DE69324507D1 - Anordnung zur Messung des zeitlichen Zusammenhangs zwischen zwei oder mehr Signalen - Google Patents

Anordnung zur Messung des zeitlichen Zusammenhangs zwischen zwei oder mehr Signalen

Info

Publication number
DE69324507D1
DE69324507D1 DE69324507T DE69324507T DE69324507D1 DE 69324507 D1 DE69324507 D1 DE 69324507D1 DE 69324507 T DE69324507 T DE 69324507T DE 69324507 T DE69324507 T DE 69324507T DE 69324507 D1 DE69324507 D1 DE 69324507D1
Authority
DE
Germany
Prior art keywords
measuring
signals
arrangement
temporal relationship
temporal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69324507T
Other languages
English (en)
Other versions
DE69324507T2 (de
Inventor
Hironori Takahashi
Tsuneyuki Urakami
Shinichiro Aoshima
Isuke Hirano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP34681992A external-priority patent/JPH05273272A/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE69324507D1 publication Critical patent/DE69324507D1/de
Publication of DE69324507T2 publication Critical patent/DE69324507T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F13/00—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/26—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being duration, interval, position, frequency, or sequence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69324507T 1992-01-16 1993-01-15 Anordnung zur Messung des zeitlichen Zusammenhangs zwischen zwei oder mehr Signalen Expired - Fee Related DE69324507T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP588092 1992-01-16
JP34681992A JPH05273272A (ja) 1992-01-16 1992-12-25 タイミング差測定システム

Publications (2)

Publication Number Publication Date
DE69324507D1 true DE69324507D1 (de) 1999-05-27
DE69324507T2 DE69324507T2 (de) 1999-10-07

Family

ID=26339901

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69324507T Expired - Fee Related DE69324507T2 (de) 1992-01-16 1993-01-15 Anordnung zur Messung des zeitlichen Zusammenhangs zwischen zwei oder mehr Signalen

Country Status (3)

Country Link
US (1) US5499190A (de)
EP (1) EP0552048B1 (de)
DE (1) DE69324507T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3793255B2 (ja) * 1995-08-28 2006-07-05 浜松ホトニクス株式会社 光学測定方法及び光学測定装置
US5818735A (en) * 1996-06-20 1998-10-06 Peek Measurement, Inc. Method and system for high resolution time-of-flight measurements
US6011401A (en) * 1997-05-20 2000-01-04 Raytheon Company Reference-free direct digital lock-in method and apparatus
US6081119A (en) * 1997-06-24 2000-06-27 California Institute Of Technology Method for suppressing noise in measurements
US6243409B1 (en) 1997-07-15 2001-06-05 Novatel, Inc. Global navigation satellite system receiver with blanked-PRN code correlation
US6344844B1 (en) * 1998-08-21 2002-02-05 Agilent Technologies, Inc. Digital oscilloscope having improved peak detect mode
US6925881B1 (en) 2002-01-17 2005-08-09 Southwest Research Institute Time shift data analysis for long-range guided wave inspection
DE10346379B4 (de) * 2003-09-26 2010-09-02 Technische Universität Berlin Verfahren zum Bestimmen des Frequenzgangs eines elektrooptischen Bauelements
KR101236769B1 (ko) * 2005-09-23 2013-02-25 테라다인 인코퍼레이티드 디지털 신호 타이밍의 테스트를 위한 스트로브 기술
US7573957B2 (en) * 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for recovering a clock in a digital signal
US7856578B2 (en) * 2005-09-23 2010-12-21 Teradyne, Inc. Strobe technique for test of digital signal timing
US7574632B2 (en) * 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for time stamping a digital signal
US20100315900A1 (en) * 2009-06-12 2010-12-16 Baker Hughes Incorporated Method and apparatus for high resolution sound speed measurements
TWI391675B (zh) * 2009-11-13 2013-04-01 Inst Information Industry 電器使用時間之估算方法、系統與電腦程式產品
US9632136B2 (en) * 2013-04-04 2017-04-25 International Business Machines Corporation Precise estimation of arrival time of switching events close in time and space
JP2019047173A (ja) * 2017-08-30 2019-03-22 ルネサスエレクトロニクス株式会社 半導体装置、信号処理システム、及び信号処理方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2700133A (en) * 1951-04-25 1955-01-18 Bell Telephone Labor Inc Measurement of relative delay of wave envelopes
US2768348A (en) * 1954-09-03 1956-10-23 Edo Corp Electric time delay measuring devices
US2915700A (en) * 1955-10-17 1959-12-01 Victor F Cartwright Test apparatus for measuring time delays
US3157781A (en) * 1960-10-27 1964-11-17 Thompson Ramo Wooldridge Inc Signal correlation system
JPS55122170A (en) * 1979-03-15 1980-09-19 Fujitsu Ltd Method of measuring lag time of integrated circuit
JPS5846735A (ja) * 1981-09-15 1983-03-18 Anritsu Corp ２チヤネル波形記憶装置
US4703448A (en) * 1984-10-25 1987-10-27 Nicolet Instrument Corporation Method for measuring skew or phase difference in electronic systems
US4802486A (en) * 1985-04-01 1989-02-07 Nellcor Incorporated Method and apparatus for detecting optical pulses
US4934372A (en) * 1985-04-01 1990-06-19 Nellcor Incorporated Method and apparatus for detecting optical pulses
US4911167A (en) * 1985-06-07 1990-03-27 Nellcor Incorporated Method and apparatus for detecting optical pulses
US4928692A (en) * 1985-04-01 1990-05-29 Goodman David E Method and apparatus for detecting optical pulses
US4831325A (en) * 1987-04-01 1989-05-16 General Signal Corporation Capacitance measuring circuit
JPS63289468A (ja) * 1987-05-21 1988-11-25 Matsushita Electric Ind Co Ltd Ｉｃテスタ
JPH0830720B2 (ja) * 1987-06-30 1996-03-27 浜松ホトニクス株式会社 電圧検出装置
DE3807438A1 (de) * 1988-03-07 1989-09-21 Brust Hans Detlef Verfahren und anordnung zur messung des zeitlichen zusammenhangs von signalen
US5179565A (en) * 1990-06-07 1993-01-12 Hamamatsu Photonics, K.K. Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source
DE69120233T2 (de) * 1990-11-28 1996-12-12 Schlumberger Technologies Inc Photoemissionselektronenstrahlmesssonde mit gepulstem Laser
US5321632A (en) * 1991-02-26 1994-06-14 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring the length of a transmission line in accordance with a reflected waveform

Also Published As

Publication number Publication date
EP0552048A2 (de) 1993-07-21
EP0552048B1 (de) 1999-04-21
DE69324507T2 (de) 1999-10-07
US5499190A (en) 1996-03-12
EP0552048A3 (en) 1994-06-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee