DE602008003843D1 - Mehrbit-fehlerkorrekturschema in einem speichersystem mit mehreren niveaus - Google Patents
Mehrbit-fehlerkorrekturschema in einem speichersystem mit mehreren niveausInfo
- Publication number
- DE602008003843D1 DE602008003843D1 DE602008003843T DE602008003843T DE602008003843D1 DE 602008003843 D1 DE602008003843 D1 DE 602008003843D1 DE 602008003843 T DE602008003843 T DE 602008003843T DE 602008003843 T DE602008003843 T DE 602008003843T DE 602008003843 D1 DE602008003843 D1 DE 602008003843D1
- Authority
- DE
- Germany
- Prior art keywords
- characteristic parameter
- memory cells
- bit
- value
- error correction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1072—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in multilevel memories
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- Detection And Correction Of Errors (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/772,356 US7966547B2 (en) | 2007-07-02 | 2007-07-02 | Multi-bit error correction scheme in multi-level memory storage system |
PCT/EP2008/058426 WO2009003995A1 (en) | 2007-07-02 | 2008-07-01 | Multi-bit error correction scheme in multi-level memory storage system |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602008003843D1 true DE602008003843D1 (de) | 2011-01-13 |
Family
ID=39967757
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602008003843T Active DE602008003843D1 (de) | 2007-07-02 | 2008-07-01 | Mehrbit-fehlerkorrekturschema in einem speichersystem mit mehreren niveaus |
Country Status (7)
Country | Link |
---|---|
US (1) | US7966547B2 (de) |
EP (1) | EP2186005B1 (de) |
JP (1) | JP4588806B2 (de) |
KR (1) | KR20100033517A (de) |
AT (1) | ATE490503T1 (de) |
DE (1) | DE602008003843D1 (de) |
WO (1) | WO2009003995A1 (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101529525B (zh) * | 2005-10-17 | 2016-03-30 | 特拉维夫大学拉莫特有限公司 | 每单元多位的闪速存储器的概率错误校正 |
US7769856B2 (en) * | 2007-11-15 | 2010-08-03 | Intel Corporation | Automatic tuning of communication protocol performance |
US8370709B2 (en) * | 2009-04-16 | 2013-02-05 | Micron Technology, Inc. | Multiple-level memory cells and error detection |
US8839076B2 (en) | 2011-03-31 | 2014-09-16 | International Business Machines Corporation | Encoding a data word for writing the encoded data word in a multi-level solid state memory |
US9201727B2 (en) | 2013-01-15 | 2015-12-01 | International Business Machines Corporation | Error protection for a data bus |
US9041428B2 (en) | 2013-01-15 | 2015-05-26 | International Business Machines Corporation | Placement of storage cells on an integrated circuit |
US9021328B2 (en) | 2013-01-15 | 2015-04-28 | International Business Machines Corporation | Shared error protection for register banks |
US9043683B2 (en) | 2013-01-23 | 2015-05-26 | International Business Machines Corporation | Error protection for integrated circuits |
KR20160002820A (ko) * | 2013-04-24 | 2016-01-08 | 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. | 멀티레벨 메모리 셀의 그룹을 사용하는 데이터의 표현 |
CN104252317B (zh) * | 2013-06-26 | 2017-06-06 | 群联电子股份有限公司 | 数据写入方法、存储器控制器与存储器存储装置 |
US9690640B2 (en) | 2013-09-26 | 2017-06-27 | Intel Corporation | Recovery from multiple data errors |
US10162702B2 (en) | 2016-02-01 | 2018-12-25 | Lattice Semiconductor Corporation | Segmented error coding for block-based memory |
US10318378B2 (en) * | 2016-02-25 | 2019-06-11 | Micron Technology, Inc | Redundant array of independent NAND for a three-dimensional memory array |
US10402165B2 (en) * | 2017-08-30 | 2019-09-03 | Gsi Technology Inc. | Concurrent multi-bit adder |
DE102019120801B3 (de) * | 2019-08-01 | 2020-12-03 | Infineon Technologies Ag | Vorrichtungen und Verfahren zur Datenspeicherung |
US11916570B1 (en) * | 2022-11-11 | 2024-02-27 | Texas Instruments Incorporated | Codeword format for data storage |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0148488B1 (de) * | 1983-12-23 | 1992-03-18 | Hitachi, Ltd. | Halbleiterspeicher mit einer Speicherstruktur mit vielfachen Pegeln |
KR900002664B1 (ko) * | 1985-08-16 | 1990-04-21 | 가부시끼가이샤 히다찌세이사꾸쇼 | 시리얼 데이터 기억 반도체 메모리 |
JP2573416B2 (ja) * | 1990-11-28 | 1997-01-22 | 株式会社東芝 | 半導体記憶装置 |
US5440505A (en) * | 1994-01-21 | 1995-08-08 | Intel Corporation | Method and circuitry for storing discrete amounts of charge in a single memory element |
US5450363A (en) * | 1994-06-02 | 1995-09-12 | Intel Corporation | Gray coding for a multilevel cell memory system |
EP0709776B1 (de) | 1994-10-31 | 2000-02-23 | STMicroelectronics S.r.l. | Fehlernachweis- und Korrekturverfahren in einem mehrstufigen Speicher und Speicher für dieses Verfahren |
US6023781A (en) * | 1996-09-18 | 2000-02-08 | Nippon Steel Corporation | Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program |
US6857099B1 (en) * | 1996-09-18 | 2005-02-15 | Nippon Steel Corporation | Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program |
US5864569A (en) * | 1996-10-18 | 1999-01-26 | Micron Technology, Inc. | Method and apparatus for performing error correction on data read from a multistate memory |
JPH11339496A (ja) | 1998-05-22 | 1999-12-10 | Nec Corp | 多値セルのecc回路 |
US6279135B1 (en) * | 1998-07-29 | 2001-08-21 | Lsi Logic Corporation | On-the-fly row-syndrome generation for DVD controller ECC |
US7333364B2 (en) * | 2000-01-06 | 2008-02-19 | Super Talent Electronics, Inc. | Cell-downgrading and reference-voltage adjustment for a multi-bit-cell flash memory |
US6331948B2 (en) * | 1999-12-09 | 2001-12-18 | Kabushiki Kaisha Toshiba | Error correcting circuit for making efficient error correction, and involatile semiconductor memory device incorporating the same error correcting circuit |
JP2001332096A (ja) | 2000-05-16 | 2001-11-30 | Hitachi Ltd | 不揮発性半導体メモリおよび不揮発性半導体メモリを用いた記録再生装置 |
DE60045073D1 (de) * | 2000-10-13 | 2010-11-18 | St Microelectronics Srl | Verfahren zum Speichern und Lesen von Daten eines nichtflüchtigen Multibitspeichers mit einer nichtbinären Anzahl von Bits pro Zelle |
EP1211812B1 (de) * | 2000-10-31 | 2006-11-15 | STMicroelectronics S.r.l. | Verfahren zur Analog/Digitalwandlung in nicht-flüchtigen Mehrregelspeichern mit hoher Dichte und dazugehöriger Wandler |
EP1355234B1 (de) * | 2002-04-15 | 2016-06-29 | Micron Technology, Inc. | Benutzung einer Fehlerkorrektionsschaltung in Programmierungs-und Löschverifikation |
JP4398750B2 (ja) * | 2004-02-17 | 2010-01-13 | 株式会社東芝 | Nand型フラッシュメモリ |
US7330370B2 (en) * | 2004-07-20 | 2008-02-12 | Unity Semiconductor Corporation | Enhanced functionality in a two-terminal memory array |
JP2006048783A (ja) * | 2004-08-02 | 2006-02-16 | Renesas Technology Corp | 不揮発性メモリおよびメモリカード |
US7631245B2 (en) * | 2005-09-26 | 2009-12-08 | Sandisk Il Ltd. | NAND flash memory controller exporting a NAND interface |
US7526715B2 (en) | 2005-10-17 | 2009-04-28 | Ramot At Tel Aviv University Ltd. | Probabilistic error correction in multi-bit-per-cell flash memory |
JP4575288B2 (ja) | 2005-12-05 | 2010-11-04 | 株式会社東芝 | 記憶媒体、記憶媒体再生装置、記憶媒体再生方法および記憶媒体再生プログラム |
US7697326B2 (en) * | 2006-05-12 | 2010-04-13 | Anobit Technologies Ltd. | Reducing programming error in memory devices |
US7511646B2 (en) * | 2006-05-15 | 2009-03-31 | Apple Inc. | Use of 8-bit or higher A/D for NAND cell value |
WO2008026203A2 (en) * | 2006-08-27 | 2008-03-06 | Anobit Technologies | Estimation of non-linear distortion in memory devices |
US7450425B2 (en) * | 2006-08-30 | 2008-11-11 | Micron Technology, Inc. | Non-volatile memory cell read failure reduction |
US7551482B2 (en) * | 2006-12-27 | 2009-06-23 | Sandisk Corporation | Method for programming with initial programming voltage based on trial |
US7903468B2 (en) * | 2007-04-23 | 2011-03-08 | Ramot At Telaviv University Ltd. | Adaptive dynamic reading of flash memories |
US7747903B2 (en) * | 2007-07-09 | 2010-06-29 | Micron Technology, Inc. | Error correction for memory |
-
2007
- 2007-07-02 US US11/772,356 patent/US7966547B2/en not_active Expired - Fee Related
-
2008
- 2008-07-01 KR KR1020107001473A patent/KR20100033517A/ko active IP Right Grant
- 2008-07-01 DE DE602008003843T patent/DE602008003843D1/de active Active
- 2008-07-01 WO PCT/EP2008/058426 patent/WO2009003995A1/en active Application Filing
- 2008-07-01 JP JP2010513963A patent/JP4588806B2/ja not_active Expired - Fee Related
- 2008-07-01 EP EP08761407A patent/EP2186005B1/de not_active Not-in-force
- 2008-07-01 AT AT08761407T patent/ATE490503T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US7966547B2 (en) | 2011-06-21 |
EP2186005B1 (de) | 2010-12-01 |
US20090013223A1 (en) | 2009-01-08 |
WO2009003995A1 (en) | 2009-01-08 |
KR20100033517A (ko) | 2010-03-30 |
JP2010534361A (ja) | 2010-11-04 |
JP4588806B2 (ja) | 2010-12-01 |
EP2186005A1 (de) | 2010-05-19 |
ATE490503T1 (de) | 2010-12-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8320 | Willingness to grant licences declared (paragraph 23) |