DE69202175T2 - Spektroskopisches Analyseverfahren und Analysesystem. - Google Patents

Spektroskopisches Analyseverfahren und Analysesystem.

Info

Publication number
DE69202175T2
DE69202175T2 DE69202175T DE69202175T DE69202175T2 DE 69202175 T2 DE69202175 T2 DE 69202175T2 DE 69202175 T DE69202175 T DE 69202175T DE 69202175 T DE69202175 T DE 69202175T DE 69202175 T2 DE69202175 T2 DE 69202175T2
Authority
DE
Germany
Prior art keywords
analysis
spectroscopic
analysis method
analysis system
spectroscopic analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69202175T
Other languages
English (en)
Other versions
DE69202175D1 (de
Inventor
Isao Fukui
Takao Miyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of DE69202175D1 publication Critical patent/DE69202175D1/de
Application granted granted Critical
Publication of DE69202175T2 publication Critical patent/DE69202175T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
DE69202175T 1991-02-28 1992-02-27 Spektroskopisches Analyseverfahren und Analysesystem. Expired - Fee Related DE69202175T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3104909A JP2522216B2 (ja) 1991-02-28 1991-02-28 発光分光分析方法

Publications (2)

Publication Number Publication Date
DE69202175D1 DE69202175D1 (de) 1995-06-01
DE69202175T2 true DE69202175T2 (de) 1995-12-07

Family

ID=14393249

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69202175T Expired - Fee Related DE69202175T2 (de) 1991-02-28 1992-02-27 Spektroskopisches Analyseverfahren und Analysesystem.

Country Status (5)

Country Link
US (1) US5363189A (de)
EP (1) EP0501476B1 (de)
JP (1) JP2522216B2 (de)
CN (1) CN1070609C (de)
DE (1) DE69202175T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3270334B2 (ja) * 1996-07-26 2002-04-02 エヌイーシーアクセステクニカ株式会社 携帯型電子機器のヒンジ構造
US6034768A (en) * 1997-09-26 2000-03-07 Physical Sciences Inc. Induced breakdown spectroscopy detector system with controllable delay time
WO1999056110A1 (fr) 1998-04-28 1999-11-04 Kawasaki Steel Corporation Procede d'analyse de l'oxygene et de l'oxyde contenus dans une matiere metallique
JP5125495B2 (ja) * 2007-12-27 2013-01-23 株式会社島津製作所 発光分析装置
GB2483289B (en) * 2010-09-03 2012-10-17 Thermo Fisher Scient Ecublens Sarl Improved spark chamber for optical emission analysis

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3298275A (en) * 1965-04-19 1967-01-17 Cons Electrodynamics Corp Comparison signal circuit for measuring intensity of spectral lines
JPS5225356B2 (de) * 1973-09-14 1977-07-07
JPS5377582A (en) * 1976-12-20 1978-07-10 Shimadzu Corp Leght emission analyzing method
US4140394A (en) * 1977-06-06 1979-02-20 Baird Corporation Spectrometer sequential readout system
JPS5941534B2 (ja) * 1978-09-29 1984-10-08 株式会社島津製作所 発光分光分析装置
US4690558A (en) * 1984-12-18 1987-09-01 Kawasaki Steel Corporation Method of laser emission spectroscopical analysis and apparatus therefor
JP2603998B2 (ja) * 1987-11-30 1997-04-23 株式会社島津製作所 発光分光分析装置
JPH0676967B2 (ja) * 1989-06-08 1994-09-28 株式会社島津製作所 発光分析装置
JPH0660877B2 (ja) * 1989-10-24 1994-08-10 株式会社島津製作所 発光分光分析法

Also Published As

Publication number Publication date
DE69202175D1 (de) 1995-06-01
EP0501476A3 (en) 1993-02-17
CN1064547A (zh) 1992-09-16
JPH0579982A (ja) 1993-03-30
CN1070609C (zh) 2001-09-05
EP0501476B1 (de) 1995-04-26
US5363189A (en) 1994-11-08
EP0501476A2 (de) 1992-09-02
JP2522216B2 (ja) 1996-08-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee