DE68918783T2 - MIS-Bauelement. - Google Patents

MIS-Bauelement.

Info

Publication number
DE68918783T2
DE68918783T2 DE68918783T DE68918783T DE68918783T2 DE 68918783 T2 DE68918783 T2 DE 68918783T2 DE 68918783 T DE68918783 T DE 68918783T DE 68918783 T DE68918783 T DE 68918783T DE 68918783 T2 DE68918783 T2 DE 68918783T2
Authority
DE
Germany
Prior art keywords
mis device
mis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68918783T
Other languages
English (en)
Other versions
DE68918783D1 (de
Inventor
Akira Fujisawa
Kazuhiro Takenaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1125854A external-priority patent/JPH02138775A/ja
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of DE68918783D1 publication Critical patent/DE68918783D1/de
Application granted granted Critical
Publication of DE68918783T2 publication Critical patent/DE68918783T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0843Source or drain regions of field-effect devices
    • H01L29/0847Source or drain regions of field-effect devices of field-effect transistors with insulated gate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/7833Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
    • H01L29/7835Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with asymmetrical source and drain regions, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
DE68918783T 1988-08-18 1989-08-08 MIS-Bauelement. Expired - Fee Related DE68918783T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP20552988 1988-08-18
JP20553188 1988-08-18
JP20553088 1988-08-18
JP1125854A JPH02138775A (ja) 1988-08-18 1989-05-19 Mis型半導体装置

Publications (2)

Publication Number Publication Date
DE68918783D1 DE68918783D1 (de) 1994-11-17
DE68918783T2 true DE68918783T2 (de) 1995-03-30

Family

ID=27471149

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68918783T Expired - Fee Related DE68918783T2 (de) 1988-08-18 1989-08-08 MIS-Bauelement.

Country Status (2)

Country Link
EP (1) EP0356062B1 (de)
DE (1) DE68918783T2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2609753B2 (ja) * 1990-10-17 1997-05-14 株式会社東芝 半導体装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57103356A (en) * 1980-12-19 1982-06-26 Hitachi Ltd Mos semiconductor device
JPS5834958A (ja) * 1981-08-26 1983-03-01 Nec Corp 入力保護装置
JPS60117674A (ja) * 1983-11-29 1985-06-25 Fujitsu Ltd 高耐圧半導体装置
DE3408285A1 (de) * 1984-03-07 1985-09-19 Telefunken electronic GmbH, 7100 Heilbronn Schutzanordnung fuer einen feldeffekttransistor
JPS6187374A (ja) * 1984-10-05 1986-05-02 Nec Corp 高電圧集積回路
EP0267768A1 (de) * 1986-11-10 1988-05-18 SILICONIX Incorporated Drifted-Drain-MOS-Transistor für hohe Spannungen

Also Published As

Publication number Publication date
EP0356062A2 (de) 1990-02-28
DE68918783D1 (de) 1994-11-17
EP0356062B1 (de) 1994-10-12
EP0356062A3 (en) 1990-10-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee