DE69128116D1 - Flash-A/D-Wandler mit Prüfschaltung - Google Patents

Flash-A/D-Wandler mit Prüfschaltung

Info

Publication number
DE69128116D1
DE69128116D1 DE69128116T DE69128116T DE69128116D1 DE 69128116 D1 DE69128116 D1 DE 69128116D1 DE 69128116 T DE69128116 T DE 69128116T DE 69128116 T DE69128116 T DE 69128116T DE 69128116 D1 DE69128116 D1 DE 69128116D1
Authority
DE
Germany
Prior art keywords
flash
converter
test circuit
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69128116T
Other languages
English (en)
Other versions
DE69128116T2 (de
Inventor
Kiyoshi Kase
Hisashi Sekiguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Japan Ltd
Original Assignee
Nippon Motorola Ltd
Motorola Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Motorola Ltd, Motorola Japan Ltd filed Critical Nippon Motorola Ltd
Application granted granted Critical
Publication of DE69128116D1 publication Critical patent/DE69128116D1/de
Publication of DE69128116T2 publication Critical patent/DE69128116T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
DE69128116T 1990-09-17 1991-08-21 Flash-A/D-Wandler mit Prüfschaltung Expired - Fee Related DE69128116T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/583,130 US5124704A (en) 1990-09-17 1990-09-17 Multi-comparator a/d converter with circuit for testing the operation thereof

Publications (2)

Publication Number Publication Date
DE69128116D1 true DE69128116D1 (de) 1997-12-11
DE69128116T2 DE69128116T2 (de) 1998-04-02

Family

ID=24331801

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69128116T Expired - Fee Related DE69128116T2 (de) 1990-09-17 1991-08-21 Flash-A/D-Wandler mit Prüfschaltung

Country Status (3)

Country Link
US (1) US5124704A (de)
EP (1) EP0476331B1 (de)
DE (1) DE69128116T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07131347A (ja) * 1993-11-04 1995-05-19 Mitsubishi Electric Corp Ａ／ｄ変換器テスト回路及びｄ／ａ変換器テスト回路
GB2297210B (en) * 1995-01-20 1998-04-08 Lsi Logic Corp Analogue to digital converter
JPH07326970A (ja) * 1994-05-31 1995-12-12 Toshiba Corp Ａ／ｄ変換器及びａ／ｄ変換器のテスト方法
US5572153A (en) * 1995-03-03 1996-11-05 Lucent Technologies Inc. Low offset comparators based on current copiers
TW280869B (en) * 1995-07-17 1996-07-11 Philips Electronics Nv IDDQ-testing of bias generator circuit
US5760616A (en) * 1995-09-05 1998-06-02 Lucent Technologies, Inc. Current copiers with improved accuracy
DE10163651A1 (de) * 2001-12-21 2003-07-03 Philips Intellectual Property Schaltungsanordnung zum Testen eines Analog-Digital-Umsetzers
US7245148B2 (en) * 2005-09-27 2007-07-17 Micrel, Inc. Power saving method in an integrated circuit programming and control circuit
WO2010032209A1 (en) * 2008-09-18 2010-03-25 Nxp B.V. Comparator testing in a flash a/d converter

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58184819A (ja) * 1982-04-22 1983-10-28 Toshiba Corp 並列形アナログ−デイジタル変換回路
US4774498A (en) * 1987-03-09 1988-09-27 Tektronix, Inc. Analog-to-digital converter with error checking and correction circuits

Also Published As

Publication number Publication date
DE69128116T2 (de) 1998-04-02
EP0476331A2 (de) 1992-03-25
US5124704A (en) 1992-06-23
EP0476331B1 (de) 1997-11-05
EP0476331A3 (en) 1993-06-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee