DE69129577T2 - Verfahren zur Inspektion einer Flüssigkristalltafel - Google Patents

Verfahren zur Inspektion einer Flüssigkristalltafel

Info

Publication number
DE69129577T2
DE69129577T2 DE69129577T DE69129577T DE69129577T2 DE 69129577 T2 DE69129577 T2 DE 69129577T2 DE 69129577 T DE69129577 T DE 69129577T DE 69129577 T DE69129577 T DE 69129577T DE 69129577 T2 DE69129577 T2 DE 69129577T2
Authority
DE
Germany
Prior art keywords
inspecting
procedure
liquid crystal
crystal panel
panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69129577T
Other languages
English (en)
Other versions
DE69129577D1 (de
Inventor
Ryohei Kumagai
Kaoru Hiiro
Harumi Shimizu
Manabu Oosaka
Tooru Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yozan Inc
Sharp Corp
Original Assignee
Yozan Inc
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yozan Inc, Sharp Corp filed Critical Yozan Inc
Application granted granted Critical
Publication of DE69129577D1 publication Critical patent/DE69129577D1/de
Publication of DE69129577T2 publication Critical patent/DE69129577T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S345/00—Computer graphics processing and selective visual display systems
    • Y10S345/904—Display with fail/safe testing feature

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE69129577T 1990-12-04 1991-11-18 Verfahren zur Inspektion einer Flüssigkristalltafel Expired - Fee Related DE69129577T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2404006A JPH04208834A (ja) 1990-12-04 1990-12-04 液晶パネルの検査方法

Publications (2)

Publication Number Publication Date
DE69129577D1 DE69129577D1 (de) 1998-07-16
DE69129577T2 true DE69129577T2 (de) 1998-10-15

Family

ID=18513702

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69129577T Expired - Fee Related DE69129577T2 (de) 1990-12-04 1991-11-18 Verfahren zur Inspektion einer Flüssigkristalltafel

Country Status (5)

Country Link
US (1) US5339093A (de)
EP (1) EP0489295B1 (de)
JP (1) JPH04208834A (de)
KR (1) KR920013183A (de)
DE (1) DE69129577T2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5764209A (en) * 1992-03-16 1998-06-09 Photon Dynamics, Inc. Flat panel display inspection system
JP2820233B2 (ja) * 1993-06-11 1998-11-05 シャープ株式会社 表示装置の検査装置および検査方法
JP3471436B2 (ja) * 1994-08-19 2003-12-02 株式会社アドバンテスト 画質検査装置及びその画像合成方法
JP2685425B2 (ja) * 1994-09-30 1997-12-03 株式会社東芝 液晶素子評価方法
US6074790A (en) * 1994-11-17 2000-06-13 Texas Instruments Incorporated Black and white defect correction for a digital micromirror printer
US5917935A (en) * 1995-06-13 1999-06-29 Photon Dynamics, Inc. Mura detection apparatus and method
US5754678A (en) * 1996-01-17 1998-05-19 Photon Dynamics, Inc. Substrate inspection apparatus and method
JPH09326026A (ja) * 1996-06-07 1997-12-16 Advantest Corp 画像処理方法及び画像処理装置
US6154561A (en) * 1997-04-07 2000-11-28 Photon Dynamics, Inc. Method and apparatus for detecting Mura defects
CA2317803A1 (en) 1998-11-05 2000-05-18 Myoung-Jin Kim Method for inspecting inferiority in shape
JP2001265248A (ja) * 2000-03-14 2001-09-28 Internatl Business Mach Corp <Ibm> アクティブ・マトリックス表示装置、及び、その検査方法
US6664940B2 (en) * 2001-03-23 2003-12-16 Micron Technology, Inc. Apparatus and method for masking display element defects in a display device
JP3871951B2 (ja) * 2002-04-08 2007-01-24 Ｎｅｃインフロンティア株式会社 タッチパネル検査装置
TWI221540B (en) * 2002-04-10 2004-10-01 Toshiba Corp Method of testing liquid crystal display cells and apparatus for the same
KR100505365B1 (ko) * 2003-07-03 2005-08-03 주식회사 한택 픽셀보간을 이용한 디스플레이 패널 검사 장치 및 방법
KR101034923B1 (ko) * 2004-05-31 2011-05-17 엘지디스플레이 주식회사 오토 프로브 검사장비 및 이를 이용한 검사방법
TW200632415A (en) * 2005-03-08 2006-09-16 Quanta Display Inc Method for detecting a cell gap of a LCD panel and equipment thereof
TWM278905U (en) * 2005-05-27 2005-10-21 Innolux Display Corp Transferring equipment
CN102829959B (zh) * 2012-08-16 2014-12-17 京东方科技集团股份有限公司 一种导光板透过率光谱的测试装置及方法
TWI480528B (zh) * 2013-12-09 2015-04-11 Henghao Technology Co Ltd 觸控面板的觸壓測試方法
CN104111548A (zh) * 2014-06-30 2014-10-22 京东方科技集团股份有限公司 用于阵列基板检测设备的光学系统及阵列基板检测设备
US10339881B1 (en) * 2017-12-28 2019-07-02 Shenzhen China Star Optoelectronics Technology Co., Ltd. Method of acquiring overdrive look-up table of liquid crystal display

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4513441A (en) * 1983-08-02 1985-04-23 Sparta, Inc. Image comparison system
JPH02161571A (ja) * 1988-06-09 1990-06-21 Ezel Inc 画像処理方法
US5017755A (en) * 1988-10-26 1991-05-21 Kabushiki Kaisha Toshiba Method of repairing liquid crystal display and apparatus using the method
US5115229A (en) * 1988-11-23 1992-05-19 Hanoch Shalit Method and system in video image reproduction
US5014326A (en) * 1989-03-03 1991-05-07 Greyhawk Systems, Inc. Projected image linewidth correction apparatus and method
FR2652434A1 (fr) * 1989-09-22 1991-03-29 Sextant Avionique Procede et dispositif d'optimisation du contraste et de l'angle de vue d'un afficheur a cristaux liquides.
US5081687A (en) * 1990-11-30 1992-01-14 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array prior to shorting bar removal

Also Published As

Publication number Publication date
JPH04208834A (ja) 1992-07-30
US5339093A (en) 1994-08-16
KR920013183A (ko) 1992-07-28
EP0489295A3 (en) 1992-12-23
EP0489295A2 (de) 1992-06-10
DE69129577D1 (de) 1998-07-16
EP0489295B1 (de) 1998-06-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee