DE68908351D1 - Verfahren und vorrichtung zur pruefung des randes eines deckels. - Google Patents

Verfahren und vorrichtung zur pruefung des randes eines deckels.

Info

Publication number
DE68908351D1
DE68908351D1 DE8989202911T DE68908351T DE68908351D1 DE 68908351 D1 DE68908351 D1 DE 68908351D1 DE 8989202911 T DE8989202911 T DE 8989202911T DE 68908351 T DE68908351 T DE 68908351T DE 68908351 D1 DE68908351 D1 DE 68908351D1
Authority
DE
Germany
Prior art keywords
checking
lid
edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8989202911T
Other languages
English (en)
Other versions
DE68908351T2 (de
Inventor
Nicolaas Cornelis Swart
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Heuft Qualiplus BV
Original Assignee
Heuft Qualiplus BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heuft Qualiplus BV filed Critical Heuft Qualiplus BV
Publication of DE68908351D1 publication Critical patent/DE68908351D1/de
Application granted granted Critical
Publication of DE68908351T2 publication Critical patent/DE68908351T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/909—Investigating the presence of flaws or contamination in a container or its contents in opaque containers or opaque container parts, e.g. cans, tins, caps, labels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera

Landscapes

  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
DE89202911T 1988-11-21 1989-11-16 Verfahren und Vorrichtung zur Prüfung des Randes eines Deckels. Expired - Lifetime DE68908351T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8802869 1988-11-21

Publications (2)

Publication Number Publication Date
DE68908351D1 true DE68908351D1 (de) 1993-09-16
DE68908351T2 DE68908351T2 (de) 1993-12-02

Family

ID=19853262

Family Applications (1)

Application Number Title Priority Date Filing Date
DE89202911T Expired - Lifetime DE68908351T2 (de) 1988-11-21 1989-11-16 Verfahren und Vorrichtung zur Prüfung des Randes eines Deckels.

Country Status (8)

Country Link
US (1) US5004347A (de)
EP (1) EP0370570B1 (de)
JP (1) JP2839594B2 (de)
AU (1) AU627796B2 (de)
CA (1) CA2003335A1 (de)
DE (1) DE68908351T2 (de)
DK (1) DK585189A (de)
ES (1) ES2042981T3 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU5170993A (en) * 1993-04-12 1994-11-08 Combustion Engineering Inc. Visual inspection tool
DE102007018870A1 (de) * 2007-04-19 2008-10-23 Krones Ag Inspektionsvorrichtung zum Untersuchen von Behältnisverschlüssen
JP6786593B2 (ja) 2015-08-26 2020-11-18 アーベーベー・シュバイツ・アーゲーＡＢＢ Ｓｃｈｗｅｉｚ ＡＧ 多視点による対象検査装置及び方法
CN113058867B (zh) * 2019-06-26 2022-03-01 东莞理工学院 一种3c产品外壳检测筛分机构

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4037724A (en) * 1975-05-20 1977-07-26 Firma Up Geratebau-Und Vertriebs Gmbh Method of and apparatus for measuring defects in sealings
JPS576306A (en) * 1980-06-13 1982-01-13 Toyota Central Res & Dev Lab Inc Method and apparatus for inspection of edge boundary part of circular member
JPS577505A (en) * 1980-06-16 1982-01-14 Meiji Seika Kaisha Ltd Detecting method for excess and deficient turn-tightening of cap and device thereof
AU553069B2 (en) * 1981-07-17 1986-07-03 W.R. Grace & Co.-Conn. Radial scan, pulsed light article inspection ccv system 0
JPH0756446B2 (ja) * 1985-02-22 1995-06-14 株式会社日立製作所 棒状突起物体の検査方法
JPS61195458U (de) * 1985-05-29 1986-12-05
JPS6219738A (ja) * 1985-07-19 1987-01-28 Tokan Kogyo Co Ltd 使い捨てコツプのカ−ル部不良検査装置
US4868404A (en) * 1987-04-23 1989-09-19 Hajime Industries, Ltd. Surface inspection apparatus using a mask system to monitor uneven surfaces

Also Published As

Publication number Publication date
CA2003335A1 (en) 1990-05-21
DK585189A (da) 1990-05-22
DE68908351T2 (de) 1993-12-02
AU4539889A (en) 1990-05-24
JPH02183106A (ja) 1990-07-17
US5004347A (en) 1991-04-02
DK585189D0 (da) 1989-11-21
EP0370570B1 (de) 1993-08-11
AU627796B2 (en) 1992-09-03
JP2839594B2 (ja) 1998-12-16
EP0370570A1 (de) 1990-05-30
ES2042981T3 (es) 1993-12-16

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Legal Events

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