DE69003911T2 - Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements. - Google Patents
Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements.Info
- Publication number
- DE69003911T2 DE69003911T2 DE90116757T DE69003911T DE69003911T2 DE 69003911 T2 DE69003911 T2 DE 69003911T2 DE 90116757 T DE90116757 T DE 90116757T DE 69003911 T DE69003911 T DE 69003911T DE 69003911 T2 DE69003911 T2 DE 69003911T2
- Authority
- DE
- Germany
- Prior art keywords
- measuring
- emitting element
- light
- semiconductor light
- light output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
- G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Led Devices (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22295789A JPH06101592B2 (ja) | 1989-08-31 | 1989-08-31 | 半導体発光素子の発光出力測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69003911D1 DE69003911D1 (de) | 1993-11-18 |
DE69003911T2 true DE69003911T2 (de) | 1994-04-14 |
Family
ID=16790531
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE90116757T Expired - Fee Related DE69003911T2 (de) | 1989-08-31 | 1990-08-31 | Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5065007A (de) |
EP (1) | EP0415440B1 (de) |
JP (1) | JPH06101592B2 (de) |
KR (1) | KR940010054B1 (de) |
DE (1) | DE69003911T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5381103A (en) * | 1992-10-13 | 1995-01-10 | Cree Research, Inc. | System and method for accelerated degradation testing of semiconductor devices |
GB9824671D0 (en) * | 1998-11-11 | 1999-01-06 | Cashmaster Int Ltd | Monitoring apparatus |
US6970811B1 (en) * | 2000-03-22 | 2005-11-29 | Hewlett-Packard Development Company, L.P. | Hardware modeling of LED relative brightness |
US6760124B1 (en) | 2000-03-22 | 2004-07-06 | Hewlett-Packard Development Company, L.P. | Software determination of led brightness and exposure |
US6490037B1 (en) * | 2000-11-13 | 2002-12-03 | Test Coach Corporation | Method and apparatus for verifying a color of an LED in a printed circuit board |
US7023554B2 (en) * | 2003-11-14 | 2006-04-04 | Test Coach Corporation | Method and apparatus for determining a color and brightness of an LED in a printed circuit board |
US7265822B2 (en) * | 2004-10-01 | 2007-09-04 | Test Coach Corporation | Method and apparatus for determining presence of a component in a printed circuit board |
KR100768884B1 (ko) * | 2007-04-26 | 2007-10-19 | 서승환 | 기판의 발광소자 검사장치 |
AU2010281408B2 (en) | 2009-08-03 | 2016-01-28 | Sof-Tek Integrators, Inc., Dba Op-Test | System and method of testing high brightness LED (HBLED) |
KR100953753B1 (ko) * | 2009-08-25 | 2010-04-19 | 주식회사 대한전광 | 집단 광원 측정 장치 |
WO2015095857A2 (en) * | 2013-12-22 | 2015-06-25 | Lehighton Electronics, Inc. | System and method for noncontact sensing maximum open circuit voltage of photovoltaic semiconductors |
US10302496B2 (en) | 2016-02-09 | 2019-05-28 | Nasa Solutions, Llc | Method and apparatus for determining presence and operation of a component in a printed circuit board |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD118942A1 (de) * | 1975-04-01 | 1976-03-20 | ||
DE3328899C2 (de) * | 1983-08-10 | 1985-07-11 | Nukem Gmbh, 6450 Hanau | Photovoltaische Zelle |
JPS62278423A (ja) * | 1986-05-28 | 1987-12-03 | Mitsubishi Electric Corp | 発光装置の検査装置 |
US4859939A (en) * | 1987-12-21 | 1989-08-22 | The United States Of America As Represented By The Secretary Of The Army | Non-destructive testing of SOS wafers using surface photovoltage measurements |
US5008617A (en) * | 1989-06-20 | 1991-04-16 | Energy Conversion Devices, Inc. | Functional testing of ultra large area, ultra large scale integrated circuits |
-
1989
- 1989-08-31 JP JP22295789A patent/JPH06101592B2/ja not_active Expired - Lifetime
-
1990
- 1990-08-23 US US07/571,158 patent/US5065007A/en not_active Expired - Lifetime
- 1990-08-30 KR KR1019900013453A patent/KR940010054B1/ko not_active IP Right Cessation
- 1990-08-31 DE DE90116757T patent/DE69003911T2/de not_active Expired - Fee Related
- 1990-08-31 EP EP90116757A patent/EP0415440B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0415440A2 (de) | 1991-03-06 |
DE69003911D1 (de) | 1993-11-18 |
US5065007A (en) | 1991-11-12 |
JPH06101592B2 (ja) | 1994-12-12 |
KR910005042A (ko) | 1991-03-29 |
KR940010054B1 (ko) | 1994-10-21 |
EP0415440B1 (de) | 1993-10-13 |
EP0415440A3 (en) | 1991-09-18 |
JPH0388372A (ja) | 1991-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |