DE69121306T2 - Hallanordnung - Google Patents

Hallanordnung

Info

Publication number
DE69121306T2
DE69121306T2 DE69121306T DE69121306T DE69121306T2 DE 69121306 T2 DE69121306 T2 DE 69121306T2 DE 69121306 T DE69121306 T DE 69121306T DE 69121306 T DE69121306 T DE 69121306T DE 69121306 T2 DE69121306 T2 DE 69121306T2
Authority
DE
Germany
Prior art keywords
hall arrangement
hall
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69121306T
Other languages
English (en)
Other versions
DE69121306D1 (de
Inventor
Yoshiki Nishibayashi
Hideaki Nakahata
Hiromu Shiomi
Naoji Fujimori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Application granted granted Critical
Publication of DE69121306D1 publication Critical patent/DE69121306D1/de
Publication of DE69121306T2 publication Critical patent/DE69121306T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00Hall-effect devices
    • H10N52/101Semiconductor Hall-effect devices
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/26Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
    • Y10T428/263Coating layer not in excess of 5 mils thick or equivalent
    • Y10T428/264Up to 3 mils
    • Y10T428/2651 mil or less
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/30Self-sustaining carbon mass or layer with impregnant or other layer
DE69121306T 1990-05-21 1991-04-24 Hallanordnung Expired - Fee Related DE69121306T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2131590A JP2884707B2 (ja) 1990-05-21 1990-05-21 ホール素子

Publications (2)

Publication Number Publication Date
DE69121306D1 DE69121306D1 (de) 1996-09-19
DE69121306T2 true DE69121306T2 (de) 1997-01-02

Family

ID=15061611

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69121306T Expired - Fee Related DE69121306T2 (de) 1990-05-21 1991-04-24 Hallanordnung

Country Status (4)

Country Link
US (1) US5162886A (de)
EP (1) EP0458466B1 (de)
JP (1) JP2884707B2 (de)
DE (1) DE69121306T2 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5639551A (en) * 1993-02-10 1997-06-17 California Institute Of Technology Low pressure growth of cubic boron nitride films
US5469424A (en) * 1993-02-23 1995-11-21 Semiconductor Energy Laboratory Co., Ltd. Electronic device utilizing a material capable of storing information which is readable by illumination
JPH0794303A (ja) * 1993-05-04 1995-04-07 Kobe Steel Ltd 高配向性ダイヤモンド薄膜サーミスタ
JPH0786311A (ja) * 1993-05-14 1995-03-31 Kobe Steel Ltd 高配向性ダイヤモンド薄膜電界効果トランジスタ
JPH0794805A (ja) * 1993-05-14 1995-04-07 Kobe Steel Ltd 高配向性ダイヤモンド薄膜磁気検出素子及び磁気検出装置
US5371383A (en) * 1993-05-14 1994-12-06 Kobe Steel Usa Inc. Highly oriented diamond film field-effect transistor
JP3549227B2 (ja) * 1993-05-14 2004-08-04 株式会社神戸製鋼所 高配向性ダイヤモンド薄膜
US5442199A (en) * 1993-05-14 1995-08-15 Kobe Steel Usa, Inc. Diamond hetero-junction rectifying element
JP3755904B2 (ja) * 1993-05-14 2006-03-15 株式会社神戸製鋼所 ダイヤモンド整流素子
US5468688A (en) * 1993-11-01 1995-11-21 Georgia Tech Research Corporation Process for the low temperature creation of nitride films on semiconductors
US5399247A (en) * 1993-12-22 1995-03-21 Eastman Kodak Company Method of electrolysis employing a doped diamond anode to oxidize solutes in wastewater
US5536953A (en) * 1994-03-08 1996-07-16 Kobe Steel Usa Wide bandgap semiconductor device including lightly doped active region
US5670777A (en) * 1994-04-14 1997-09-23 Semiconductor Energy Laboratory Co., Ltd. Photosensitive device and two frequency driving method thereof
US5446307A (en) * 1994-11-04 1995-08-29 The United States Of America As Represented By The Secretary Of The Army Microelectronic 3D bipolar magnetotransistor magnetometer
US5793051A (en) * 1995-06-07 1998-08-11 Robotic Vision Systems, Inc. Method for obtaining three-dimensional data from semiconductor devices in a row/column array and control of manufacturing of same with data to eliminate manufacturing errors
FR2813443B1 (fr) * 2000-08-30 2003-01-03 Centre Nat Rech Scient Capteur a effet hall
JP2006080338A (ja) * 2004-09-10 2006-03-23 Tokyo Institute Of Technology 高温用磁気センサ
DE102012024062A1 (de) * 2012-12-10 2014-06-12 Micronas Gmbh Magnetfeldsensor
CN103143911A (zh) * 2013-03-07 2013-06-12 常州市墅乐厨具有限公司 齿轮自动装配机
CN108776251B (zh) * 2018-03-30 2019-04-30 清华大学 感生电压测量方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57121288A (en) * 1981-01-20 1982-07-28 Sanyo Electric Co Ltd Hall element
JPS60127293A (ja) * 1983-12-15 1985-07-06 Asahi Chem Ind Co Ltd ダイヤモンドの製造方法
JPS6270295A (ja) * 1985-09-24 1987-03-31 Sumitomo Electric Ind Ltd n型半導体ダイヤモンド膜の製造法
EP0221531A3 (de) * 1985-11-06 1992-02-19 Kanegafuchi Kagaku Kogyo Kabushiki Kaisha Isoliertes gut wärmeleitendes Substrat und sein Herstellungsverfahren
US4900628A (en) * 1986-07-23 1990-02-13 Sumitomo Electric Industries, Ltd. Gaseous phase synthesized diamond and method for synthesizing same
US4863529A (en) * 1987-03-12 1989-09-05 Sumitomo Electric Industries, Ltd. Thin film single crystal diamond substrate

Also Published As

Publication number Publication date
EP0458466A2 (de) 1991-11-27
US5162886A (en) 1992-11-10
DE69121306D1 (de) 1996-09-19
JP2884707B2 (ja) 1999-04-19
JPH0426172A (ja) 1992-01-29
EP0458466A3 (en) 1992-02-26
EP0458466B1 (de) 1996-08-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: WESER & KOLLEGEN, 81245 MUENCHEN

8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee