DE68924931D1 - ESD-Eingangsstruktur mit niedrigem Widerstand. - Google Patents

ESD-Eingangsstruktur mit niedrigem Widerstand.

Info

Publication number
DE68924931D1
DE68924931D1 DE68924931T DE68924931T DE68924931D1 DE 68924931 D1 DE68924931 D1 DE 68924931D1 DE 68924931 T DE68924931 T DE 68924931T DE 68924931 T DE68924931 T DE 68924931T DE 68924931 D1 DE68924931 D1 DE 68924931D1
Authority
DE
Germany
Prior art keywords
low resistance
input structure
esd input
resistance esd
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68924931T
Other languages
English (en)
Inventor
Jeff Huard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Semiconductor Corp
Original Assignee
National Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Semiconductor Corp filed Critical National Semiconductor Corp
Application granted granted Critical
Publication of DE68924931D1 publication Critical patent/DE68924931D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Logic Circuits (AREA)
DE68924931T 1988-07-06 1989-06-28 ESD-Eingangsstruktur mit niedrigem Widerstand. Expired - Lifetime DE68924931D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/215,865 US4875130A (en) 1988-07-06 1988-07-06 ESD low resistance input structure

Publications (1)

Publication Number Publication Date
DE68924931D1 true DE68924931D1 (de) 1996-01-11

Family

ID=22804723

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68924931T Expired - Lifetime DE68924931D1 (de) 1988-07-06 1989-06-28 ESD-Eingangsstruktur mit niedrigem Widerstand.

Country Status (6)

Country Link
US (1) US4875130A (de)
EP (1) EP0349890B1 (de)
JP (1) JPH02140979A (de)
KR (1) KR900002314A (de)
CA (1) CA1332072C (de)
DE (1) DE68924931D1 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5195010A (en) * 1990-01-23 1993-03-16 Thomson, S.A. Electrostatic discharge voltage protection circuit for a solid state instrument
US5561373A (en) * 1990-10-09 1996-10-01 Fujitsu Limited Method and device for detecting electrostatic stress applied to a product semiconductor device during each production process
US5359211A (en) * 1991-07-18 1994-10-25 Harris Corporation High voltage protection using SCRs
FR2686737A1 (fr) * 1992-01-29 1993-07-30 Sgs Thomson Microelectronics Composant de protection semiconducteur auto-protege.
US5591661A (en) * 1992-04-07 1997-01-07 Shiota; Philip Method for fabricating devices for electrostatic discharge protection and voltage references, and the resulting structures
US5272097A (en) * 1992-04-07 1993-12-21 Philip Shiota Method for fabricating diodes for electrostatic discharge protection and voltage references
US5521789A (en) * 1994-03-15 1996-05-28 National Semiconductor Corporation BICMOS electrostatic discharge protection circuit
US5489866A (en) * 1994-04-19 1996-02-06 Xilinx, Inc. High speed and low noise margin schmitt trigger with controllable trip point
GB9416899D0 (en) * 1994-08-20 1994-10-12 Philips Electronics Uk Ltd Manufacture of electronic devices comprising thin-film circuitry
US5535086A (en) * 1994-09-22 1996-07-09 National Semiconductor Corp. ESD protection circuit and method for BICMOS devices
US5675469A (en) * 1995-07-12 1997-10-07 Motorola, Inc. Integrated circuit with electrostatic discharge (ESD) protection and ESD protection circuit
US5656967A (en) * 1995-08-07 1997-08-12 Micron Technology, Inc. Two-stage fusible electrostatic discharge protection circuit
AU6388796A (en) * 1995-09-11 1997-04-01 Analog Devices, Inc. Electrostatic discharge protection network and method
US5708550A (en) * 1995-10-25 1998-01-13 David Sarnoff Research Center, Inc. ESD protection for overvoltage friendly input/output circuits
JPH09293836A (ja) * 1996-04-25 1997-11-11 Rohm Co Ltd 半導体装置
JP3717227B2 (ja) * 1996-03-29 2005-11-16 株式会社ルネサステクノロジ 入力／出力保護回路
US5663860A (en) * 1996-06-28 1997-09-02 Harris Corporation High voltage protection circuits
KR100249162B1 (ko) * 1996-12-31 2000-03-15 김영환 정전기(eds)보호회로
SE512494C2 (sv) * 1997-09-02 2000-03-27 Ericsson Telefon Ab L M Skyddskrets
FR2782581B1 (fr) * 1998-08-18 2000-09-22 St Microelectronics Sa Dispositif de protection contre les decharges electrostatiques
US6600356B1 (en) * 1999-04-30 2003-07-29 Analog Devices, Inc. ESD protection circuit with controlled breakdown voltage
EP1119104B1 (de) * 2000-01-20 2009-06-17 STMicroelectronics S.r.l. Leistungsvorrichtung mit Schutz gegen unerwünschte Selbstaktivierung
US6876529B2 (en) * 2000-12-15 2005-04-05 Skyworks Solutions, Inc. Electrostatic discharge protection circuit
US7075763B2 (en) * 2002-10-31 2006-07-11 Micron Technology, Inc. Methods, circuits, and applications using a resistor and a Schottky diode
JP2007088712A (ja) * 2005-09-21 2007-04-05 Seiko Instruments Inc ノイズフィルタ回路
US7881028B2 (en) * 2008-03-04 2011-02-01 International Business Machines Corporation E-fuse used to disable a triggering network
CN101834183B (zh) 2010-04-23 2012-02-01 崇贸科技股份有限公司 半导体结构
US20130320960A1 (en) * 2012-05-29 2013-12-05 David Soriano Fosas Apparatus and methods for measuring a current
JP2015065767A (ja) * 2013-09-25 2015-04-09 東芝ライテック株式会社 整流回路、電子回路及び電子機器

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3787717A (en) * 1971-12-09 1974-01-22 Ibm Over voltage protection circuit lateral bipolar transistor with gated collector junction
NL176322C (nl) * 1976-02-24 1985-03-18 Philips Nv Halfgeleiderinrichting met beveiligingsschakeling.
US4366522A (en) * 1979-12-10 1982-12-28 Reliance Electric Company Self-snubbing bipolar/field effect (biofet) switching circuits and method
JPS577151A (en) * 1980-06-17 1982-01-14 Nec Corp Monolithic ic circuit
IT1150062B (it) * 1980-11-19 1986-12-10 Ates Componenti Elettron Protezione di ingresso per circuito integrato di tipo mos, a bassa tensione di alimentazione e ad alta densita' di integrazione
US4400711A (en) * 1981-03-31 1983-08-23 Rca Corporation Integrated circuit protection device
JPS58159370A (ja) * 1982-03-18 1983-09-21 Nec Corp モノリシツク集積回路
JPS59134863A (ja) * 1982-12-28 1984-08-02 Fujitsu Ltd 静電破壊防止回路
JPS6159767A (ja) * 1984-08-30 1986-03-27 Fujitsu Ltd 半導体装置
US4763184A (en) * 1985-04-30 1988-08-09 Waferscale Integration, Inc. Input circuit for protecting against damage caused by electrostatic discharge
JPH0666402B2 (ja) * 1985-12-12 1994-08-24 三菱電機株式会社 半導体集積回路装置の入力保護回路

Also Published As

Publication number Publication date
CA1332072C (en) 1994-09-20
EP0349890A3 (en) 1990-10-24
EP0349890B1 (de) 1995-11-29
KR900002314A (ko) 1990-02-28
JPH02140979A (ja) 1990-05-30
US4875130A (en) 1989-10-17
EP0349890A2 (de) 1990-01-10

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Legal Events

Date Code Title Description
8332 No legal effect for de