DE69315680D1 - Interferometrische sonde für abstandsmessung - Google Patents

Interferometrische sonde für abstandsmessung

Info

Publication number
DE69315680D1
DE69315680D1 DE69315680T DE69315680T DE69315680D1 DE 69315680 D1 DE69315680 D1 DE 69315680D1 DE 69315680 T DE69315680 T DE 69315680T DE 69315680 T DE69315680 T DE 69315680T DE 69315680 D1 DE69315680 D1 DE 69315680D1
Authority
DE
Germany
Prior art keywords
distance measurement
interferometric probe
interferometric
probe
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69315680T
Other languages
English (en)
Other versions
DE69315680T2 (de
Inventor
Vladimir Viktorovich Khopov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of DE69315680D1 publication Critical patent/DE69315680D1/de
Application granted granted Critical
Publication of DE69315680T2 publication Critical patent/DE69315680T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
DE69315680T 1992-07-27 1993-07-27 Interferometrische sonde für abstandsmessung Expired - Fee Related DE69315680T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SU925056697A RU2092787C1 (ru) 1992-07-27 1992-07-27 Способ определения коротких дистанций до диффузно-отражающих объектов и устройство для его осуществления
PCT/GB1993/001582 WO1994005966A1 (en) 1992-07-27 1993-07-27 Interferometric probe for distance measurement

Publications (2)

Publication Number Publication Date
DE69315680D1 true DE69315680D1 (de) 1998-01-22
DE69315680T2 DE69315680T2 (de) 1998-04-02

Family

ID=21610567

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69315680T Expired - Fee Related DE69315680T2 (de) 1992-07-27 1993-07-27 Interferometrische sonde für abstandsmessung

Country Status (6)

Country Link
US (1) US5471302A (de)
EP (1) EP0609419B1 (de)
JP (1) JPH07503547A (de)
DE (1) DE69315680T2 (de)
RU (1) RU2092787C1 (de)
WO (1) WO1994005966A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AUPR086100A0 (en) * 2000-10-20 2000-11-16 Q-Vis Limited Improved surface profiling apparatus
US9618619B2 (en) * 2012-11-21 2017-04-11 Nikon Corporation Radar systems with dual fiber coupled lasers
US10119816B2 (en) 2012-11-21 2018-11-06 Nikon Metrology Nv Low drift reference for laser radar
CN112757631B (zh) * 2020-12-21 2022-11-11 深圳市创想三维科技股份有限公司 一种3d打印机的自动调平装置及3d打印机

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE68925212T2 (de) * 1989-06-30 1996-05-15 Renishaw Plc Verfahren und vorrichtung zur determination des oberflächenprofils von diffus-reflektierenden objekten

Also Published As

Publication number Publication date
WO1994005966A1 (en) 1994-03-17
EP0609419B1 (de) 1997-12-10
US5471302A (en) 1995-11-28
JPH07503547A (ja) 1995-04-13
RU2092787C1 (ru) 1997-10-10
EP0609419A1 (de) 1994-08-10
DE69315680T2 (de) 1998-04-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee