DE68927388D1 - Ein Zweistrahl-Vollspektrum-Mehrkanal-Spektralphotometer - Google Patents

Ein Zweistrahl-Vollspektrum-Mehrkanal-Spektralphotometer

Info

Publication number
DE68927388D1
DE68927388D1 DE68927388T DE68927388T DE68927388D1 DE 68927388 D1 DE68927388 D1 DE 68927388D1 DE 68927388 T DE68927388 T DE 68927388T DE 68927388 T DE68927388 T DE 68927388T DE 68927388 D1 DE68927388 D1 DE 68927388D1
Authority
DE
Germany
Prior art keywords
spectrum
full
channel spectrophotometer
spectrophotometer
channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68927388T
Other languages
English (en)
Other versions
DE68927388T2 (de
Inventor
Edwin R Sapp
Eric K Kinast
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Biosystems Inc
Original Assignee
Applied Biosystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Biosystems Inc filed Critical Applied Biosystems Inc
Application granted granted Critical
Publication of DE68927388D1 publication Critical patent/DE68927388D1/de
Publication of DE68927388T2 publication Critical patent/DE68927388T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J2001/161—Ratio method, i.e. Im/Ir
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J2001/1673—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using a reference sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/123—Conversion circuit
    • G01N2201/1232—Log representation, e.g. for low transmittance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/126—Microprocessor processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/74—Optical detectors
DE68927388T 1988-02-16 1989-02-14 Ein Zweistrahl-Vollspektrum-Mehrkanal-Spektralphotometer Expired - Fee Related DE68927388T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/156,285 US4848904A (en) 1988-02-16 1988-02-16 Dual beam multichannel spectrophotometer with a unique logarithmic data converter

Publications (2)

Publication Number Publication Date
DE68927388D1 true DE68927388D1 (de) 1996-11-28
DE68927388T2 DE68927388T2 (de) 1997-04-10

Family

ID=22558921

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68927388T Expired - Fee Related DE68927388T2 (de) 1988-02-16 1989-02-14 Ein Zweistrahl-Vollspektrum-Mehrkanal-Spektralphotometer

Country Status (5)

Country Link
US (1) US4848904A (de)
EP (2) EP0497434B1 (de)
JP (1) JP2873692B2 (de)
CA (1) CA1324501C (de)
DE (1) DE68927388T2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148239A (en) * 1990-07-17 1992-09-15 Rainin Instrument Co., Inc. High performance absorbance detector with flashlamp and compact folded optics system
US5214593A (en) * 1990-11-07 1993-05-25 Rainin Instrument Co., Inc. Method and apparatus for extending the linear dynamic range of absorbance detectors including multi-lightpath flow cells
US5210412A (en) * 1991-01-31 1993-05-11 Wayne State University Method for analyzing an organic sample
JPH04244945A (ja) * 1991-01-31 1992-09-01 Shimadzu Corp 分光光度計
US5747813A (en) * 1992-06-16 1998-05-05 Kla-Tencop. Corporation Broadband microspectro-reflectometer
DE4223211C2 (de) * 1992-07-15 1999-03-04 Bodenseewerk Perkin Elmer Co Zweistrahl-Gitterpolychromator
EP0655128B1 (de) * 1992-08-13 1998-03-18 Hewlett-Packard Company Spektroskopische systeme zur analyse von kleinen und kleinsten substanzmengen
DE4226884C1 (de) * 1992-08-13 1994-03-10 Meinrad Maechler Spektroskopisches System zur Durchführung der Mikroanalytik
DE4410036B4 (de) * 1994-03-23 2004-09-02 Berthold Gmbh & Co. Kg Zweistrahl-Polychromator
DE19543729B4 (de) * 1995-11-23 2008-08-21 Berthold Gmbh & Co. Kg Spektrometer
US6904784B2 (en) * 2001-02-27 2005-06-14 Teledyne Isco, Inc. Liquid chromatographic method and system
JP2006505832A (ja) * 2002-02-26 2006-02-16 フアルマシア・コーポレーシヨン 配列決定システム計算機
US6741348B2 (en) * 2002-04-29 2004-05-25 The Curators Of The University Of Missouri Ultrasensitive spectrophotometer
US20050122523A1 (en) * 2003-12-03 2005-06-09 Wen-Bin Yan Device and method of trace gas analysis using cavity ring-down spectroscopy
US7268881B2 (en) * 2004-02-17 2007-09-11 The Curators Of The University Of Missouri Light scattering detector
JP2006003233A (ja) * 2004-06-17 2006-01-05 Otsuka Denshi Co Ltd 光学セル測定装置
US7262844B2 (en) * 2005-01-13 2007-08-28 The Curators Of The University Of Missouri Ultrasensitive spectrophotometer
US7903252B2 (en) * 2005-01-13 2011-03-08 The Curators Of The University Of Missouri Noise cancellation in fourier transform spectrophotometry
JP5469869B2 (ja) 2006-03-09 2014-04-16 オールテック・アソシエイツ・インコーポレーテッド 蒸発光散乱検出器
WO2009152321A1 (en) * 2008-06-11 2009-12-17 The Curators Of The University Of Missouri Liquid chromatography detector and flow controller therefor
US8766191B2 (en) * 2009-10-06 2014-07-01 The Curators Of The University Of Missouri External/internal optical adapter for FTIR spectrophotometer
CN102879096B (zh) * 2012-09-04 2013-08-21 上海汉谱光电科技有限公司 双光路单光栅的漫射照明反射光谱测量系统及测量方法
US9970819B2 (en) 2015-03-23 2018-05-15 Si-Ware Systems High performance parallel spectrometer device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US28803A (en) * 1860-06-19 Coffee-pot
GB790434A (en) * 1955-04-13 1958-02-12 Parsons C A & Co Ltd Improvements in or relating to double beam spectrometers
US3137757A (en) * 1958-02-07 1964-06-16 Parsons & Co Sir Howard G Apparatus for the analysis of substances by absorption of radiation
US3504978A (en) * 1965-02-04 1970-04-07 Shimadzu Corp Plural beam spectrophotometer with a diffusion plate between each cell and detector
DE2220231A1 (de) * 1972-04-25 1973-11-08 Serv Anstalt Photometer zur digitalen anzeige der lichtabsorption einer messprobe in einer kuevette
JPS4941837A (de) * 1972-08-30 1974-04-19
US3952206A (en) * 1974-05-09 1976-04-20 Coulter Electronics, Inc. Photometer circuit
GB1559810A (en) * 1975-11-05 1980-01-30 Nat Res Dev Device for measuring light received from an illuminated material
JPS6033378Y2 (ja) * 1977-09-30 1985-10-04 株式会社日立製作所 クロマトグラフ検出器用光度計
GB2043880A (en) * 1979-03-05 1980-10-08 Pye Electronic Prod Ltd Noise reduction in dual beam ratio recording spectrophotometers
US4678917A (en) * 1985-02-19 1987-07-07 The Perkin-Elmer Corporation Instantaneous reading multichannel polychromatic spectrophotometer method and apparatus
JPS62157537A (ja) * 1985-12-30 1987-07-13 Japan Spectroscopic Co 分光光度計における信号処理方法

Also Published As

Publication number Publication date
CA1324501C (en) 1993-11-23
JP2873692B2 (ja) 1999-03-24
EP0497434A2 (de) 1992-08-05
JPH01250741A (ja) 1989-10-05
DE68927388T2 (de) 1997-04-10
EP0497434B1 (de) 1996-10-23
EP0329061A3 (de) 1991-11-13
EP0497434A3 (en) 1992-12-16
US4848904A (en) 1989-07-18
EP0329061A2 (de) 1989-08-23

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: THE PERKIN-ELMER CORP. (N.D.GES.D.STAATES NEW YORK

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: APPLERA CORP., FOSTER CITY, CALIF., US

8339 Ceased/non-payment of the annual fee