DE60204597D1 - Kompakter automatischer tester (ate) mit zeitstempel-system - Google Patents

Kompakter automatischer tester (ate) mit zeitstempel-system

Info

Publication number
DE60204597D1
DE60204597D1 DE60204597T DE60204597T DE60204597D1 DE 60204597 D1 DE60204597 D1 DE 60204597D1 DE 60204597 T DE60204597 T DE 60204597T DE 60204597 T DE60204597 T DE 60204597T DE 60204597 D1 DE60204597 D1 DE 60204597D1
Authority
DE
Germany
Prior art keywords
ate
automatic tester
stamp system
compact automatic
timing stamp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60204597T
Other languages
English (en)
Other versions
DE60204597T2 (de
Inventor
A Sartschev
Jun Xu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE60204597D1 publication Critical patent/DE60204597D1/de
Publication of DE60204597T2 publication Critical patent/DE60204597T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Tests Of Electronic Circuits (AREA)
DE60204597T 2001-12-12 2002-12-11 Kompakter automatischer tester (ate) mit zeitstempel-system Expired - Lifetime DE60204597T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15865 2001-12-12
US10/015,865 US6868047B2 (en) 2001-12-12 2001-12-12 Compact ATE with time stamp system
PCT/US2002/039658 WO2003054565A1 (en) 2001-12-12 2002-12-11 Compact ate with timestamp system

Publications (2)

Publication Number Publication Date
DE60204597D1 true DE60204597D1 (de) 2005-07-14
DE60204597T2 DE60204597T2 (de) 2006-03-16

Family

ID=21774069

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60204597T Expired - Lifetime DE60204597T2 (de) 2001-12-12 2002-12-11 Kompakter automatischer tester (ate) mit zeitstempel-system

Country Status (6)

Country Link
US (1) US6868047B2 (de)
EP (1) EP1459081B1 (de)
CN (1) CN100422757C (de)
AU (1) AU2002353115A1 (de)
DE (1) DE60204597T2 (de)
WO (1) WO2003054565A1 (de)

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KR101473769B1 (ko) * 2013-09-23 2014-12-17 두산중공업 주식회사 응답시간 측정 장치, 응답시간 측정 시스템 및 응답시간 측정 방법
US7961559B2 (en) * 2003-11-13 2011-06-14 International Business Machines Corporation Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycle
US20060047449A1 (en) * 2004-08-27 2006-03-02 Broadcom Corporation Graphical test development tool for use with automated test equipment
DE102005024648B4 (de) * 2005-05-25 2020-08-06 Infineon Technologies Ag Elektrische Schaltung zum Messen von Zeiten und Verfahren zum Messen von Zeiten
US7573957B2 (en) * 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for recovering a clock in a digital signal
US7574632B2 (en) * 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for time stamping a digital signal
US7856578B2 (en) * 2005-09-23 2010-12-21 Teradyne, Inc. Strobe technique for test of digital signal timing
US7560947B2 (en) 2005-09-28 2009-07-14 Teradyne, Inc. Pin electronics driver
US8327204B2 (en) * 2005-10-27 2012-12-04 Dft Microsystems, Inc. High-speed transceiver tester incorporating jitter injection
US7629915B2 (en) 2006-05-26 2009-12-08 Realtek Semiconductor Corp. High resolution time-to-digital converter and method thereof
US7681091B2 (en) * 2006-07-14 2010-03-16 Dft Microsystems, Inc. Signal integrity measurement systems and methods using a predominantly digital time-base generator
US7813297B2 (en) * 2006-07-14 2010-10-12 Dft Microsystems, Inc. High-speed signal testing system having oscilloscope functionality
CA2562200A1 (en) * 2006-09-18 2008-03-18 Abdel-Fattah S. Yousif Time-to-digital converter
US7613915B2 (en) 2006-11-09 2009-11-03 BroadOn Communications Corp Method for programming on-chip non-volatile memory in a secure processor, and a device so programmed
JP2010518760A (ja) * 2007-02-09 2010-05-27 ディー・エフ・ティー・マイクロシステムズ・インコーポレーテッド ハイスピード・シリアル・リンクのミッション環境における、該ハイスピード・シリアル・リンクの物理層テスティングのためのシステム及び方法
US7786718B2 (en) * 2007-12-31 2010-08-31 Teradyne, Inc. Time measurement of periodic signals
US7917319B2 (en) * 2008-02-06 2011-03-29 Dft Microsystems Inc. Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits
US8228763B2 (en) * 2008-04-11 2012-07-24 Infineon Technologies Ag Method and device for measuring time intervals
CN102067456B (zh) * 2008-06-20 2015-03-11 爱德万测试(新加坡)私人有限公司 用于估计与时间差有关的数据的装置和方法和用于校准延迟线的装置和方法
US8050148B2 (en) * 2008-07-03 2011-11-01 Texas Instruments Incorporated Flash time stamp apparatus
US8134396B2 (en) * 2009-02-24 2012-03-13 Infineon Technologies Ag Dynamic element matching for delay lines
US8098085B2 (en) * 2009-03-30 2012-01-17 Qualcomm Incorporated Time-to-digital converter (TDC) with improved resolution
TWI347085B (en) * 2009-10-09 2011-08-11 Ind Tech Res Inst Pipeline time-to-digital converter
US8571068B2 (en) * 2010-01-05 2013-10-29 Futurewei Technologies, Inc. Network timing distribution and synchronization using virtual network delays
TWI513189B (zh) * 2010-01-14 2015-12-11 Univ Nat Sun Yat Sen 耐二倍供應電壓邏輯電路及具有ｐｖｔ補償之耐二倍供應電壓輸出入緩衝器
US8228219B2 (en) * 2010-06-15 2012-07-24 Infineon Technologies Ag Time-to-digital converter with calibration
US8957712B2 (en) 2013-03-15 2015-02-17 Qualcomm Incorporated Mixed signal TDC with embedded T2V ADC
KR101565098B1 (ko) 2014-04-30 2015-11-02 한국항공우주연구원 신호 입력시간 측정 장치
US9768809B2 (en) * 2014-06-30 2017-09-19 Intel IP Corporation Digital-to-time converter spur reduction
CN105652173B (zh) * 2014-11-10 2018-08-21 致茂电子(苏州)有限公司 校正板及其时序校正方法
CN104484885B (zh) * 2014-12-25 2017-09-19 上海华岭集成电路技术股份有限公司 Cis芯片yuv格式输出的ate测试方法
CN104716955B (zh) * 2015-03-25 2018-10-02 华为技术有限公司 一种锁相环中的时间数字转换器
CN106559160A (zh) * 2015-09-30 2017-04-05 阿尔卡特朗讯 具有传播延迟校准功能的时钟接口
CN110716120B (zh) * 2018-07-12 2021-07-23 澜起科技股份有限公司 芯片自动测试设备的通道延时偏差的校准方法
CN112363906B (zh) * 2020-01-04 2023-04-28 成都华微电子科技股份有限公司 一种测试数据处理装置和方法
CN111416619B (zh) * 2020-03-26 2023-02-03 中国科学院微电子研究所 一种延时测量电路、延时测量方法、电子设备及芯片

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4104590A (en) * 1976-11-30 1978-08-01 Sergei Vasilievich Zhevnerov Digital device for measuring instantaneous parameter values of slowly varying processes
US4164648A (en) * 1978-06-23 1979-08-14 Hewlett-Packard Company Double vernier time interval measurement using triggered phase-locked oscillators
JPS5914840B2 (ja) * 1979-10-19 1984-04-06 日本電信電話株式会社 半導体メモリ試験用パタ−ン発生装置
EP0491998B1 (de) * 1990-12-28 1996-07-24 International Business Machines Corporation Programmgesteuertes Verfahren und Anordnung zur Erzeugung von Impulsen in aufeinanderfolgenden Impulsintervallen
US6469493B1 (en) * 1995-08-01 2002-10-22 Teradyne, Inc. Low cost CMOS tester with edge rate compensation
US5694377A (en) 1996-04-16 1997-12-02 Ltx Corporation Differential time interpolator
JP3048962B2 (ja) * 1997-06-20 2000-06-05 日本電気アイシーマイコンシステム株式会社 時間測定方法及び時間測定システム
US5854797A (en) * 1997-08-05 1998-12-29 Teradyne, Inc. Tester with fast refire recovery time
US6073259A (en) * 1997-08-05 2000-06-06 Teradyne, Inc. Low cost CMOS tester with high channel density
US6081484A (en) 1997-10-14 2000-06-27 Schlumberger Technologies, Inc. Measuring signals in a tester system
US6246737B1 (en) 1999-10-26 2001-06-12 Credence Systems Corporation Apparatus for measuring intervals between signal edges

Also Published As

Publication number Publication date
DE60204597T2 (de) 2006-03-16
WO2003054565A1 (en) 2003-07-03
EP1459081B1 (de) 2005-06-08
US20030107951A1 (en) 2003-06-12
AU2002353115A1 (en) 2003-07-09
US6868047B2 (en) 2005-03-15
CN100422757C (zh) 2008-10-01
CN1618027A (zh) 2005-05-18
EP1459081A1 (de) 2004-09-22

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