DE69003911D1 - Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements. - Google Patents

Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements.

Info

Publication number
DE69003911D1
DE69003911D1 DE90116757T DE69003911T DE69003911D1 DE 69003911 D1 DE69003911 D1 DE 69003911D1 DE 90116757 T DE90116757 T DE 90116757T DE 69003911 T DE69003911 T DE 69003911T DE 69003911 D1 DE69003911 D1 DE 69003911D1
Authority
DE
Germany
Prior art keywords
measuring
emitting element
light
semiconductor light
light output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE90116757T
Other languages
English (en)
Other versions
DE69003911T2 (de
Inventor
Toshiaki Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE69003911D1 publication Critical patent/DE69003911D1/de
Application granted granted Critical
Publication of DE69003911T2 publication Critical patent/DE69003911T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
DE90116757T 1989-08-31 1990-08-31 Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements. Expired - Fee Related DE69003911T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22295789A JPH06101592B2 (ja) 1989-08-31 1989-08-31 半導体発光素子の発光出力測定装置

Publications (2)

Publication Number Publication Date
DE69003911D1 true DE69003911D1 (de) 1993-11-18
DE69003911T2 DE69003911T2 (de) 1994-04-14

Family

ID=16790531

Family Applications (1)

Application Number Title Priority Date Filing Date
DE90116757T Expired - Fee Related DE69003911T2 (de) 1989-08-31 1990-08-31 Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements.

Country Status (5)

Country Link
US (1) US5065007A (de)
EP (1) EP0415440B1 (de)
JP (1) JPH06101592B2 (de)
KR (1) KR940010054B1 (de)
DE (1) DE69003911T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5381103A (en) * 1992-10-13 1995-01-10 Cree Research, Inc. System and method for accelerated degradation testing of semiconductor devices
GB9824671D0 (en) * 1998-11-11 1999-01-06 Cashmaster Int Ltd Monitoring apparatus
US6760124B1 (en) 2000-03-22 2004-07-06 Hewlett-Packard Development Company, L.P. Software determination of led brightness and exposure
US6970811B1 (en) * 2000-03-22 2005-11-29 Hewlett-Packard Development Company, L.P. Hardware modeling of LED relative brightness
US6490037B1 (en) * 2000-11-13 2002-12-03 Test Coach Corporation Method and apparatus for verifying a color of an LED in a printed circuit board
US7023554B2 (en) * 2003-11-14 2006-04-04 Test Coach Corporation Method and apparatus for determining a color and brightness of an LED in a printed circuit board
US7265822B2 (en) * 2004-10-01 2007-09-04 Test Coach Corporation Method and apparatus for determining presence of a component in a printed circuit board
KR100768884B1 (ko) * 2007-04-26 2007-10-19 서승환 기판의 발광소자 검사장치
CA2770366C (en) 2009-08-03 2019-01-22 Sof-Tek Integrators, Inc., Dba Op-Test System and method of testing high brightness led (hbled)
KR100953753B1 (ko) * 2009-08-25 2010-04-19 주식회사 대한전광 집단 광원 측정 장치
US20160313388A1 (en) * 2013-12-22 2016-10-27 Lehighton Electronics, Inc. Noncontact sensing of maximum open-circuit voltages
US10302496B2 (en) 2016-02-09 2019-05-28 Nasa Solutions, Llc Method and apparatus for determining presence and operation of a component in a printed circuit board

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD118942A1 (de) * 1975-04-01 1976-03-20
DE3328899C2 (de) * 1983-08-10 1985-07-11 Nukem Gmbh, 6450 Hanau Photovoltaische Zelle
JPS62278423A (ja) * 1986-05-28 1987-12-03 Mitsubishi Electric Corp 発光装置の検査装置
US4859939A (en) * 1987-12-21 1989-08-22 The United States Of America As Represented By The Secretary Of The Army Non-destructive testing of SOS wafers using surface photovoltage measurements
US5008617A (en) * 1989-06-20 1991-04-16 Energy Conversion Devices, Inc. Functional testing of ultra large area, ultra large scale integrated circuits

Also Published As

Publication number Publication date
KR940010054B1 (ko) 1994-10-21
JPH06101592B2 (ja) 1994-12-12
JPH0388372A (ja) 1991-04-12
KR910005042A (ko) 1991-03-29
EP0415440B1 (de) 1993-10-13
EP0415440A2 (de) 1991-03-06
US5065007A (en) 1991-11-12
DE69003911T2 (de) 1994-04-14
EP0415440A3 (en) 1991-09-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee