DE60329360D1 - Wheatstonebrücke - Google Patents
WheatstonebrückeInfo
- Publication number
- DE60329360D1 DE60329360D1 DE60329360T DE60329360T DE60329360D1 DE 60329360 D1 DE60329360 D1 DE 60329360D1 DE 60329360 T DE60329360 T DE 60329360T DE 60329360 T DE60329360 T DE 60329360T DE 60329360 D1 DE60329360 D1 DE 60329360D1
- Authority
- DE
- Germany
- Prior art keywords
- wheatstone bridge
- wheatstone
- bridge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/10—AC or DC measuring bridges
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Pressure Sensors (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/277,797 US6765391B2 (en) | 2002-10-22 | 2002-10-22 | Low cost asic architecture for safety critical applications monitoring an applied stimulus |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60329360D1 true DE60329360D1 (de) | 2009-11-05 |
Family
ID=32093358
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60329360T Expired - Lifetime DE60329360D1 (de) | 2002-10-22 | 2003-10-20 | Wheatstonebrücke |
Country Status (4)
Country | Link |
---|---|
US (1) | US6765391B2 (de) |
EP (1) | EP1416286B1 (de) |
JP (1) | JP4514432B2 (de) |
DE (1) | DE60329360D1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7031863B2 (en) * | 2003-12-22 | 2006-04-18 | Texas Instruments Incorporated | Variable condition responsive sense system and method |
JP5156671B2 (ja) * | 2009-02-27 | 2013-03-06 | 株式会社日立製作所 | 磁界検出装置および計測装置 |
DE102009028938A1 (de) * | 2009-08-27 | 2011-03-03 | Endress + Hauser Gmbh + Co. Kg | Feldgerät zur Bestimmung oder Überwachung einer physikalischen oder chemischen Variablen |
JP5669551B2 (ja) * | 2010-12-14 | 2015-02-12 | 大和製衡株式会社 | ロードセルの故障診断装置 |
JP5679837B2 (ja) * | 2011-01-27 | 2015-03-04 | 大和製衡株式会社 | 計量装置 |
JP5679862B2 (ja) * | 2011-02-24 | 2015-03-04 | 大和製衡株式会社 | ホッパ式計量装置 |
US9638744B2 (en) | 2012-07-02 | 2017-05-02 | Nxp Usa, Inc. | Integrated circuit device, safety circuit, safety-critical system and method of manufacturing an integrated circuit device |
EP3598148B1 (de) | 2018-07-16 | 2021-03-17 | Melexis Technologies NV | Halbbrückendifferentialsensor |
EP3647737B1 (de) | 2018-11-05 | 2022-08-03 | Melexis Technologies NV | Sensorschnittstellenschaltung |
DE102018128399A1 (de) * | 2018-11-13 | 2020-05-14 | Thyssenkrupp Ag | Lenksäule für ein Lenksystem eines Kraftfahrzeugs mit einer Steuereinheit für zwei Verstellantriebe |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5255568A (en) * | 1975-10-30 | 1977-05-07 | Nippon Denso Co Ltd | Physical quantity detecting apparatus |
JPH0777266B2 (ja) * | 1988-12-28 | 1995-08-16 | 株式会社豊田中央研究所 | 半導体歪み検出装置 |
DE69316136T2 (de) | 1992-10-07 | 1998-05-14 | Nippon Electric Co | Halbleitermessaufnehmer mit Schaltung zur Feststellung von Fehlern |
DE4417228A1 (de) | 1994-05-17 | 1995-11-23 | Michael Dr Altwein | Dehnungsmeßstreifen-Meßanordnung, Verwendung derselben und Modulationsverstärker für derartige Meßanordnungen |
US5770802A (en) | 1997-04-16 | 1998-06-23 | Texas Instruments Incorporated | Sensor with improved capacitive to voltage converter integrated circuit |
DE19852502A1 (de) * | 1998-11-13 | 2000-05-18 | Philips Corp Intellectual Pty | Verfahren zur Offset-Kalibrierung eines magnetoresistiven Winkelsensors |
JP2001091387A (ja) | 1999-09-27 | 2001-04-06 | Matsushita Electric Works Ltd | 圧力センサ温度補償回路 |
US6433554B1 (en) * | 1999-12-20 | 2002-08-13 | Texas Instruments Incorporated | Method and apparatus for in-range fault detection of condition responsive sensor |
US6549138B2 (en) * | 2000-09-20 | 2003-04-15 | Texas Instruments Incorporated | Method and apparatus for providing detection of excessive negative offset of a sensor |
-
2002
- 2002-10-22 US US10/277,797 patent/US6765391B2/en not_active Expired - Lifetime
-
2003
- 2003-10-20 DE DE60329360T patent/DE60329360D1/de not_active Expired - Lifetime
- 2003-10-20 EP EP03256596A patent/EP1416286B1/de not_active Expired - Lifetime
- 2003-10-21 JP JP2003360315A patent/JP4514432B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP4514432B2 (ja) | 2010-07-28 |
US6765391B2 (en) | 2004-07-20 |
JP2004144751A (ja) | 2004-05-20 |
EP1416286A2 (de) | 2004-05-06 |
EP1416286A3 (de) | 2007-11-14 |
EP1416286B1 (de) | 2009-09-23 |
US20040075447A1 (en) | 2004-04-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |