DE69116736T2 - System zum Messen eines Magnetfeldes mit Hilfe eines Supraleitermagnetwiderstandselementes - Google Patents
System zum Messen eines Magnetfeldes mit Hilfe eines SupraleitermagnetwiderstandselementesInfo
- Publication number
- DE69116736T2 DE69116736T2 DE69116736T DE69116736T DE69116736T2 DE 69116736 T2 DE69116736 T2 DE 69116736T2 DE 69116736 T DE69116736 T DE 69116736T DE 69116736 T DE69116736 T DE 69116736T DE 69116736 T2 DE69116736 T2 DE 69116736T2
- Authority
- DE
- Germany
- Prior art keywords
- measuring
- resistance element
- magnetic field
- superconducting
- magnetic resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0352—Superconductive magneto-resistances
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
- Y10S505/843—Electrical
- Y10S505/845—Magnetometer
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2130481A JPH07113665B2 (ja) | 1990-05-21 | 1990-05-21 | 超電導磁界測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69116736D1 DE69116736D1 (de) | 1996-03-14 |
DE69116736T2 true DE69116736T2 (de) | 1996-10-02 |
Family
ID=15035288
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69116736T Expired - Fee Related DE69116736T2 (de) | 1990-05-21 | 1991-05-21 | System zum Messen eines Magnetfeldes mit Hilfe eines Supraleitermagnetwiderstandselementes |
Country Status (4)
Country | Link |
---|---|
US (1) | US5194808A (de) |
EP (1) | EP0459679B1 (de) |
JP (1) | JPH07113665B2 (de) |
DE (1) | DE69116736T2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2700891B1 (fr) * | 1993-01-26 | 1996-06-07 | Thomson Csf | Transducteur frequence/tension a supraconducteur et application aux convertisseurs de frequence/tension. |
CA2303677A1 (en) * | 1999-04-09 | 2000-10-09 | Hideo Itozaki | Device and method for easily adjusting working point of squid |
WO2001096843A1 (en) * | 2000-06-15 | 2001-12-20 | Kla-Tencor, Inc. | Apparatus and method for applying feedback control to a magnetic lens |
EP1637898A1 (de) * | 2004-09-16 | 2006-03-22 | Liaisons Electroniques-Mecaniques Lem S.A. | Dauerhaft kalibrierter Magnetfeldsensor |
US9267781B2 (en) * | 2013-11-19 | 2016-02-23 | Infineon Technologies Ag | On-axis magnetic field angle sensors, systems and methods |
JP6625083B2 (ja) | 2017-03-21 | 2019-12-25 | 株式会社東芝 | 磁気センサ、生体細胞検出装置及び診断装置 |
JP6684854B2 (ja) * | 2018-05-29 | 2020-04-22 | 株式会社東芝 | 磁気センサ及び診断装置 |
CN111812562B (zh) * | 2020-06-01 | 2024-01-30 | 国网辽宁省电力有限公司电力科学研究院 | 一种用于高温超导环形磁体的失超检测方法及装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0301902B1 (de) * | 1987-07-29 | 1993-09-29 | Sharp Kabushiki Kaisha | Verfahren und Anordnung zum Nachweisen eines Magnetfeldes mittels der Magneto-widerstandseigenschaften eines supraleitenden Materials |
US5126667A (en) * | 1987-12-25 | 1992-06-30 | Sharp Kabushiki Kaisha | Superconductive magneto-resistive device for sensing an external magnetic field |
US4906607A (en) * | 1988-04-06 | 1990-03-06 | Drexel University | Sensor and method for indicating the presence of a low magnetic field using high critical temperature superconductor ceramic material to absorb electromagnetic energy |
JPH0216475A (ja) * | 1988-07-04 | 1990-01-19 | Sharp Corp | 超電導磁気測定装置 |
JPH0227279A (ja) * | 1988-07-15 | 1990-01-30 | Sharp Corp | 超電導磁気測定装置 |
-
1990
- 1990-05-21 JP JP2130481A patent/JPH07113665B2/ja not_active Expired - Lifetime
-
1991
- 1991-05-21 DE DE69116736T patent/DE69116736T2/de not_active Expired - Fee Related
- 1991-05-21 US US07/703,671 patent/US5194808A/en not_active Expired - Lifetime
- 1991-05-21 EP EP91304553A patent/EP0459679B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0425780A (ja) | 1992-01-29 |
JPH07113665B2 (ja) | 1995-12-06 |
US5194808A (en) | 1993-03-16 |
DE69116736D1 (de) | 1996-03-14 |
EP0459679B1 (de) | 1996-01-31 |
EP0459679A1 (de) | 1991-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: PATENTANWAELTE MUELLER & HOFFMANN, 81667 MUENCHEN |
|
8339 | Ceased/non-payment of the annual fee |