DE602006018593D1 - Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung - Google Patents
Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösungInfo
- Publication number
- DE602006018593D1 DE602006018593D1 DE602006018593T DE602006018593T DE602006018593D1 DE 602006018593 D1 DE602006018593 D1 DE 602006018593D1 DE 602006018593 T DE602006018593 T DE 602006018593T DE 602006018593 T DE602006018593 T DE 602006018593T DE 602006018593 D1 DE602006018593 D1 DE 602006018593D1
- Authority
- DE
- Germany
- Prior art keywords
- data
- multimedia interface
- definition multimedia
- self
- integrated circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/04—Display protection
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2370/00—Aspects of data communication
- G09G2370/12—Use of DVI or HDMI protocol in interfaces along the display data pipeline
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G5/00—Control arrangements or circuits for visual indicators common to cathode-ray tube indicators and other visual indicators
- G09G5/003—Details of a display terminal, the details relating to the control arrangement of the display terminal and to the interfaces thereto
- G09G5/006—Details of the interface to the display terminal
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Two-Way Televisions, Distribution Of Moving Picture Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US67051505P | 2005-04-12 | 2005-04-12 | |
PCT/US2006/013758 WO2006110857A1 (en) | 2005-04-12 | 2006-04-12 | Self-test circuit for high-definition multimedia interface integrated circuits |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602006018593D1 true DE602006018593D1 (de) | 2011-01-13 |
Family
ID=36636573
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006018593T Active DE602006018593D1 (de) | 2005-04-12 | 2006-04-12 | Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung |
Country Status (7)
Country | Link |
---|---|
US (2) | US7617064B2 (de) |
EP (1) | EP1869483B1 (de) |
JP (1) | JP5020937B2 (de) |
CN (1) | CN101044411B (de) |
AT (1) | ATE490472T1 (de) |
DE (1) | DE602006018593D1 (de) |
WO (1) | WO2006110857A1 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE45960E1 (en) | 1998-05-27 | 2016-03-29 | Advanced Testing Technologies, Inc. | Single instrument/card for video applications |
WO2006110857A1 (en) * | 2005-04-12 | 2006-10-19 | Analog Devices, Inc. | Self-test circuit for high-definition multimedia interface integrated circuits |
US8272023B2 (en) | 2006-11-02 | 2012-09-18 | Redmere Technology Ltd. | Startup circuit and high speed cable using the same |
US7861277B2 (en) * | 2006-11-02 | 2010-12-28 | Redmere Technology Ltd. | High-speed cable with embedded power control |
US20080239082A1 (en) * | 2007-03-29 | 2008-10-02 | Analogix Semiconductor, Inc. | HDMI format video pattern and audio frequencies generator for field test and built-in self test |
US8437973B2 (en) * | 2007-07-25 | 2013-05-07 | John Martin Horan | Boosted cable for carrying high speed channels and methods for calibrating the same |
US8280668B2 (en) * | 2007-07-25 | 2012-10-02 | Redmere Technology Ltd. | Self calibrating cable for high definition digital video interface |
US8073647B2 (en) * | 2007-07-25 | 2011-12-06 | Redmere Technology Ltd. | Self calibrating cable for high definition digital video interface |
US7793022B2 (en) * | 2007-07-25 | 2010-09-07 | Redmere Technology Ltd. | Repeater for a bidirectional serial bus |
US7818466B2 (en) * | 2007-12-31 | 2010-10-19 | Synopsys, Inc. | HDMI controller circuit for transmitting digital data to compatible audio device using address decoder where values are written to registers of sub-circuits |
US8446161B2 (en) * | 2009-03-17 | 2013-05-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of self monitoring and self repair for a semiconductor IC |
US8370536B2 (en) | 2009-04-24 | 2013-02-05 | Analog Devices, Inc. | Method and apparatus for providing robust display digital channel transmission |
US8130124B2 (en) * | 2009-06-19 | 2012-03-06 | Analog Devices, Inc. | Method and apparatus for improving the reliability of a serial link using scramblers |
US8108567B2 (en) * | 2009-06-19 | 2012-01-31 | Analog Devices, Inc. | Method and apparatus for connecting HDMI devices using a serial format |
CN102043693B (zh) * | 2009-10-19 | 2014-02-19 | 鸿富锦精密工业(深圳)有限公司 | 循环上电测试装置 |
US8018357B1 (en) * | 2010-03-25 | 2011-09-13 | Himax Media Solutions, Inc. | System and method for generating test patterns of baseline wander |
TWI435605B (zh) * | 2010-11-29 | 2014-04-21 | Realtek Semiconductor Corp | 透過高解析度多媒體介面來進行網路連線之網路裝置及網路連線方法 |
US9071243B2 (en) | 2011-06-30 | 2015-06-30 | Silicon Image, Inc. | Single ended configurable multi-mode driver |
US8760188B2 (en) * | 2011-06-30 | 2014-06-24 | Silicon Image, Inc. | Configurable multi-dimensional driver and receiver |
US8630821B2 (en) | 2011-07-25 | 2014-01-14 | Qualcomm Incorporated | High speed data testing without high speed bit clock |
US8648869B1 (en) | 2012-02-13 | 2014-02-11 | Advanced Testing Technologies, Inc. | Automatic test instrument for video generation and capture combined with real-time image redisplay methods |
US8842185B1 (en) | 2013-03-14 | 2014-09-23 | Microsoft Corporation | HDMI image quality analysis |
CN104009813B (zh) * | 2014-05-27 | 2015-12-09 | 硅谷数模半导体(北京)有限公司 | 静电释放检测方法、装置及系统 |
US20170089953A1 (en) * | 2015-09-25 | 2017-03-30 | Microsoft Technology Licensing, Llc | Contour generation of prompted data signal |
CN106412629B (zh) * | 2016-10-08 | 2019-08-06 | Oppo广东移动通信有限公司 | 媒体数据传输的处理方法、装置、系统及计算机可读媒体介质 |
CN109192127B (zh) * | 2018-10-29 | 2022-06-24 | 合肥鑫晟光电科技有限公司 | 时序控制器及其驱动方法、显示装置 |
CN111312301B (zh) * | 2018-12-12 | 2022-02-11 | 北京兆易创新科技股份有限公司 | 一种控制偏置电流的电路 |
Family Cites Families (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2950437A (en) * | 1954-08-16 | 1960-08-23 | Textron Inc | Circuit testing apparatus |
US2996666A (en) * | 1957-07-12 | 1961-08-15 | Gen Motors Corp | Automatic test apparatus |
US3219927A (en) * | 1958-09-15 | 1965-11-23 | North American Aviation Inc | Automatic functional test equipment utilizing digital programmed storage means |
US3082374A (en) * | 1959-06-12 | 1963-03-19 | Itt | Automatic testing system and timing device therefor |
US3764995A (en) * | 1971-12-21 | 1973-10-09 | Prd Electronics Inc | Programmable test systems |
US3976940A (en) * | 1975-02-25 | 1976-08-24 | Fairchild Camera And Instrument Corporation | Testing circuit |
US4057847A (en) * | 1976-06-14 | 1977-11-08 | Sperry Rand Corporation | Remote controlled test interface unit |
US4092589A (en) * | 1977-03-23 | 1978-05-30 | Fairchild Camera And Instrument Corp. | High-speed testing circuit |
USRE31056E (en) * | 1977-03-23 | 1982-10-12 | Fairchild Camera & Instrument Corp. | Computer controlled high-speed circuit for testing electronic devices |
US4285059A (en) * | 1979-12-10 | 1981-08-18 | The United States Of America As Represented By The Secretary Of The Army | Circuit for test of ultra high speed digital arithmetic units |
JP3116618B2 (ja) * | 1993-01-07 | 2000-12-11 | 日本電気株式会社 | テスト回路内蔵半導体集積回路 |
JP2687880B2 (ja) * | 1994-06-27 | 1997-12-08 | 日本電気株式会社 | ビデオ信号試験装置およびビデオ信号試験方法 |
JPH07274217A (ja) * | 1994-03-30 | 1995-10-20 | Nec Corp | ビデオ信号検査方法および装置 |
US5805611A (en) * | 1996-12-26 | 1998-09-08 | Stmicroelectronics, Inc. | Method and apparatus for testing high-frequency integrated circuits using a lower-frequency tester |
US5920340A (en) | 1997-07-25 | 1999-07-06 | Ati International, Srl | Method and apparatus for self-testing of a multimedia subsystem |
US6049883A (en) * | 1998-04-01 | 2000-04-11 | Tjandrasuwita; Ignatius B. | Data path clock skew management in a dynamic power management environment |
EP1082857A1 (de) * | 1998-05-27 | 2001-03-14 | Advanced Testing Technologies, Inc. | Automatisches testgerät für multiformatvideoerzeugung und erfassung |
US6057679A (en) * | 1998-06-12 | 2000-05-02 | Credence Systems Corporation | Integrated circuit tester having amorphous logic for real-time data analysis |
US6246971B1 (en) * | 1999-01-05 | 2001-06-12 | Lucent Technologies Inc. | Testing asynchronous circuits |
US6154715A (en) * | 1999-01-15 | 2000-11-28 | Credence Systems Corporation | Integrated circuit tester with real time branching |
US6345373B1 (en) * | 1999-03-29 | 2002-02-05 | The University Of California | System and method for testing high speed VLSI devices using slower testers |
US7047442B2 (en) * | 2002-04-23 | 2006-05-16 | Agilent Technologies, Inc. | Electronic test program that can distinguish results |
ATE389888T1 (de) * | 2002-05-29 | 2008-04-15 | Imec Vzw Interuniversitair Mic | Gerät und verfahren, um die leistung von mikromaschinen oder mikroelektromechanischen bauelementen zu bestimmen |
US7142623B2 (en) * | 2002-05-31 | 2006-11-28 | International Business Machines Corporation | On-chip system and method for measuring jitter tolerance of a clock and data recovery circuit |
JP4241157B2 (ja) * | 2003-04-16 | 2009-03-18 | 株式会社アドバンテスト | 試験装置 |
US7266739B2 (en) * | 2003-05-07 | 2007-09-04 | Credence Systems Solutions | Systems and methods associated with test equipment |
CN1615001A (zh) * | 2003-11-07 | 2005-05-11 | 上海乐金广电电子有限公司 | 视频编码器的场面转换检出方法及装置 |
WO2006110857A1 (en) * | 2005-04-12 | 2006-10-19 | Analog Devices, Inc. | Self-test circuit for high-definition multimedia interface integrated circuits |
US7878907B2 (en) * | 2005-05-13 | 2011-02-01 | Microsoft Corporation | Real-time HD TV/video IP streaming to a game console |
-
2006
- 2006-04-12 WO PCT/US2006/013758 patent/WO2006110857A1/en active Application Filing
- 2006-04-12 JP JP2008506660A patent/JP5020937B2/ja not_active Expired - Fee Related
- 2006-04-12 DE DE602006018593T patent/DE602006018593D1/de active Active
- 2006-04-12 EP EP06749959A patent/EP1869483B1/de not_active Not-in-force
- 2006-04-12 US US11/403,082 patent/US7617064B2/en active Active
- 2006-04-12 CN CN2006800000486A patent/CN101044411B/zh not_active Expired - Fee Related
- 2006-04-12 AT AT06749959T patent/ATE490472T1/de not_active IP Right Cessation
-
2009
- 2009-09-25 US US12/567,324 patent/US8014968B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
WO2006110857A1 (en) | 2006-10-19 |
US20060274563A1 (en) | 2006-12-07 |
EP1869483A1 (de) | 2007-12-26 |
US7617064B2 (en) | 2009-11-10 |
CN101044411A (zh) | 2007-09-26 |
CN101044411B (zh) | 2010-09-08 |
US8014968B2 (en) | 2011-09-06 |
EP1869483B1 (de) | 2010-12-01 |
JP2008538824A (ja) | 2008-11-06 |
JP5020937B2 (ja) | 2012-09-05 |
US20100023825A1 (en) | 2010-01-28 |
ATE490472T1 (de) | 2010-12-15 |
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