DE602009000393D1 - Abtaststeuerungsverfahren und -vorrichtung - Google Patents
Abtaststeuerungsverfahren und -vorrichtungInfo
- Publication number
- DE602009000393D1 DE602009000393D1 DE602009000393T DE602009000393T DE602009000393D1 DE 602009000393 D1 DE602009000393 D1 DE 602009000393D1 DE 602009000393 T DE602009000393 T DE 602009000393T DE 602009000393 T DE602009000393 T DE 602009000393T DE 602009000393 D1 DE602009000393 D1 DE 602009000393D1
- Authority
- DE
- Germany
- Prior art keywords
- control method
- scanning control
- scanning
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
- G01R31/318563—Multiple simultaneous testing of subparts
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008086844A JP4992791B2 (ja) | 2008-03-28 | 2008-03-28 | スキャン制御方法及び装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602009000393D1 true DE602009000393D1 (de) | 2011-01-13 |
Family
ID=40809921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602009000393T Active DE602009000393D1 (de) | 2008-03-28 | 2009-02-23 | Abtaststeuerungsverfahren und -vorrichtung |
Country Status (5)
Country | Link |
---|---|
US (1) | US8015465B2 (de) |
EP (1) | EP2105751B1 (de) |
JP (1) | JP4992791B2 (de) |
CN (1) | CN101545950B (de) |
DE (1) | DE602009000393D1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8914693B2 (en) | 2012-02-15 | 2014-12-16 | International Business Machines Corporation | Apparatus for JTAG-driven remote scanning |
JP6115042B2 (ja) * | 2012-08-27 | 2017-04-19 | 富士通株式会社 | 情報処理装置、テストデータ作成装置、テストデータ作成方法、およびプログラム |
CN104749515B (zh) * | 2015-03-31 | 2017-12-15 | 中国人民解放军国防科学技术大学 | 一种基于顺序等分分段式的低功耗扫描测试方法和装置 |
CN112345924A (zh) * | 2020-10-30 | 2021-02-09 | 上海兆芯集成电路有限公司 | 扫描链控制电路 |
CN112345925B (zh) * | 2020-10-30 | 2024-05-24 | 格兰菲智能科技有限公司 | 扫描链控制电路 |
CN112557887A (zh) * | 2020-11-17 | 2021-03-26 | Oppo广东移动通信有限公司 | 片上时钟控制装置、芯片、芯片测试系统和测试方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0690265B2 (ja) * | 1986-12-24 | 1994-11-14 | 三菱電機株式会社 | テスト回路 |
JPH05264664A (ja) * | 1992-03-17 | 1993-10-12 | Fujitsu Ltd | 半導体集積回路 |
US5270642A (en) * | 1992-05-15 | 1993-12-14 | Hewlett-Packard Company | Partitioned boundary-scan testing for the reduction of testing-induced damage |
US5497378A (en) | 1993-11-02 | 1996-03-05 | International Business Machines Corporation | System and method for testing a circuit network having elements testable by different boundary scan standards |
US6018815A (en) | 1996-10-18 | 2000-01-25 | Samsung Electronics Co., Ltd. | Adaptable scan chains for debugging and manufacturing test purposes |
JPH1117126A (ja) | 1997-06-24 | 1999-01-22 | Sharp Corp | 強誘電体膜の堆積方法および強誘電体キャパシタ素子 |
JPH1183949A (ja) * | 1997-09-05 | 1999-03-26 | Hitachi Ltd | 半導体集積回路装置 |
US6049901A (en) * | 1997-09-16 | 2000-04-11 | Stock; Mary C. | Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
US6813739B1 (en) * | 2000-04-04 | 2004-11-02 | Silicon Graphics, Inc. | Scan interface chip (SIC) system and method for scan testing electronic systems |
US6988232B2 (en) * | 2001-07-05 | 2006-01-17 | Intellitech Corporation | Method and apparatus for optimized parallel testing and access of electronic circuits |
US7412637B2 (en) * | 2003-01-10 | 2008-08-12 | Syntest Technologies, Inc. | Method and apparatus for broadcasting test patterns in a scan based integrated circuit |
JP3671948B2 (ja) * | 2002-09-24 | 2005-07-13 | ソニー株式会社 | 半導体集積回路とその試験方法 |
JP2005309867A (ja) | 2004-04-22 | 2005-11-04 | Fujitsu Ltd | マルチコア・プロセサ試験方法 |
JP2008086844A (ja) | 2006-09-29 | 2008-04-17 | Dowa Holdings Co Ltd | バグフィルタ装置およびその制御方法 |
US7870448B2 (en) * | 2007-12-18 | 2011-01-11 | International Business Machines Corporation | In system diagnostics through scan matrix |
-
2008
- 2008-03-28 JP JP2008086844A patent/JP4992791B2/ja not_active Expired - Fee Related
-
2009
- 2009-02-12 US US12/370,196 patent/US8015465B2/en not_active Expired - Fee Related
- 2009-02-23 DE DE602009000393T patent/DE602009000393D1/de active Active
- 2009-02-23 EP EP09153461A patent/EP2105751B1/de not_active Expired - Fee Related
- 2009-03-04 CN CN2009101187550A patent/CN101545950B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN101545950A (zh) | 2009-09-30 |
US20090249145A1 (en) | 2009-10-01 |
US8015465B2 (en) | 2011-09-06 |
EP2105751A1 (de) | 2009-09-30 |
CN101545950B (zh) | 2012-05-30 |
JP4992791B2 (ja) | 2012-08-08 |
EP2105751B1 (de) | 2010-12-01 |
JP2009236878A (ja) | 2009-10-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8328 | Change in the person/name/address of the agent |
Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE |