Microelectronics Rousset | METHOD FOR EVALUATING A SEMICONDUCTOR WAFER CUTTING PROCESS |
JP5757831B2 (en) * | 2011-09-14 | 2015-08-05 | 株式会社ディスコ | Cutting blade tip shape detection method |
JP6259653B2 (en) * | 2013-12-17 | 2018-01-10 | 株式会社ディスコ | Cutting blade shape detection method |
US9685362B2 (en) * | 2014-02-19 | 2017-06-20 | International Business Machines Corporation | Apparatus and method for centering substrates on a chuck |
JP6422388B2 (en) * | 2015-04-09 | 2018-11-14 | 株式会社ディスコ | Method for forming cutting groove |
CN112066843B (en) * | 2020-09-23 | 2021-04-30 | 宁夏诚建建设工程有限公司 | Channel measuring device for reducing workload of workers by utilizing water based on safety |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3813926A (en) * | 1972-02-09 | 1974-06-04 | A Stubbeman | Ultrasonic pulsed energy inspection system |
JPS5157283A (en) * | 1974-11-15 | 1976-05-19 | Nippon Electric Co | Handotaikibanno bunkatsuhoho |
IT1129055B (en) * | 1980-01-08 | 1986-06-04 | Fiat Ricerche | PALPATOR DEVICE FOR MEASURING THE ROUGHNESS OF A SURFACE |
IT1129066B (en) * | 1980-02-26 | 1986-06-04 | Fiat Ricerche | DEVICE FOR NON-DESTRUCTIVE MEASUREMENT OF THE THICKNESS OF A SURFACE LAYER OF A BODY SUBJECT TO A TREATMENT TO MODIFY ITS SURFACE STRUCTURE |
DE3425811C2 (en) * | 1983-07-14 | 1986-10-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Method for determining the wall thickness of a workpiece and / or the speed of sound in a workpiece and device for carrying out the method |
US4814296A (en) * | 1987-08-28 | 1989-03-21 | Xerox Corporation | Method of fabricating image sensor dies for use in assembling arrays |
EP0357905A3 (en) * | 1988-08-16 | 1991-09-11 | Toray Industries, Inc. | Method of measuring a profile of an object and an apparatus for carrying out the method |
JP2656393B2 (en) * | 1991-02-22 | 1997-09-24 | 株式会社東京精密 | Dicing apparatus and method |
US5128282A (en) * | 1991-11-04 | 1992-07-07 | Xerox Corporation | Process for separating image sensor dies and the like from a wafer that minimizes silicon waste |
-
1993
- 1993-02-23 JP JP5033406A patent/JP2868384B2/en not_active Expired - Fee Related
-
1994
- 1994-02-14 EP EP94301056A patent/EP0612978B1/en not_active Expired - Lifetime
- 1994-02-14 DE DE69406154T patent/DE69406154T2/en not_active Expired - Fee Related
- 1994-02-16 US US08/197,192 patent/US5501104A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH06252260A (en) | 1994-09-09 |
US5501104A (en) | 1996-03-26 |
JP2868384B2 (en) | 1999-03-10 |
EP0612978B1 (en) | 1997-10-15 |
DE69406154T2 (en) | 1998-04-23 |
EP0612978A1 (en) | 1994-08-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |