DE60232651D1 - Verdichtung der einsatzspannungs-verteilung von nichtflüchtigen speichern - Google Patents

Verdichtung der einsatzspannungs-verteilung von nichtflüchtigen speichern

Info

Publication number
DE60232651D1
DE60232651D1 DE60232651T DE60232651T DE60232651D1 DE 60232651 D1 DE60232651 D1 DE 60232651D1 DE 60232651 T DE60232651 T DE 60232651T DE 60232651 T DE60232651 T DE 60232651T DE 60232651 D1 DE60232651 D1 DE 60232651D1
Authority
DE
Germany
Prior art keywords
compaction
volatile storage
voltage distribution
application voltage
application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60232651T
Other languages
English (en)
Inventor
Richard M Fastow
Xin Guo
Sameer Haddad
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Spansion LLC
Original Assignee
Spansion LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spansion LLC filed Critical Spansion LLC
Application granted granted Critical
Publication of DE60232651D1 publication Critical patent/DE60232651D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
    • G11C16/3409—Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
DE60232651T 2001-05-09 2002-02-19 Verdichtung der einsatzspannungs-verteilung von nichtflüchtigen speichern Expired - Lifetime DE60232651D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/851,773 US6438037B1 (en) 2001-05-09 2001-05-09 Threshold voltage compacting for non-volatile semiconductor memory designs
PCT/US2002/004784 WO2002091387A1 (en) 2001-05-09 2002-02-19 Threshold voltage compacting for non-volatile semiconductor memory designs

Publications (1)

Publication Number Publication Date
DE60232651D1 true DE60232651D1 (de) 2009-07-30

Family

ID=25311644

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60232651T Expired - Lifetime DE60232651D1 (de) 2001-05-09 2002-02-19 Verdichtung der einsatzspannungs-verteilung von nichtflüchtigen speichern

Country Status (5)

Country Link
US (1) US6438037B1 (de)
EP (1) EP1386323B1 (de)
DE (1) DE60232651D1 (de)
TW (1) TW556196B (de)
WO (1) WO2002091387A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI259952B (en) * 2002-01-31 2006-08-11 Macronix Int Co Ltd Data erase method of flash memory
US6661711B2 (en) * 2002-02-06 2003-12-09 Sandisk Corporation Implementation of an inhibit during soft programming to tighten an erase voltage distribution
US7009889B2 (en) 2004-05-28 2006-03-07 Sandisk Corporation Comprehensive erase verification for non-volatile memory
US7230851B2 (en) * 2004-12-23 2007-06-12 Sandisk Corporation Reducing floating gate to floating gate coupling effect
CN1838323A (zh) * 2005-01-19 2006-09-27 赛芬半导体有限公司 可预防固定模式编程的方法
US7345918B2 (en) 2005-08-31 2008-03-18 Micron Technology, Inc. Selective threshold voltage verification and compaction
US7483311B2 (en) * 2006-02-07 2009-01-27 Micron Technology, Inc. Erase operation in a flash memory device
DE602006009662D1 (de) * 2006-08-24 2009-11-19 St Microelectronics Srl Verfahren zur Einengung der Schwellspannungsverteilung gelöschter Flash-Speicherzellen während Schreiboperationen
KR100841980B1 (ko) * 2006-12-19 2008-06-27 삼성전자주식회사 소거된 셀의 산포를 개선할 수 있는 플래시 메모리 장치의소거 방법
US7616495B2 (en) * 2007-02-20 2009-11-10 Sandisk Corporation Non-volatile storage apparatus with variable initial program voltage magnitude
US7986553B2 (en) * 2007-06-15 2011-07-26 Micron Technology, Inc. Programming of a solid state memory utilizing analog communication of bit patterns
US7830718B2 (en) * 2007-11-21 2010-11-09 Micron Technology, Inc. Mitigation of data corruption from back pattern and program disturb in a non-volatile memory device
US7852680B2 (en) * 2008-01-22 2010-12-14 Macronix International Co., Ltd. Operating method of multi-level memory cell
US8482978B1 (en) * 2008-09-14 2013-07-09 Apple Inc. Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
JP5316299B2 (ja) * 2009-08-07 2013-10-16 富士通セミコンダクター株式会社 半導体メモリ、システムおよび半導体メモリの動作方法
US8385123B2 (en) 2010-08-18 2013-02-26 Micron Technology, Inc. Programming to mitigate memory cell performance differences
US9542518B2 (en) * 2014-11-17 2017-01-10 Qualcomm Incorporated User experience based management technique for mobile system-on-chips
US10109356B2 (en) * 2015-02-25 2018-10-23 Nxp Usa, Inc. Method and apparatus for stressing a non-volatile memory
US9711211B2 (en) 2015-10-29 2017-07-18 Sandisk Technologies Llc Dynamic threshold voltage compaction for non-volatile memory
US20210104280A1 (en) * 2019-10-04 2021-04-08 Sandisk Technologies Llc Method of reducing neighboring word-line interference
US11183255B1 (en) 2020-07-09 2021-11-23 Stmicroelectronics S.R.L. Methods and devices for erasing non-volatile memory

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5132935A (en) * 1990-04-16 1992-07-21 Ashmore Jr Benjamin H Erasure of eeprom memory arrays to prevent over-erased cells
US5467306A (en) * 1993-10-04 1995-11-14 Texas Instruments Incorporated Method of using source bias to increase threshold voltages and/or to correct for over-erasure of flash eproms
US5576992A (en) * 1995-08-30 1996-11-19 Texas Instruments Incorporated Extended-life method for soft-programming floating-gate memory cells
US5608672A (en) * 1995-09-26 1997-03-04 Advanced Micro Devices, Inc. Correction method leading to a uniform threshold voltage distribution for a flash eprom
US5748538A (en) * 1996-06-17 1998-05-05 Aplus Integrated Circuits, Inc. OR-plane memory cell array for flash memory with bit-based write capability, and methods for programming and erasing the memory cell array
JP3569185B2 (ja) * 1999-12-24 2004-09-22 Ｎｅｃエレクトロニクス株式会社 不揮発性半導体記憶装置
US6252803B1 (en) * 2000-10-23 2001-06-26 Advanced Micro Devices, Inc. Automatic program disturb with intelligent soft programming for flash cells

Also Published As

Publication number Publication date
WO2002091387A1 (en) 2002-11-14
TW556196B (en) 2003-10-01
EP1386323B1 (de) 2009-06-17
EP1386323A1 (de) 2004-02-04
US6438037B1 (en) 2002-08-20

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