DE69220261D1 - Drei-dimensionale Interferometerstruktur mit Abtastung durch Brechungselemente - Google Patents
Drei-dimensionale Interferometerstruktur mit Abtastung durch BrechungselementeInfo
- Publication number
- DE69220261D1 DE69220261D1 DE69220261T DE69220261T DE69220261D1 DE 69220261 D1 DE69220261 D1 DE 69220261D1 DE 69220261 T DE69220261 T DE 69220261T DE 69220261 T DE69220261 T DE 69220261T DE 69220261 D1 DE69220261 D1 DE 69220261D1
- Authority
- DE
- Germany
- Prior art keywords
- scanning
- refractive elements
- interferometer structure
- dimensional interferometer
- dimensional
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
- G01J3/4537—Devices with refractive scan
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US66359291A | 1991-03-01 | 1991-03-01 | |
US82798792A | 1992-01-29 | 1992-01-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69220261D1 true DE69220261D1 (de) | 1997-07-17 |
DE69220261T2 DE69220261T2 (de) | 1997-11-27 |
Family
ID=27098786
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69220261T Expired - Fee Related DE69220261T2 (de) | 1991-03-01 | 1992-02-28 | Drei-dimensionale Interferometerstruktur mit Abtastung durch Brechungselemente |
Country Status (4)
Country | Link |
---|---|
US (1) | US5313269A (de) |
EP (1) | EP0501833B1 (de) |
JP (1) | JPH0735983B2 (de) |
DE (1) | DE69220261T2 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5949543A (en) * | 1997-11-12 | 1999-09-07 | Plx, Inc. | Monolithic optical assembly and associated retroreflector with beamsplitter assembly |
US6141101A (en) * | 1997-11-12 | 2000-10-31 | Plx, Inc. | Monolithic optical assembly |
GB2349692A (en) * | 1999-03-29 | 2000-11-08 | Ando Electric | Optical Interferometer |
US20080068612A1 (en) * | 2000-08-02 | 2008-03-20 | Manning Christopher J | Fourier-transform spectrometers |
US6996313B1 (en) | 2002-07-30 | 2006-02-07 | Santur Corporation | Laser component system assembly |
DE10250014B4 (de) * | 2002-10-25 | 2007-08-02 | Universität Kassel | Hochleistungspulsformer in Kompaktbauweise |
FI114824B (fi) * | 2003-02-12 | 2004-12-31 | Temet Instr Oy | Infrapunamodulaattori spektrometriä varten |
FI20031581A0 (fi) * | 2003-10-30 | 2003-10-30 | Noveltech Solutions Ltd | Interferometri |
US8659845B2 (en) | 2008-04-07 | 2014-02-25 | University Of Florida Research Foundation, Inc. | High-precision monolithic optical assemblies and methods for fabrication and alignment thereof |
JP7020078B2 (ja) * | 2017-11-24 | 2022-02-16 | 株式会社島津製作所 | フーリエ変換型分光光度計 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4190366A (en) * | 1977-04-25 | 1980-02-26 | Laser Precision Corporation | Refractively scanned interferometer |
US4165938A (en) * | 1977-06-22 | 1979-08-28 | Laser Precision Corporation | Refractively scanned interferometer |
US4265540A (en) * | 1979-10-01 | 1981-05-05 | Laser Precision Corporation | Refractively scanned interferometer |
US4286877A (en) * | 1979-07-26 | 1981-09-01 | Laser Precision Corporation | Refractively scanned interferometer |
US4724329A (en) * | 1983-10-06 | 1988-02-09 | Laser Precision Corporation | High efficiency radiation source for infrared spectrometry |
GB2154019B (en) * | 1984-02-10 | 1988-01-13 | Zeiss Jena Veb Carl | Double-beam interferometer arrangement particularly for fourier-transform spectrometers |
US4784488A (en) * | 1986-08-27 | 1988-11-15 | Laser Precision Corporation | Modular radiation transmission apparatus for spectrometers |
US4773757A (en) * | 1987-08-19 | 1988-09-27 | Laser Precision Corporation | High resolution spectrometer interferometer having an integrated alignment unit |
US4881814A (en) * | 1988-09-02 | 1989-11-21 | The Perkin-Elmer Corporation | Scanning Michelson interferometer assembly |
US4991961A (en) * | 1989-05-26 | 1991-02-12 | Nicolet Instrument Corporation | Moving mirror tilt adjust mechanism in an interferometer |
US5155551A (en) * | 1991-03-01 | 1992-10-13 | Research-Cottrell Technologies, Inc. | Laser referencing system for refractively scanning interferometer |
-
1992
- 1992-02-28 EP EP92301748A patent/EP0501833B1/de not_active Expired - Lifetime
- 1992-02-28 DE DE69220261T patent/DE69220261T2/de not_active Expired - Fee Related
- 1992-03-02 JP JP4044595A patent/JPH0735983B2/ja not_active Expired - Fee Related
-
1993
- 1993-06-28 US US08/082,427 patent/US5313269A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH04337426A (ja) | 1992-11-25 |
EP0501833A3 (en) | 1993-06-16 |
EP0501833B1 (de) | 1997-06-11 |
EP0501833A2 (de) | 1992-09-02 |
US5313269A (en) | 1994-05-17 |
DE69220261T2 (de) | 1997-11-27 |
JPH0735983B2 (ja) | 1995-04-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: ANALECT INSTRUMENTS INC., IRVINE, CALIF., US |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |