DE68904993D1 - Deformationsmessverfahren und vorrichtung, die die kreuzkorrelationsfunktion zwischen speckle-bildern benuetzt. - Google Patents

Deformationsmessverfahren und vorrichtung, die die kreuzkorrelationsfunktion zwischen speckle-bildern benuetzt.

Info

Publication number
DE68904993D1
DE68904993D1 DE8989111389T DE68904993T DE68904993D1 DE 68904993 D1 DE68904993 D1 DE 68904993D1 DE 8989111389 T DE8989111389 T DE 8989111389T DE 68904993 T DE68904993 T DE 68904993T DE 68904993 D1 DE68904993 D1 DE 68904993D1
Authority
DE
Germany
Prior art keywords
deform
cross
measurement method
correlation function
speckle images
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8989111389T
Other languages
English (en)
Other versions
DE68904993T2 (de
Inventor
Tamiki Takemori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP15429888A external-priority patent/JPH0629703B2/ja
Priority claimed from JP17835288A external-priority patent/JPH0629704B2/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE68904993D1 publication Critical patent/DE68904993D1/de
Publication of DE68904993T2 publication Critical patent/DE68904993T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE8989111389T 1988-06-22 1989-06-22 Deformationsmessverfahren und vorrichtung, die die kreuzkorrelationsfunktion zwischen speckle-bildern benuetzt. Expired - Fee Related DE68904993T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP15429888A JPH0629703B2 (ja) 1988-06-22 1988-06-22 変形の測定方法
JP17835288A JPH0629704B2 (ja) 1988-07-18 1988-07-18 変形の測定方法

Publications (2)

Publication Number Publication Date
DE68904993D1 true DE68904993D1 (de) 1993-04-01
DE68904993T2 DE68904993T2 (de) 1993-06-17

Family

ID=26482622

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8989111389T Expired - Fee Related DE68904993T2 (de) 1988-06-22 1989-06-22 Deformationsmessverfahren und vorrichtung, die die kreuzkorrelationsfunktion zwischen speckle-bildern benuetzt.

Country Status (3)

Country Link
US (1) US4967093A (de)
EP (1) EP0347912B1 (de)
DE (1) DE68904993T2 (de)

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FR2670282B1 (fr) * 1990-12-10 1994-04-01 Cachan Labo Meca Techn Ecole Nor Procede de mesure de champ de deplacement.
DE4039972A1 (de) * 1990-12-14 1992-06-17 Man Technologie Gmbh Verfahren und einrichtung zur erfassung der oberflaechendeformation von bauteilen mittels elektronischer speckle-interferometrie
JPH074928A (ja) * 1993-06-15 1995-01-10 Shimadzu Corp 歪測定装置
US6097477A (en) * 1994-05-27 2000-08-01 American Research Corporation Of Virginia Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration
JP2692599B2 (ja) * 1994-07-27 1997-12-17 株式会社島津製作所 レーザー非接触伸び計
WO1997000482A1 (en) * 1995-06-15 1997-01-03 The Regents Of The University Of Michigan Method and apparatus for composition and display of three-dimensional image from two-dimensional ultrasound
JPH10185526A (ja) * 1996-12-27 1998-07-14 Japan Atom Energy Res Inst 非接触歪み計
US6642506B1 (en) 2000-06-01 2003-11-04 Mitutoyo Corporation Speckle-image-based optical position transducer having improved mounting and directional sensitivities
US6873422B2 (en) 2000-12-08 2005-03-29 Mitutoyo Corporation Systems and methods for high-accuracy displacement determination in a correlation based position transducer
DE10110969B4 (de) * 2001-03-07 2004-02-12 Carl v. Ossietzky Universität Oldenburg, vertreten durch den Kanzler Verfahren zur Erfassung von out-of-plane-Oberflächenverformungen
US7065258B2 (en) * 2001-05-21 2006-06-20 Mitutoyo Corporation Systems and methods for reducing accumulated systematic errors in image correlation displacement sensing systems
GB2383411B (en) * 2001-08-06 2005-11-09 Mitutoyo Corp Systems and methods for correlating images in an image correlation system with reduced computational loads
US6996291B2 (en) * 2001-08-06 2006-02-07 Mitutoyo Corporation Systems and methods for correlating images in an image correlation system with reduced computational loads
US6990254B2 (en) 2001-08-06 2006-01-24 Mitutoyo Corporation Systems and methods for correlating images in an image correlation system with reduced computational loads
US7085431B2 (en) 2001-11-13 2006-08-01 Mitutoyo Corporation Systems and methods for reducing position errors in image correlation systems during intra-reference-image displacements
CN1244044C (zh) * 2003-01-20 2006-03-01 张宏志 一种鼠标光学信号处理方法
US6937349B2 (en) * 2003-05-02 2005-08-30 Mitutoyo Corporation Systems and methods for absolute positioning using repeated quasi-random pattern
US7773070B2 (en) * 2004-05-21 2010-08-10 Cypress Semiconductor Corporation Optical positioning device using telecentric imaging
US7295324B2 (en) 2004-07-13 2007-11-13 Mitutoyo Corporation System and method for improving accuracy in a speckle-based image correlation displacement sensor
JP2007170955A (ja) * 2005-12-21 2007-07-05 Nagasaki Univ 変位／ひずみ計測方法及び変位／ひずみ計測装置
US9582883B2 (en) * 2006-06-16 2017-02-28 Lyle G. Shirley Method and apparatus for remote sensing and comparing utilizing radiation speckle
US8073287B1 (en) * 2007-02-26 2011-12-06 George Mason Intellectual Properties, Inc. Recognition by parts using adaptive and robust correlation filters
US20100287083A1 (en) * 2007-12-28 2010-11-11 Mastercard International, Inc. Detecting modifications to financial terminals
US8600147B2 (en) 2009-06-03 2013-12-03 The United States of America as represented by the Secreatary of the Navy System and method for remote measurement of displacement and strain fields
WO2012147495A1 (ja) * 2011-04-28 2012-11-01 三洋電機株式会社 情報取得装置および物体検出装置
WO2013019992A1 (en) 2011-08-02 2013-02-07 The Government Of The United States Of America, As Represented By The Secretary Of The Navy System and method for remote full field three-dimensional displacement and strain measurements
US9311566B2 (en) 2012-08-03 2016-04-12 George Mason Research Foundation, Inc. Method and system for direct strain imaging
DE102014108643B3 (de) 2014-06-19 2015-06-25 Lavision Gmbh Verfahren zur Ermittlung eines räumlichen Verschiebungsvektorfeldes
AT517150B1 (de) * 2015-04-23 2018-02-15 Ait Austrian Inst Tech Gmbh Inspektion mit Polarisationsfiltern
CN107709921B (zh) * 2015-06-04 2021-01-08 乐敏科德公司 自由空间定位仪
CN110307785B (zh) * 2019-07-11 2020-08-21 清华大学 基于记忆效应的光斑位置精准定位的方法、装置及系统
US11391563B2 (en) * 2020-02-06 2022-07-19 Purdue Research Foundation Ultra-sensitive speckle analyzing system

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617625A (en) * 1969-04-28 1971-11-02 Itek Corp Image correlation system
WO1987007365A1 (en) * 1986-05-23 1987-12-03 Vachon Reginald I Apparatus and method for determining stress and strain in pipes, pressure vessels, structural members and other deformable bodies
JPS5952963A (ja) * 1982-09-20 1984-03-27 Toshiba Corp 走査装置
US4539651A (en) * 1983-02-09 1985-09-03 Ludman Jacques E Optical correlator
JPS59212773A (ja) * 1983-05-19 1984-12-01 Toshiba Corp 光学的速度検出装置
US4657393A (en) * 1983-12-29 1987-04-14 Robotic Vision Systems, Inc. Pattern optimization when measuring depth to a surface using lens focusing
US4641972A (en) * 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4636069A (en) * 1984-11-15 1987-01-13 Matrix Instruments Inc. Method for reading deformation images on electrophotographic media
JPS61240105A (ja) * 1985-04-18 1986-10-25 Hitachi Ltd 接合状態検出方法
US4678920A (en) * 1985-06-17 1987-07-07 General Motors Corporation Machine vision method and apparatus
JPH0654220B2 (ja) * 1985-12-25 1994-07-20 三菱重工業株式会社 レ−ザスペツクル歪計測装置
JPH0615968B2 (ja) * 1986-08-11 1994-03-02 伍良 松本 立体形状測定装置

Also Published As

Publication number Publication date
DE68904993T2 (de) 1993-06-17
US4967093A (en) 1990-10-30
EP0347912A3 (en) 1990-07-04
EP0347912B1 (de) 1993-02-24
EP0347912A2 (de) 1989-12-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee