DE60110514D1 - Jtag Testanordnung - Google Patents

Jtag Testanordnung

Info

Publication number
DE60110514D1
DE60110514D1 DE60110514T DE60110514T DE60110514D1 DE 60110514 D1 DE60110514 D1 DE 60110514D1 DE 60110514 T DE60110514 T DE 60110514T DE 60110514 T DE60110514 T DE 60110514T DE 60110514 D1 DE60110514 D1 DE 60110514D1
Authority
DE
Germany
Prior art keywords
transmission path
test
jtag
asynchronous
arrange
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60110514T
Other languages
English (en)
Other versions
DE60110514T2 (de
Inventor
Mikko Simonen
Ilkka Reis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jtag Technologies Bv Eindhoven Nl
Original Assignee
Patria Advanced Solutions Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Patria Advanced Solutions Oy filed Critical Patria Advanced Solutions Oy
Application granted granted Critical
Publication of DE60110514D1 publication Critical patent/DE60110514D1/de
Publication of DE60110514T2 publication Critical patent/DE60110514T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Indole Compounds (AREA)
DE60110514T 2000-09-14 2001-09-10 Jtag Testanordnung Expired - Lifetime DE60110514T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20002029 2000-09-14
FI20002029A FI110724B (fi) 2000-09-14 2000-09-14 JTAG-testausjärjestely

Publications (2)

Publication Number Publication Date
DE60110514D1 true DE60110514D1 (de) 2005-06-09
DE60110514T2 DE60110514T2 (de) 2006-01-19

Family

ID=8559084

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60110514T Expired - Lifetime DE60110514T2 (de) 2000-09-14 2001-09-10 Jtag Testanordnung

Country Status (8)

Country Link
US (1) US6807644B2 (de)
EP (1) EP1189070B1 (de)
AT (1) ATE294961T1 (de)
DE (1) DE60110514T2 (de)
DK (1) DK1189070T3 (de)
ES (1) ES2239069T3 (de)
FI (1) FI110724B (de)
PT (1) PT1189070E (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2831969B1 (fr) * 2001-11-08 2004-01-16 Schneider Automation Systeme de telechargement et de telemaintenance d'une carte electronique
US6721923B2 (en) * 2002-02-20 2004-04-13 Agilent Technologies, Inc. System and method for generating integrated circuit boundary register description data
US7017081B2 (en) * 2002-09-27 2006-03-21 Lucent Technologies Inc. Methods and systems for remotely controlling a test access port of a target device
FI5706U1 (fi) * 2002-11-21 2003-02-26 Patria New Technologies Oy JTAG-testilaitteisto ja -testausjärjestelmä
US7089470B1 (en) * 2003-04-11 2006-08-08 Cisco Technology, Inc. Programmable test pattern and capture mechanism for boundary scan
US7080789B2 (en) * 2003-05-09 2006-07-25 Stmicroelectronics, Inc. Smart card including a JTAG test controller and related methods
US7260753B2 (en) * 2003-07-14 2007-08-21 Fulcrum Microsystems, Inc. Methods and apparatus for providing test access to asynchronous circuits and systems
US7181663B2 (en) * 2004-03-01 2007-02-20 Verigy Pte, Ltd. Wireless no-touch testing of integrated circuits
US7471897B1 (en) 2004-07-16 2008-12-30 Cisco Technology, Inc. Electrically looped back, fault emulating transceiver module
WO2006060805A2 (en) * 2004-12-02 2006-06-08 Texas Instruments Incorporated Multiple test access port protocols sharing common signals
US7873884B2 (en) * 2005-04-15 2011-01-18 University Of Florida Research Foundation, Inc. Wireless embedded test signal generation
TW200717680A (en) 2005-07-19 2007-05-01 Koninkl Philips Electronics Nv Method of manufacturing a system in package
US7383478B1 (en) * 2005-07-20 2008-06-03 Xilinx, Inc. Wireless dynamic boundary-scan topologies for field
US7587643B1 (en) 2005-08-25 2009-09-08 T-Ram Semiconductor, Inc. System and method of integrated circuit testing
JP2007147352A (ja) * 2005-11-25 2007-06-14 Sony Corp 無線インターフェースモジュール及び電子機器
WO2007101345A1 (en) 2006-03-07 2007-09-13 Scanimetrics Inc. Method and apparatus for interrogating an electronic component
US7346820B2 (en) * 2006-03-23 2008-03-18 Freescale Semiconductor, Inc. Testing of data retention latches in circuit devices
US7793185B2 (en) * 2006-09-05 2010-09-07 Atmel Automotive Gmbh Integrated circuit for a data transmission system and receiving device of a data transmission system
US7707467B2 (en) * 2007-02-23 2010-04-27 Micron Technology, Inc. Input/output compression and pin reduction in an integrated circuit
US7747916B2 (en) 2007-05-14 2010-06-29 Infineon Technologies Ag JTAG interface
US8527822B2 (en) * 2009-10-19 2013-09-03 Nxp B.V. System and method for single terminal boundary scan
US9178629B2 (en) 2011-08-25 2015-11-03 Apple Inc. Non-synchronized radio-frequency testing
US9274911B2 (en) * 2013-02-21 2016-03-01 Advantest Corporation Using shared pins in a concurrent test execution environment
US9164858B2 (en) * 2013-03-29 2015-10-20 Testonica Lab Ou System and method for optimized board test and configuration
US11293979B2 (en) 2019-10-22 2022-04-05 Peter Shun Shen Wang Method of and an arrangement for analyzing manufacturing defects of multi-chip modules made without known good die

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9117172D0 (en) 1991-08-08 1991-09-25 British Telecomm Communication system
EP0636976B1 (de) 1993-07-28 1998-12-30 Koninklijke Philips Electronics N.V. Mikrokontroller mit hardwaremässiger Fehlerbeseitigungsunterstützung nach dem Boundary-Scanverfahren
US5630048A (en) 1994-05-19 1997-05-13 La Joie; Leslie T. Diagnostic system for run-time monitoring of computer operations
US5481186A (en) 1994-10-03 1996-01-02 At&T Corp. Method and apparatus for integrated testing of a system containing digital and radio frequency circuits
US5852617A (en) 1995-12-08 1998-12-22 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with Jtag logic mounted thereon
EP0862063A1 (de) 1997-02-27 1998-09-02 Siemens Aktiengesellschaft Schnittstellen-Steuerung einer Test-Schnittstelle
CA2243888C (en) 1998-07-27 2005-10-18 Newbridge Networks Corporation Ds-o synchronization over a wireless atm link
US6157817A (en) 1999-02-04 2000-12-05 Hughes Electronics Corporation Method for in-orbit multiple receive antenna pattern testing
US6532561B1 (en) * 1999-09-25 2003-03-11 Advantest Corp. Event based semiconductor test system
US6557128B1 (en) * 1999-11-12 2003-04-29 Advantest Corp. Semiconductor test system supporting multiple virtual logic testers

Also Published As

Publication number Publication date
DK1189070T3 (da) 2005-09-05
FI20002029A (fi) 2002-03-15
DE60110514T2 (de) 2006-01-19
US20020049558A1 (en) 2002-04-25
EP1189070A2 (de) 2002-03-20
FI20002029A0 (fi) 2000-09-14
US6807644B2 (en) 2004-10-19
FI110724B (fi) 2003-03-14
ATE294961T1 (de) 2005-05-15
ES2239069T3 (es) 2005-09-16
PT1189070E (pt) 2005-07-29
EP1189070A3 (de) 2003-11-12
EP1189070B1 (de) 2005-05-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: JTAG TECHNOLOGIES B.V., EINDHOVEN, NL