DE60318168D1 - Bildsensor mit größeren Mikrolinsen in den Randbereichen - Google Patents
Bildsensor mit größeren Mikrolinsen in den RandbereichenInfo
- Publication number
- DE60318168D1 DE60318168D1 DE60318168T DE60318168T DE60318168D1 DE 60318168 D1 DE60318168 D1 DE 60318168D1 DE 60318168 T DE60318168 T DE 60318168T DE 60318168 T DE60318168 T DE 60318168T DE 60318168 D1 DE60318168 D1 DE 60318168D1
- Authority
- DE
- Germany
- Prior art keywords
- pixels
- image sensor
- micro
- lenses
- edge areas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14685—Process for coatings or optical elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US280854 | 2002-10-25 | ||
US10/280,854 US6638786B2 (en) | 2002-10-25 | 2002-10-25 | Image sensor having large micro-lenses at the peripheral regions |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60318168D1 true DE60318168D1 (de) | 2008-01-31 |
DE60318168T2 DE60318168T2 (de) | 2008-12-04 |
Family
ID=23074906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60318168T Expired - Lifetime DE60318168T2 (de) | 2002-10-25 | 2003-10-23 | Bildsensor mit größeren Mikrolinsen in den Randbereichen |
Country Status (6)
Country | Link |
---|---|
US (2) | US6638786B2 (de) |
EP (1) | EP1414072B1 (de) |
CN (2) | CN101399277B (de) |
AT (1) | ATE381783T1 (de) |
DE (1) | DE60318168T2 (de) |
TW (1) | TWI274425B (de) |
Families Citing this family (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7126099B2 (en) * | 2003-08-26 | 2006-10-24 | Taiwan Semiconductor Manufacturing Co., Ltd. | Image sensor with improved uniformity of effective incident light |
US7049168B2 (en) * | 2004-05-28 | 2006-05-23 | Stmicroelectronics Ltd. | Image sensor comprising a pixel array having an optical element positioned relative to each pixel |
US7161129B2 (en) * | 2004-09-10 | 2007-01-09 | Transchip, Inc. | Image capture device, including methods for arranging the optical components thereof |
JP4882224B2 (ja) * | 2004-11-26 | 2012-02-22 | ソニー株式会社 | 固体撮像装置の製造方法 |
KR20060077709A (ko) * | 2004-12-30 | 2006-07-05 | 동부일렉트로닉스 주식회사 | 시모스 이미지 센서 |
KR100693927B1 (ko) * | 2005-02-03 | 2007-03-12 | 삼성전자주식회사 | 마이크로 렌즈 제조방법, 마이크로 렌즈 어레이 제조방법및 이미지 센서 제조방법 |
US7704778B2 (en) * | 2005-02-23 | 2010-04-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Microlens structure for image sensors |
JP4512504B2 (ja) * | 2005-02-24 | 2010-07-28 | 富士フイルム株式会社 | マイクロレンズ搭載型単板式カラー固体撮像素子及び画像入力装置 |
US20060198008A1 (en) * | 2005-03-07 | 2006-09-07 | Micron Technology, Inc. | Formation of micro lens by using flowable oxide deposition |
US7470556B2 (en) * | 2005-06-28 | 2008-12-30 | Aptina Imaging Corporation | Process for creating tilted microlens |
KR100790225B1 (ko) * | 2005-12-26 | 2008-01-02 | 매그나칩 반도체 유한회사 | 이미지 센서 및 그 제조 방법 |
US7755154B2 (en) * | 2006-08-01 | 2010-07-13 | Dongbu Hitek Co., Ltd. | Image sensor |
KR100802303B1 (ko) * | 2006-12-27 | 2008-02-11 | 동부일렉트로닉스 주식회사 | 이미지 센서 제조방법 |
KR100905597B1 (ko) * | 2007-11-19 | 2009-07-02 | 주식회사 동부하이텍 | 이미지센서 및 그 제조방법 |
US7897986B2 (en) * | 2008-04-17 | 2011-03-01 | Visera Technologies Company Limited | Microlens array and image sensing device using the same |
JP2010048850A (ja) * | 2008-08-19 | 2010-03-04 | Seiko Epson Corp | レンズアレイ及びラインヘッド |
US7902618B2 (en) * | 2008-11-17 | 2011-03-08 | Omni Vision Technologies, Inc. | Backside illuminated imaging sensor with improved angular response |
US8227884B2 (en) | 2009-11-04 | 2012-07-24 | Omnivision Technologies, Inc. | Photodetector array having array of discrete electron repulsive elements |
US20110101201A1 (en) * | 2009-11-04 | 2011-05-05 | Vincent Venezia | Photodetector Array Having Electron Lens |
US8602308B2 (en) * | 2011-12-22 | 2013-12-10 | Symbol Technologies, Inc. | Imaging device having light field sensor |
JP6141024B2 (ja) * | 2012-02-10 | 2017-06-07 | キヤノン株式会社 | 撮像装置および撮像システム |
US9398272B2 (en) * | 2012-11-07 | 2016-07-19 | Google Inc. | Low-profile lens array camera |
US9247121B2 (en) * | 2013-04-25 | 2016-01-26 | Ability Enterprise Co., Ltd. | Image sensor, electric device using the same and focusing method of the electric device |
US20150064629A1 (en) * | 2013-08-27 | 2015-03-05 | Visera Technologies Company Limited | Manufacturing method for microlenses |
US9467633B2 (en) | 2015-02-27 | 2016-10-11 | Semiconductor Components Industries, Llc | High dynamic range imaging systems having differential photodiode exposures |
CN104810379B (zh) * | 2015-05-05 | 2019-01-08 | 苏州晶方半导体科技股份有限公司 | 影像传感器 |
CN106488148B (zh) * | 2016-11-01 | 2019-09-17 | 首都师范大学 | 一种超分辨率图像传感器及其构造方法 |
CN107105141B (zh) | 2017-04-28 | 2019-06-28 | Oppo广东移动通信有限公司 | 图像传感器、图像处理方法、成像装置和移动终端 |
CN107040724B (zh) | 2017-04-28 | 2020-05-15 | Oppo广东移动通信有限公司 | 双核对焦图像传感器及其对焦控制方法和成像装置 |
CN107135340A (zh) | 2017-04-28 | 2017-09-05 | 广东欧珀移动通信有限公司 | 图像传感器、对焦控制方法、成像装置和移动终端 |
KR102537320B1 (ko) | 2018-02-19 | 2023-05-30 | 에스케이하이닉스 주식회사 | 서로 다른 주기로 배열된 마이크로 렌즈들을 갖는 이미지 센서 |
KR102662032B1 (ko) | 2019-06-19 | 2024-05-03 | 삼성전자주식회사 | 이미지 센서 및 이미지 센서를 포함하는 전자 장치 |
CN110244426B (zh) * | 2019-07-01 | 2024-10-29 | 达科为(深圳)医疗设备有限公司 | 一种物镜组件和阵列物镜光学系统的固定支架 |
KR20210056754A (ko) | 2019-11-11 | 2021-05-20 | 에스케이하이닉스 주식회사 | 이미지 센서 |
CN111641762B (zh) * | 2020-05-28 | 2021-11-02 | 维沃移动通信有限公司 | 摄像模组及电子设备 |
CN112600994B (zh) * | 2020-12-02 | 2023-04-07 | 达闼机器人股份有限公司 | 物体探测装置、方法、存储介质和电子设备 |
CN113096041B (zh) * | 2021-04-08 | 2023-03-24 | 杭州海康消防科技有限公司 | 图像校正方法及装置 |
CN113869118A (zh) * | 2021-08-25 | 2021-12-31 | 北京极豪科技有限公司 | 光学传感器、指纹识别模组以及电子设备 |
CN117826286B (zh) * | 2024-03-05 | 2024-05-28 | 苏州苏纳光电有限公司 | 阵列式级联微透镜组的制备方法、阵列化曝光装置及应用 |
Family Cites Families (26)
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JP2566087B2 (ja) * | 1992-01-27 | 1996-12-25 | 株式会社東芝 | 有色マイクロレンズアレイ及びその製造方法 |
JPH0637289A (ja) * | 1992-07-16 | 1994-02-10 | Nec Corp | 固体撮像素子 |
JP2742185B2 (ja) * | 1992-10-01 | 1998-04-22 | 松下電子工業株式会社 | 固体撮像装置 |
JP2601148B2 (ja) * | 1993-07-23 | 1997-04-16 | 日本電気株式会社 | 固体撮像装置 |
JPH09146259A (ja) * | 1995-08-29 | 1997-06-06 | Ricoh Opt Ind Co Ltd | グラデーションマスクとその製造方法およびグラデーションマスクを用いた特殊表面形状の創成方法 |
US5948281A (en) * | 1996-08-30 | 1999-09-07 | Sony Corporation | Microlens array and method of forming same and solid-state image pickup device and method of manufacturing same |
JPH10189929A (ja) * | 1996-12-20 | 1998-07-21 | Sony Corp | 固体撮像素子 |
US6187485B1 (en) * | 1997-06-26 | 2001-02-13 | Dai Nippon Printing Co., Ltd. | Method of forming concave-convex pattern and use of the method in the production of color filters for liquid crystal displays |
JP3462736B2 (ja) * | 1997-11-17 | 2003-11-05 | ペンタックス株式会社 | 固体撮像素子 |
US6271900B1 (en) * | 1998-03-31 | 2001-08-07 | Intel Corporation | Integrated microlens and color filter structure |
US6083429A (en) * | 1998-03-31 | 2000-07-04 | Intel Corporation | Microlens formation through focal plane control of a aerial image |
TW370727B (en) | 1998-06-04 | 1999-09-21 | United Microelectronics Corp | Method for removing color filter films of CMOS sensor |
US6297071B1 (en) | 1998-07-22 | 2001-10-02 | Eastman Kodak Company | Method of making planar image sensor color filter arrays |
US6577342B1 (en) * | 1998-09-25 | 2003-06-10 | Intel Corporation | Image sensor with microlens material structure |
US6137634A (en) * | 1999-02-01 | 2000-10-24 | Intel Corporation | Microlens array |
US6171883B1 (en) * | 1999-02-18 | 2001-01-09 | Taiwan Semiconductor Manufacturing Company | Image array optoelectronic microelectronic fabrication with enhanced optical stability and method for fabrication thereof |
JP3524424B2 (ja) * | 1999-04-01 | 2004-05-10 | キヤノン株式会社 | マイクロ構造体アレイ用金型又は金型マスター、及びその作製方法 |
US6362513B2 (en) | 1999-07-08 | 2002-03-26 | Intel Corporation | Conformal color filter layer above microlens structures in an image sensor die |
US6307243B1 (en) * | 1999-07-19 | 2001-10-23 | Micron Technology, Inc. | Microlens array with improved fill factor |
US6171885B1 (en) | 1999-10-12 | 2001-01-09 | Taiwan Semiconductor Manufacturing Company | High efficiency color filter process for semiconductor array imaging devices |
EP1107316A3 (de) * | 1999-12-02 | 2004-05-19 | Nikon Corporation | Festkörperbildsensor, dessen Herstellungsverfahren und digitale Kamera |
TW444132B (en) * | 2000-02-24 | 2001-07-01 | United Microelectronics Corp | Method for predicting the radius of curvature of microlens |
US6436851B1 (en) | 2001-01-05 | 2002-08-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method for spin coating a high viscosity liquid on a wafer |
WO2002077672A2 (en) * | 2001-02-07 | 2002-10-03 | Corning Incorporated | High-contrast screen with random microlens array |
US20020140832A1 (en) * | 2001-03-29 | 2002-10-03 | Eastman Kodak Company | Optimization of CCD microlens size for color balancing |
JP4570007B2 (ja) * | 2001-09-26 | 2010-10-27 | 大日本印刷株式会社 | 微小な集光レンズの形成方法 |
-
2002
- 2002-10-25 US US10/280,854 patent/US6638786B2/en not_active Expired - Lifetime
-
2003
- 2003-08-07 US US10/637,177 patent/US20040082093A1/en not_active Abandoned
- 2003-10-09 TW TW092128203A patent/TWI274425B/zh not_active IP Right Cessation
- 2003-10-23 CN CN2008100823484A patent/CN101399277B/zh not_active Expired - Lifetime
- 2003-10-23 DE DE60318168T patent/DE60318168T2/de not_active Expired - Lifetime
- 2003-10-23 AT AT03256685T patent/ATE381783T1/de not_active IP Right Cessation
- 2003-10-23 EP EP03256685A patent/EP1414072B1/de not_active Expired - Lifetime
- 2003-10-23 CN CNB2003101025690A patent/CN100383978C/zh not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20030042490A1 (en) | 2003-03-06 |
US20040082093A1 (en) | 2004-04-29 |
EP1414072B1 (de) | 2007-12-19 |
EP1414072A3 (de) | 2005-08-03 |
TW200514269A (en) | 2005-04-16 |
DE60318168T2 (de) | 2008-12-04 |
CN101399277A (zh) | 2009-04-01 |
CN101399277B (zh) | 2011-02-23 |
ATE381783T1 (de) | 2008-01-15 |
EP1414072A2 (de) | 2004-04-28 |
US6638786B2 (en) | 2003-10-28 |
CN100383978C (zh) | 2008-04-23 |
TWI274425B (en) | 2007-02-21 |
CN1501507A (zh) | 2004-06-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |