DE69017109D1 - Testzelle für das kontaktlosen Testen von elektrischen Schaltungen auf Unterbrechungen oder Kurzschlüssen. - Google Patents

Testzelle für das kontaktlosen Testen von elektrischen Schaltungen auf Unterbrechungen oder Kurzschlüssen.

Info

Publication number
DE69017109D1
DE69017109D1 DE69017109T DE69017109T DE69017109D1 DE 69017109 D1 DE69017109 D1 DE 69017109D1 DE 69017109 T DE69017109 T DE 69017109T DE 69017109 T DE69017109 T DE 69017109T DE 69017109 D1 DE69017109 D1 DE 69017109D1
Authority
DE
Germany
Prior art keywords
container
imaging plane
electrodes
circuit board
test cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69017109T
Other languages
English (en)
Other versions
DE69017109T2 (de
Inventor
Andrew J Lepage
Diethelm G Ringleb
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Digital Equipment Corp
Original Assignee
Digital Equipment Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Digital Equipment Corp filed Critical Digital Equipment Corp
Publication of DE69017109D1 publication Critical patent/DE69017109D1/de
Application granted granted Critical
Publication of DE69017109T2 publication Critical patent/DE69017109T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Secondary Cells (AREA)
  • Battery Electrode And Active Subsutance (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Examining Or Testing Airtightness (AREA)
DE69017109T 1989-06-26 1990-06-07 Testzelle für das kontaktlosen Testen von elektrischen Schaltungen auf Unterbrechungen oder Kurzschlüssen. Expired - Fee Related DE69017109T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/371,704 US5032788A (en) 1989-06-26 1989-06-26 Test cell for non-contact opens/shorts testing of electrical circuits

Publications (2)

Publication Number Publication Date
DE69017109D1 true DE69017109D1 (de) 1995-03-30
DE69017109T2 DE69017109T2 (de) 1995-10-26

Family

ID=23465079

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69017109T Expired - Fee Related DE69017109T2 (de) 1989-06-26 1990-06-07 Testzelle für das kontaktlosen Testen von elektrischen Schaltungen auf Unterbrechungen oder Kurzschlüssen.

Country Status (6)

Country Link
US (1) US5032788A (de)
EP (1) EP0409398B1 (de)
JP (1) JPH065245B2 (de)
AT (1) ATE118896T1 (de)
CA (1) CA2018725A1 (de)
DE (1) DE69017109T2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3927842A1 (de) * 1989-08-23 1991-02-28 Siemens Ag Vorrichtung fuer die elektrische funktionspruefung von verdrahtungsfeldern, insbesondere von leiterplatten
US5179279A (en) * 1991-01-25 1993-01-12 Rensselaer Polytechnic Institute Non-contact electrical pathway
EP0508062B1 (de) * 1991-04-10 1995-07-19 atg test systems GmbH Verfahren und Vorrichtung zur Prüfung einer elektrischen Leiteranordnung
JP2577140B2 (ja) * 1991-05-27 1997-01-29 日立テクノエンジニアリング株式会社 基板の位置合わせ装置
DE4200404B4 (de) * 1992-01-10 2006-04-06 Atg Test Systems Gmbh & Co.Kg Vorrichtung zur elektrischen Prüfung und Verfahren
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
US5202623A (en) * 1992-02-26 1993-04-13 Digital Equipment Corporation Laser-activated plasma chamber for non-contact testing
ES2073992B1 (es) * 1993-04-27 1997-08-16 Univ Cadiz Camara de ensayos para sistemas estaticos de deteccion de gases toxicos.
JPH07140209A (ja) 1993-09-20 1995-06-02 Fujitsu Ltd 回路配線基板の検査装置およびその検査方法
US5744752A (en) * 1995-06-05 1998-04-28 International Business Machines Corporation Hermetic thin film metallized sealband for SCM and MCM-D modules
US5587664A (en) * 1995-07-12 1996-12-24 Exsight Ltd. Laser-induced metallic plasma for non-contact inspection
US5818239A (en) * 1997-03-05 1998-10-06 International Business Machines Corporation Simplified contactless test of MCM thin film I/O nets using a plasma
JP3340659B2 (ja) * 1997-10-31 2002-11-05 日本碍子株式会社 電子部品の外観検査装置及び電子部品の外観検査方法
US6268719B1 (en) * 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
US6472889B1 (en) * 2000-06-15 2002-10-29 University Of Connecticut Apparatus and method for producing an ion channel microprobe
DE10038313A1 (de) * 2000-08-05 2002-02-21 Tsk Pruefsysteme Fuer Elek Sch Verfahren und Vorrichtung zur Prüfung von Leiterplatten auf Funktionsfähigkeit
US20050263492A1 (en) * 2004-05-28 2005-12-01 Siemens Energy & Automation, Inc. Molded arc chute
JP2014521932A (ja) * 2011-07-15 2014-08-28 オーボテック リミテッド 電子ビーム誘導プラズマプローブを用いた電子装置の電気検査
TWI519050B (zh) * 2015-01-20 2016-01-21 宇帷國際股份有限公司 電子裝置及其電路模組
TWI522784B (zh) * 2015-01-20 2016-02-21 宇帷國際股份有限公司 電子裝置
US10473712B2 (en) * 2016-12-27 2019-11-12 Infineon Technologies Ag Integrated circuit device testing in an inert gas
CN114264977B (zh) * 2022-01-13 2024-01-26 中山市飞鸿电器有限公司 一种单面印刷电路板开路和短路测试装置
CN116699246B (zh) * 2023-08-04 2023-10-03 滨州高新高端装备制造产业园有限公司 机电设备制造的电器件阻值测量装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3436651A (en) * 1966-12-23 1969-04-01 Texas Instruments Inc Electronic method and apparatus utilizing photoemissive means for testing circuit board continuity
US3710251A (en) * 1971-04-07 1973-01-09 Collins Radio Co Microelectric heat exchanger pedestal
GB2108775B (en) * 1981-10-21 1985-01-03 Marconi Instruments Ltd Electrical interface arrangements
US4527119A (en) * 1982-05-17 1985-07-02 Testamatic, Incorporated High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber
US4507605A (en) * 1982-05-17 1985-03-26 Testamatic, Incorporated Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items
US4520312A (en) * 1982-11-03 1985-05-28 Rca Corporation Method for determining the integrity of passivant coverage over rectifying junctions in semiconductor devices
DE3671106D1 (de) * 1985-09-04 1990-06-13 Siemens Ag Vorrichtung fuer die elektrische funktionspruefung von verdrahtungsfeldern, insbesondere von leiterplatten.
FR2599544B1 (fr) * 1986-05-27 1993-09-10 Commissariat Energie Atomique Appareil d'irradiation pour circuits electroniques
WO1987007549A2 (en) * 1986-06-09 1987-12-17 Nigel Louis Sim Gas heated tool with control valve and refillable container
US4721910A (en) * 1986-09-12 1988-01-26 American Telephone And Telegraph Company, At&T Bell Laboratories High speed circuit measurements using photoemission sampling
US4771230A (en) * 1986-10-02 1988-09-13 Testamatic Corporation Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out

Also Published As

Publication number Publication date
CA2018725A1 (en) 1990-12-26
ATE118896T1 (de) 1995-03-15
US5032788A (en) 1991-07-16
JPH0337578A (ja) 1991-02-18
EP0409398A2 (de) 1991-01-23
JPH065245B2 (ja) 1994-01-19
EP0409398A3 (en) 1992-02-26
EP0409398B1 (de) 1995-02-22
DE69017109T2 (de) 1995-10-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee