DE69202539D1 - System zum Kalibrieren eines optischen Instruments in einem Satellit mittels einer Referenz-Lichtquelle. - Google Patents

System zum Kalibrieren eines optischen Instruments in einem Satellit mittels einer Referenz-Lichtquelle.

Info

Publication number
DE69202539D1
DE69202539D1 DE69202539T DE69202539T DE69202539D1 DE 69202539 D1 DE69202539 D1 DE 69202539D1 DE 69202539 T DE69202539 T DE 69202539T DE 69202539 T DE69202539 T DE 69202539T DE 69202539 D1 DE69202539 D1 DE 69202539D1
Authority
DE
Germany
Prior art keywords
calibrating
satellite
light source
reference light
optical instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69202539T
Other languages
English (en)
Other versions
DE69202539T2 (de
Inventor
Yukiharu Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP3269988A external-priority patent/JP2800860B2/ja
Priority claimed from JP4032683A external-priority patent/JP2884881B2/ja
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69202539D1 publication Critical patent/DE69202539D1/de
Publication of DE69202539T2 publication Critical patent/DE69202539T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69202539T 1991-09-20 1992-09-18 System zum Kalibrieren eines optischen Instruments in einem Satellit mittels einer Referenz-Lichtquelle. Expired - Fee Related DE69202539T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3269988A JP2800860B2 (ja) 1991-09-20 1991-09-20 衛星搭載用基準光源校正装置
JP4032683A JP2884881B2 (ja) 1992-01-23 1992-01-23 衛星搭載用基準光源校正装置

Publications (2)

Publication Number Publication Date
DE69202539D1 true DE69202539D1 (de) 1995-06-22
DE69202539T2 DE69202539T2 (de) 1995-11-02

Family

ID=26371263

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69202539T Expired - Fee Related DE69202539T2 (de) 1991-09-20 1992-09-18 System zum Kalibrieren eines optischen Instruments in einem Satellit mittels einer Referenz-Lichtquelle.

Country Status (4)

Country Link
US (1) US5325171A (de)
EP (1) EP0533490B1 (de)
CA (1) CA2078637A1 (de)
DE (1) DE69202539T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2281637B (en) * 1993-09-01 1997-01-15 Kodak Ltd Calibration of sensitometers
US5672866A (en) * 1996-03-19 1997-09-30 Hughes Electronics System and method for remote image sensing and autocalibration
US5914489A (en) * 1997-07-24 1999-06-22 General Monitors, Incorporated Continuous optical path monitoring of optical flame and radiation detectors
US5988874A (en) * 1997-09-05 1999-11-23 Advanced Micro Devices, Inc. Black body reference for RTA
DE19833793C2 (de) * 1998-07-21 2000-12-07 Inst Chemo Biosensorik Verfahren zur Überprüfung der Funktionsfähigkeit eines Spektrometers und Spektrometer mit Fehlererkennungsvorrichtung
US6294785B1 (en) * 1999-09-08 2001-09-25 G & A Technical Software Inc. Infrared sensor response calibration using atmospheric limb emission measurements
US6583424B2 (en) * 2001-06-25 2003-06-24 Agilent Technologies Inc. Scanning system with calibrated detection and method
US8067738B1 (en) 2009-08-25 2011-11-29 Ball Aerospace & Technologies Corp. Space based calibration transfer spectroradiometer
CN102288389B (zh) * 2011-05-11 2016-01-06 杭州远方光电信息股份有限公司 一种光源老化试验测量装置
US9482685B1 (en) * 2011-09-13 2016-11-01 BAE Systems Information and Electronic Systems Integreation Inc. On-axis mounting of an inertial measurement unit (IMU) within an optical system
US10197545B2 (en) 2015-07-29 2019-02-05 Advanced Sensors Limited Method and apparatus for measurement of a material in a liquid through absorption of light
NL2017108B1 (en) * 2016-07-05 2018-01-12 Kipp & Zonen B V Method and device determining soiling of a shield
WO2018009064A1 (en) * 2016-07-05 2018-01-11 Kipp & Zonen B.V. Method and device determining soiling of a shield

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7210356A (de) * 1971-08-06 1973-02-08
US3872315A (en) * 1973-12-21 1975-03-18 Babcock & Wilcox Co Radiation sensitive fluid analyzer
US4124803A (en) * 1976-12-22 1978-11-07 Kenneth Bowers Surface finish monitor
SE7905294L (sv) * 1979-06-15 1980-12-16 Svenska Traeforskningsinst Stoftmetning
JPS62284220A (ja) * 1986-05-31 1987-12-10 Nec Corp 光学センサ
FR2656420B1 (fr) * 1989-12-22 1994-07-29 Centre Nat Etd Spatiales Dispositif pour etalonner un instrument d'optique et ses applications.
US5028790A (en) * 1990-05-07 1991-07-02 Lear Siegler Measurement Controls Corporation Apparatus for full-system zero check and window soiling measurement and correction for transmissometers

Also Published As

Publication number Publication date
DE69202539T2 (de) 1995-11-02
US5325171A (en) 1994-06-28
EP0533490A3 (de) 1993-06-09
EP0533490B1 (de) 1995-05-17
CA2078637A1 (en) 1993-03-21
EP0533490A2 (de) 1993-03-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee