DE60313660D1 - Synthetisch antiferromagnetische struktur für ein magnetoelektronisches gerät - Google Patents
Synthetisch antiferromagnetische struktur für ein magnetoelektronisches gerätInfo
- Publication number
- DE60313660D1 DE60313660D1 DE60313660T DE60313660T DE60313660D1 DE 60313660 D1 DE60313660 D1 DE 60313660D1 DE 60313660 T DE60313660 T DE 60313660T DE 60313660 T DE60313660 T DE 60313660T DE 60313660 D1 DE60313660 D1 DE 60313660D1
- Authority
- DE
- Germany
- Prior art keywords
- saf
- antiferromagnetic coupling
- layer
- coupling layer
- antiferromagnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
- H01F10/3272—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn by use of anti-parallel coupled [APC] ferromagnetic layers, e.g. artificial ferrimagnets [AFI], artificial [AAF] or synthetic [SAF] anti-ferromagnets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/30—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE]
- H01F41/302—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US322979 | 2002-12-18 | ||
US10/322,979 US6898112B2 (en) | 2002-12-18 | 2002-12-18 | Synthetic antiferromagnetic structure for magnetoelectronic devices |
PCT/US2003/034213 WO2004061467A1 (en) | 2002-12-18 | 2003-10-28 | Synthetic antiferromagnetic structure for magnetoelectronic devices |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60313660D1 true DE60313660D1 (de) | 2007-06-14 |
DE60313660T2 DE60313660T2 (de) | 2007-09-06 |
Family
ID=32593080
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60313660T Expired - Fee Related DE60313660T2 (de) | 2002-12-18 | 2003-10-28 | Synthetisch antiferromagnetische struktur für ein magnetoelektronisches gerät |
Country Status (10)
Country | Link |
---|---|
US (2) | US6898112B2 (de) |
EP (1) | EP1579231B1 (de) |
JP (1) | JP2006511957A (de) |
KR (1) | KR20050085721A (de) |
CN (1) | CN100507591C (de) |
AT (1) | ATE361475T1 (de) |
AU (1) | AU2003285059A1 (de) |
DE (1) | DE60313660T2 (de) |
TW (1) | TWI315907B (de) |
WO (1) | WO2004061467A1 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005142299A (ja) * | 2003-11-05 | 2005-06-02 | Sony Corp | 磁気メモリ |
US6937497B1 (en) * | 2004-11-18 | 2005-08-30 | Maglabs, Inc. | Magnetic random access memory with stacked toggle memory cells |
US6992910B1 (en) * | 2004-11-18 | 2006-01-31 | Maglabs, Inc. | Magnetic random access memory with three or more stacked toggle memory cells and method for writing a selected cell |
US7129098B2 (en) * | 2004-11-24 | 2006-10-31 | Freescale Semiconductor, Inc. | Reduced power magnetoresistive random access memory elements |
US7301801B2 (en) * | 2005-10-28 | 2007-11-27 | International Business Machines Corporation | Tuned pinned layers for magnetic tunnel junctions with multicomponent free layers |
US7368301B2 (en) * | 2006-01-27 | 2008-05-06 | Magic Technologies, Inc. | Magnetic random access memory with selective toggle memory cells |
US7280389B2 (en) * | 2006-02-08 | 2007-10-09 | Magic Technologies, Inc. | Synthetic anti-ferromagnetic structure with non-magnetic spacer for MRAM applications |
US7432150B2 (en) * | 2006-02-10 | 2008-10-07 | Everspin Technologies, Inc. | Method of manufacturing a magnetoelectronic device |
TWI307507B (en) * | 2006-10-20 | 2009-03-11 | Ind Tech Res Inst | Magnetic tunnel junction devices and magnetic random access memory |
US7820455B2 (en) * | 2008-03-31 | 2010-10-26 | Hitachi Global Storage Technologies Netherlands B.V. | Method for manufacturing a tunnel junction magnetoresistive sensor with improved performance and having a CoFeB free layer |
GB2465370A (en) * | 2008-11-13 | 2010-05-19 | Ingenia Holdings | Magnetic data storage comprising a synthetic anti-ferromagnetic stack arranged to maintain solitons |
US8257596B2 (en) * | 2009-04-30 | 2012-09-04 | Everspin Technologies, Inc. | Two-axis magnetic field sensor with substantially orthogonal pinning directions |
US7965543B2 (en) * | 2009-04-30 | 2011-06-21 | Everspin Technologies, Inc. | Method for reducing current density in a magnetoelectronic device |
US8580580B2 (en) | 2010-04-01 | 2013-11-12 | Seagate Technology Llc | Magnetic element with varying areal extents |
GB201015497D0 (en) | 2010-09-16 | 2010-10-27 | Cambridge Entpr Ltd | Magnetic data storage |
GB201020727D0 (en) | 2010-12-07 | 2011-01-19 | Cambridge Entpr Ltd | Magnetic structure |
US20120267733A1 (en) | 2011-04-25 | 2012-10-25 | International Business Machines Corporation | Magnetic stacks with perpendicular magnetic anisotropy for spin momentum transfer magnetoresistive random access memory |
TWI450284B (zh) * | 2011-10-19 | 2014-08-21 | Nat Univ Chung Cheng | 具有垂直異向性之合成反鐵磁結構及其製法 |
US8611053B2 (en) * | 2012-03-08 | 2013-12-17 | HGST Netherlands B.V. | Current-perpendicular-to-the-plane (CPP) magnetoresistive sensor with multilayer reference layer including a Heusler alloy |
US9324939B2 (en) | 2014-07-01 | 2016-04-26 | Qualcomm Incorporated | Synthetic antiferromagnet (SAF) coupled free layer for perpendicular magnetic tunnel junction (p-MTJ) |
US10158065B2 (en) | 2014-07-07 | 2018-12-18 | Intel Corporation | Spin-transfer torque memory (STTM) devices having magnetic contacts |
CN104833928B (zh) * | 2015-04-30 | 2017-09-29 | 国网四川省电力公司电力科学研究院 | 一种大型电力变压器剩磁检测方法 |
CN105093140B (zh) * | 2015-08-19 | 2018-03-20 | 国网四川省电力公司阿坝供电公司 | 一种变压器剩磁检测及消磁的方法及其装置 |
US9659586B1 (en) | 2015-11-12 | 2017-05-23 | Seagate Technology Llc | Reader with free layer experiencing opposite phase-shifted media torques |
US9837602B2 (en) * | 2015-12-16 | 2017-12-05 | Western Digital Technologies, Inc. | Spin-orbit torque bit design for improved switching efficiency |
US10032978B1 (en) * | 2017-06-27 | 2018-07-24 | Spin Transfer Technologies, Inc. | MRAM with reduced stray magnetic fields |
CN108894794B (zh) * | 2018-07-20 | 2024-02-27 | 陈成军 | 掘进流水线及其掘进作业方法 |
CN111725386B (zh) * | 2019-09-23 | 2022-06-10 | 中国科学院上海微系统与信息技术研究所 | 一种磁性存储器件及其制作方法、存储器和神经网络系统 |
CN112635651A (zh) * | 2019-10-08 | 2021-04-09 | 上海磁宇信息科技有限公司 | 磁性隧道结结构及磁性随机存储器 |
US11258005B2 (en) * | 2019-10-17 | 2022-02-22 | United Microelectronics Corp. | Magnetoresistive random access memory device and method for fabricating the same |
US11500042B2 (en) | 2020-02-28 | 2022-11-15 | Brown University | Magnetic sensing devices based on interlayer exchange-coupled magnetic thin films |
US11393495B2 (en) | 2020-03-26 | 2022-07-19 | Seagate Technology Llc | Reader with a multi-layer synthetic ferrimagnet free layer |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5930164A (en) * | 1998-02-26 | 1999-07-27 | Motorola, Inc. | Magnetic memory unit having four states and operating method thereof |
US6738236B1 (en) | 1998-05-07 | 2004-05-18 | Seagate Technology Llc | Spin valve/GMR sensor using synthetic antiferromagnetic layer pinned by Mn-alloy having a high blocking temperature |
US6191926B1 (en) * | 1998-05-07 | 2001-02-20 | Seagate Technology Llc | Spin valve magnetoresistive sensor using permanent magnet biased artificial antiferromagnet layer |
US6469878B1 (en) | 1999-02-11 | 2002-10-22 | Seagate Technology Llc | Data head and method using a single antiferromagnetic material to pin multiple magnetic layers with differing orientation |
JP2003520378A (ja) * | 1999-04-28 | 2003-07-02 | シーゲイト テクノロジー エルエルシー | ピンニング層を有する巨大磁気抵抗効果センサー |
US6292389B1 (en) * | 1999-07-19 | 2001-09-18 | Motorola, Inc. | Magnetic element with improved field response and fabricating method thereof |
US6233172B1 (en) * | 1999-12-17 | 2001-05-15 | Motorola, Inc. | Magnetic element with dual magnetic states and fabrication method thereof |
US6911710B2 (en) * | 2000-03-09 | 2005-06-28 | Hewlett-Packard Development Company, L.P. | Multi-bit magnetic memory cells |
US6469926B1 (en) * | 2000-03-22 | 2002-10-22 | Motorola, Inc. | Magnetic element with an improved magnetoresistance ratio and fabricating method thereof |
KR20030011361A (ko) * | 2000-06-22 | 2003-02-07 | 마쯔시다덴기산교 가부시키가이샤 | 자기 저항 효과 소자와 이것을 이용한 자기 저항 효과형헤드 및 자기 기록 재생 장치 |
US7050963B2 (en) | 2000-09-12 | 2006-05-23 | Progress Software Corporation | Method and apparatus for flash load balancing |
JP3872962B2 (ja) * | 2001-03-22 | 2007-01-24 | 株式会社東芝 | 磁気抵抗効果素子及び磁気記憶装置 |
JP2002353417A (ja) * | 2001-05-30 | 2002-12-06 | Sony Corp | 磁気抵抗効果素子および磁気メモリ装置 |
US6545906B1 (en) * | 2001-10-16 | 2003-04-08 | Motorola, Inc. | Method of writing to scalable magnetoresistance random access memory element |
US6633498B1 (en) * | 2002-06-18 | 2003-10-14 | Motorola, Inc. | Magnetoresistive random access memory with reduced switching field |
US7083988B2 (en) * | 2004-01-26 | 2006-08-01 | Micron Technology, Inc. | Magnetic annealing sequences for patterned MRAM synthetic antiferromagnetic pinned layers |
US6992910B1 (en) * | 2004-11-18 | 2006-01-31 | Maglabs, Inc. | Magnetic random access memory with three or more stacked toggle memory cells and method for writing a selected cell |
US6937497B1 (en) * | 2004-11-18 | 2005-08-30 | Maglabs, Inc. | Magnetic random access memory with stacked toggle memory cells |
-
2002
- 2002-12-18 US US10/322,979 patent/US6898112B2/en not_active Expired - Fee Related
-
2003
- 2003-10-28 JP JP2004564826A patent/JP2006511957A/ja active Pending
- 2003-10-28 WO PCT/US2003/034213 patent/WO2004061467A1/en active IP Right Grant
- 2003-10-28 KR KR1020057011209A patent/KR20050085721A/ko not_active Application Discontinuation
- 2003-10-28 EP EP03779374A patent/EP1579231B1/de not_active Expired - Lifetime
- 2003-10-28 AT AT03779374T patent/ATE361475T1/de not_active IP Right Cessation
- 2003-10-28 CN CNB2003801064617A patent/CN100507591C/zh not_active Expired - Fee Related
- 2003-10-28 AU AU2003285059A patent/AU2003285059A1/en not_active Abandoned
- 2003-10-28 DE DE60313660T patent/DE60313660T2/de not_active Expired - Fee Related
- 2003-11-12 TW TW092131682A patent/TWI315907B/zh not_active IP Right Cessation
-
2005
- 2005-03-09 US US11/075,587 patent/US7235408B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
AU2003285059A1 (en) | 2004-07-29 |
TW200419773A (en) | 2004-10-01 |
WO2004061467A1 (en) | 2004-07-22 |
ATE361475T1 (de) | 2007-05-15 |
EP1579231B1 (de) | 2007-05-02 |
EP1579231A1 (de) | 2005-09-28 |
JP2006511957A (ja) | 2006-04-06 |
US7235408B2 (en) | 2007-06-26 |
US20050153063A1 (en) | 2005-07-14 |
TWI315907B (en) | 2009-10-11 |
US20040120184A1 (en) | 2004-06-24 |
KR20050085721A (ko) | 2005-08-29 |
US6898112B2 (en) | 2005-05-24 |
CN100507591C (zh) | 2009-07-01 |
DE60313660T2 (de) | 2007-09-06 |
CN1726400A (zh) | 2006-01-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |