DE68920347D1 - Bogenförmige Fotosensorenanordnung. - Google Patents

Bogenförmige Fotosensorenanordnung.

Info

Publication number
DE68920347D1
DE68920347D1 DE68920347T DE68920347T DE68920347D1 DE 68920347 D1 DE68920347 D1 DE 68920347D1 DE 68920347 T DE68920347 T DE 68920347T DE 68920347 T DE68920347 T DE 68920347T DE 68920347 D1 DE68920347 D1 DE 68920347D1
Authority
DE
Germany
Prior art keywords
arc
sensor arrangement
photo sensor
shaped photo
shaped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68920347T
Other languages
English (en)
Other versions
DE68920347T2 (de
Inventor
Takeshi Niwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE68920347D1 publication Critical patent/DE68920347D1/de
Publication of DE68920347T2 publication Critical patent/DE68920347T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0211Investigating a scatter or diffraction pattern
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/02016Circuit arrangements of general character for the devices
    • H01L31/02019Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02024Position sensitive and lateral effect photodetectors; Quadrant photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • G01N2021/4716Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
DE68920347T 1988-03-09 1989-03-09 Bogenförmige Fotosensorenanordnung. Expired - Fee Related DE68920347T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988031401U JPH01134245U (de) 1988-03-09 1988-03-09

Publications (2)

Publication Number Publication Date
DE68920347D1 true DE68920347D1 (de) 1995-02-16
DE68920347T2 DE68920347T2 (de) 1995-06-14

Family

ID=12330236

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68920347T Expired - Fee Related DE68920347T2 (de) 1988-03-09 1989-03-09 Bogenförmige Fotosensorenanordnung.

Country Status (5)

Country Link
US (1) US4977314A (de)
EP (1) EP0332440B1 (de)
JP (1) JPH01134245U (de)
CN (1) CN1019052B (de)
DE (1) DE68920347T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2715604B2 (ja) * 1989-12-18 1998-02-18 株式会社島津製作所 レーザ回折・散乱式粒度分布測定装置
JP2522880B2 (ja) * 1992-03-30 1996-08-07 日機装株式会社 粒度分布測定装置
ES2184236T3 (es) 1997-02-06 2003-04-01 Therasense Inc Sensor in vitro de analitos de pequeño volumen.
US6338790B1 (en) 1998-10-08 2002-01-15 Therasense, Inc. Small volume in vitro analyte sensor with diffusible or non-leachable redox mediator
GB0103757D0 (en) * 2001-02-16 2001-04-04 Univ Hertfordshire Methods and apparatus for the detection and characterisation of liquid-borne a rticles
DE202008001018U1 (de) * 2008-01-29 2009-06-25 Pepperl + Fuchs Gmbh Sensor zum Nachweis von Objekten durch Lichtbeugung
USD742059S1 (en) * 2014-02-28 2015-10-27 Leeo, Inc. Nightlight and air sensor
USD741728S1 (en) * 2014-02-28 2015-10-27 Leeo, Inc. Nightlight and air sensor
USD741539S1 (en) * 2014-02-28 2015-10-20 Leeo, Inc. Nightlight and air sensor
US10056518B2 (en) 2014-06-23 2018-08-21 Qorvo Us, Inc. Active photonic device having a Darlington configuration
US9933304B2 (en) * 2015-10-02 2018-04-03 Qorvo Us, Inc. Active photonic device having a Darlington configuration with feedback
US10147833B2 (en) 2016-04-15 2018-12-04 Qorvo Us, Inc. Active photonic device having a Darlington configuration with feedback

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3689772A (en) * 1971-08-18 1972-09-05 Litton Systems Inc Photodetector light pattern detector
US3785735A (en) * 1972-01-19 1974-01-15 Bio Physics Systems Inc Photoanalysis method
US4150360A (en) * 1975-05-29 1979-04-17 Grumman Aerospace Corporation Method and apparatus for classifying biological cells
US4231053A (en) * 1979-03-05 1980-10-28 The United States Of America As Represented By The Secretary Of The Navy High electrical frequency infrared detector
US4274741A (en) * 1979-09-26 1981-06-23 Compagnie Industrielle Des Lasers Device for determining the granulometric composition of a mixture of particles by diffraction of light

Also Published As

Publication number Publication date
EP0332440A2 (de) 1989-09-13
CN1019052B (zh) 1992-11-11
DE68920347T2 (de) 1995-06-14
EP0332440A3 (de) 1991-07-03
CN1037965A (zh) 1989-12-13
EP0332440B1 (de) 1995-01-04
JPH01134245U (de) 1989-09-13
US4977314A (en) 1990-12-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee