DE602009000494D1 - Automatischer Testgeräte-Selbsttest - Google Patents

Automatischer Testgeräte-Selbsttest

Info

Publication number
DE602009000494D1
DE602009000494D1 DE602009000494T DE602009000494T DE602009000494D1 DE 602009000494 D1 DE602009000494 D1 DE 602009000494D1 DE 602009000494 T DE602009000494 T DE 602009000494T DE 602009000494 T DE602009000494 T DE 602009000494T DE 602009000494 D1 DE602009000494 D1 DE 602009000494D1
Authority
DE
Germany
Prior art keywords
sta
card module
test
backplane
ate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602009000494T
Other languages
English (en)
Inventor
Kenny Nordstrom
Ralph Jones
Krishna Munirathnam
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of DE602009000494D1 publication Critical patent/DE602009000494D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31901—Analysis of tester Performance; Tester characterization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electrotherapy Devices (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
DE602009000494T 2008-09-30 2009-09-22 Automatischer Testgeräte-Selbsttest Active DE602009000494D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/242,256 US7936172B2 (en) 2008-09-30 2008-09-30 Automatic test equipment self test

Publications (1)

Publication Number Publication Date
DE602009000494D1 true DE602009000494D1 (de) 2011-02-10

Family

ID=41572437

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602009000494T Active DE602009000494D1 (de) 2008-09-30 2009-09-22 Automatischer Testgeräte-Selbsttest

Country Status (5)

Country Link
US (1) US7936172B2 (de)
EP (1) EP2169413B1 (de)
JP (1) JP5443921B2 (de)
AT (1) ATE493670T1 (de)
DE (1) DE602009000494D1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1392071B1 (it) * 2008-11-27 2012-02-09 St Microelectronics Srl Metodo per eseguire un testing elettrico di dispositivi elettronici
CN102565563B (zh) * 2010-12-29 2016-01-13 上海汽车集团股份有限公司 用于汽车电子电器系统的自动化集成测试系统和方法
EP2689259A4 (de) * 2011-03-21 2014-12-17 Univ Windsor Vorrichtung zur automatisierten prüfung und validierung elektronischer komponenten
US8740654B2 (en) * 2011-08-15 2014-06-03 Philip Anthony Sedberry, JR. Flexible organizational connect
TW201326774A (zh) * 2011-12-19 2013-07-01 Hon Hai Prec Ind Co Ltd 鏡頭電性測試系統及其測試方法
US8896333B2 (en) * 2012-05-18 2014-11-25 Honeywell International Inc. Automatic test equipment control device
KR101212253B1 (ko) * 2012-08-16 2012-12-13 주식회사 유니테스트 리드라이버(Ｒｅｄｒｉｖｒ)를 이용하는 ＤＵＴ(Ｄｅｖｉｃ ｕｎｄｅ Ｔｅｓｔ) 테스트 장치
FR2996367B1 (fr) * 2012-10-01 2014-10-03 Airbus Operations Sas Systeme de connexion pour connecter un equipement electronique, en particulier pour aeronef, a une unite de test.
US9488673B1 (en) * 2013-09-16 2016-11-08 Advanced Testing Technologies, Inc. Multi-standard instrumentation chassis
US9295169B1 (en) * 2013-09-16 2016-03-22 Advanced Testing Technologies, Inc. Common chassis for instrumentation
US20160290064A1 (en) * 2013-12-18 2016-10-06 Halliburton Energy Services, Inc. Wire-harness-less insert assembly mechanism
CN110275803A (zh) * 2019-05-09 2019-09-24 中国电子科技集团公司电子科学研究院 串行总线测试接口适配器
CN111326457B (zh) * 2020-02-28 2023-09-22 上海御渡半导体科技有限公司 一种双向安装机构

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5841788A (en) 1996-10-18 1998-11-24 Lucent Technologies Inc. Methods for backplane interconnect testing
US6269319B1 (en) 1999-01-29 2001-07-31 The Mcdonnell Douglas Corporation Reconfigurable integration test station
US6462532B1 (en) 2000-01-07 2002-10-08 Third Millennium Test Solutions Automated testing equipment having a modular offset test head with split backplane
US6622272B1 (en) 2000-03-10 2003-09-16 Teradyne, Inc. Automatic test equipment methods and apparatus for interfacing with an external device
US6957371B2 (en) * 2001-12-04 2005-10-18 Intellitech Corporation Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems
US6804620B1 (en) 2003-03-21 2004-10-12 Advantest Corporation Calibration method for system performance validation of automatic test equipment
US7362089B2 (en) * 2004-05-21 2008-04-22 Advantest Corporation Carrier module for adapting non-standard instrument cards to test systems
US7265556B2 (en) 2005-09-28 2007-09-04 Lucent Technologies Inc. System and method for adaptable testing of backplane interconnections and a test tool incorporating the same
US7590903B2 (en) 2006-05-15 2009-09-15 Verigy (Singapore) Pte. Ltd. Re-configurable architecture for automated test equipment

Also Published As

Publication number Publication date
EP2169413B1 (de) 2010-12-29
ATE493670T1 (de) 2011-01-15
US20100079151A1 (en) 2010-04-01
US7936172B2 (en) 2011-05-03
JP5443921B2 (ja) 2014-03-19
JP2010085403A (ja) 2010-04-15
EP2169413A1 (de) 2010-03-31

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