ATE490472T1 - Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung - Google Patents

Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung

Info

Publication number
ATE490472T1
ATE490472T1 AT06749959T AT06749959T ATE490472T1 AT E490472 T1 ATE490472 T1 AT E490472T1 AT 06749959 T AT06749959 T AT 06749959T AT 06749959 T AT06749959 T AT 06749959T AT E490472 T1 ATE490472 T1 AT E490472T1
Authority
AT
Austria
Prior art keywords
multimedia interface
circuit
data
definition multimedia
self
Prior art date
Application number
AT06749959T
Other languages
English (en)
Inventor
Barry Stakely
Rodney Miller
Yi Jingang
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Application granted granted Critical
Publication of ATE490472T1 publication Critical patent/ATE490472T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/04—Display protection
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2370/00—Aspects of data communication
    • G09G2370/12—Use of DVI or HDMI protocol in interfaces along the display data pipeline
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G5/00—Control arrangements or circuits for visual indicators common to cathode-ray tube indicators and other visual indicators
    • G09G5/003—Details of a display terminal, the details relating to the control arrangement of the display terminal and to the interfaces thereto
    • G09G5/006—Details of the interface to the display terminal

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Two-Way Televisions, Distribution Of Moving Picture Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
AT06749959T 2005-04-12 2006-04-12 Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung ATE490472T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US67051505P 2005-04-12 2005-04-12
PCT/US2006/013758 WO2006110857A1 (en) 2005-04-12 2006-04-12 Self-test circuit for high-definition multimedia interface integrated circuits

Publications (1)

Publication Number Publication Date
ATE490472T1 true ATE490472T1 (de) 2010-12-15

Family

ID=36636573

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06749959T ATE490472T1 (de) 2005-04-12 2006-04-12 Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung

Country Status (7)

Country Link
US (2) US7617064B2 (de)
EP (1) EP1869483B1 (de)
JP (1) JP5020937B2 (de)
CN (1) CN101044411B (de)
AT (1) ATE490472T1 (de)
DE (1) DE602006018593D1 (de)
WO (1) WO2006110857A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE45960E1 (en) 1998-05-27 2016-03-29 Advanced Testing Technologies, Inc. Single instrument/card for video applications
ATE490472T1 (de) * 2005-04-12 2010-12-15 Analog Devices Inc Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung
US8295296B2 (en) * 2006-11-02 2012-10-23 Redmere Technology Ltd. Programmable high-speed cable with printed circuit board and boost device
US8272023B2 (en) 2006-11-02 2012-09-18 Redmere Technology Ltd. Startup circuit and high speed cable using the same
US20080239082A1 (en) * 2007-03-29 2008-10-02 Analogix Semiconductor, Inc. HDMI format video pattern and audio frequencies generator for field test and built-in self test
US7793022B2 (en) * 2007-07-25 2010-09-07 Redmere Technology Ltd. Repeater for a bidirectional serial bus
US8437973B2 (en) * 2007-07-25 2013-05-07 John Martin Horan Boosted cable for carrying high speed channels and methods for calibrating the same
US8280668B2 (en) * 2007-07-25 2012-10-02 Redmere Technology Ltd. Self calibrating cable for high definition digital video interface
US8073647B2 (en) * 2007-07-25 2011-12-06 Redmere Technology Ltd. Self calibrating cable for high definition digital video interface
US7818466B2 (en) * 2007-12-31 2010-10-19 Synopsys, Inc. HDMI controller circuit for transmitting digital data to compatible audio device using address decoder where values are written to registers of sub-circuits
US8446161B2 (en) * 2009-03-17 2013-05-21 Taiwan Semiconductor Manufacturing Company, Ltd. Method of self monitoring and self repair for a semiconductor IC
US8370536B2 (en) 2009-04-24 2013-02-05 Analog Devices, Inc. Method and apparatus for providing robust display digital channel transmission
US8130124B2 (en) * 2009-06-19 2012-03-06 Analog Devices, Inc. Method and apparatus for improving the reliability of a serial link using scramblers
US8108567B2 (en) * 2009-06-19 2012-01-31 Analog Devices, Inc. Method and apparatus for connecting HDMI devices using a serial format
CN102043693B (zh) * 2009-10-19 2014-02-19 鸿富锦精密工业（深圳）有限公司 循环上电测试装置
US8018357B1 (en) * 2010-03-25 2011-09-13 Himax Media Solutions, Inc. System and method for generating test patterns of baseline wander
TWI435605B (zh) * 2010-11-29 2014-04-21 Realtek Semiconductor Corp 透過高解析度多媒體介面來進行網路連線之網路裝置及網路連線方法
US9071243B2 (en) 2011-06-30 2015-06-30 Silicon Image, Inc. Single ended configurable multi-mode driver
US8760188B2 (en) * 2011-06-30 2014-06-24 Silicon Image, Inc. Configurable multi-dimensional driver and receiver
US8630821B2 (en) * 2011-07-25 2014-01-14 Qualcomm Incorporated High speed data testing without high speed bit clock
US8648869B1 (en) 2012-02-13 2014-02-11 Advanced Testing Technologies, Inc. Automatic test instrument for video generation and capture combined with real-time image redisplay methods
US8842185B1 (en) 2013-03-14 2014-09-23 Microsoft Corporation HDMI image quality analysis
CN104009813B (zh) * 2014-05-27 2015-12-09 硅谷数模半导体（北京）有限公司 静电释放检测方法、装置及系统
US20170089953A1 (en) * 2015-09-25 2017-03-30 Microsoft Technology Licensing, Llc Contour generation of prompted data signal
CN106412629B (zh) * 2016-10-08 2019-08-06 Oppo广东移动通信有限公司 媒体数据传输的处理方法、装置、系统及计算机可读媒体介质
CN109192127B (zh) * 2018-10-29 2022-06-24 合肥鑫晟光电科技有限公司 时序控制器及其驱动方法、显示装置
CN111312301B (zh) * 2018-12-12 2022-02-11 北京兆易创新科技股份有限公司 一种控制偏置电流的电路
CN114062893B (zh) * 2021-10-20 2025-01-07 珠海全志科技股份有限公司 多媒体接口的量产测试系统及其方法

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2950437A (en) * 1954-08-16 1960-08-23 Textron Inc Circuit testing apparatus
US2996666A (en) * 1957-07-12 1961-08-15 Gen Motors Corp Automatic test apparatus
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
US3082374A (en) * 1959-06-12 1963-03-19 Itt Automatic testing system and timing device therefor
US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US3976940A (en) * 1975-02-25 1976-08-24 Fairchild Camera And Instrument Corporation Testing circuit
US4057847A (en) * 1976-06-14 1977-11-08 Sperry Rand Corporation Remote controlled test interface unit
USRE31056E (en) * 1977-03-23 1982-10-12 Fairchild Camera & Instrument Corp. Computer controlled high-speed circuit for testing electronic devices
US4092589A (en) * 1977-03-23 1978-05-30 Fairchild Camera And Instrument Corp. High-speed testing circuit
US4285059A (en) * 1979-12-10 1981-08-18 The United States Of America As Represented By The Secretary Of The Army Circuit for test of ultra high speed digital arithmetic units
JP3116618B2 (ja) * 1993-01-07 2000-12-11 日本電気株式会社 テスト回路内蔵半導体集積回路
JP2687880B2 (ja) * 1994-06-27 1997-12-08 日本電気株式会社 ビデオ信号試験装置およびビデオ信号試験方法
JPH07274217A (ja) * 1994-03-30 1995-10-20 Nec Corp ビデオ信号検査方法および装置
US5805611A (en) * 1996-12-26 1998-09-08 Stmicroelectronics, Inc. Method and apparatus for testing high-frequency integrated circuits using a lower-frequency tester
US5920340A (en) * 1997-07-25 1999-07-06 Ati International, Srl Method and apparatus for self-testing of a multimedia subsystem
US6049883A (en) * 1998-04-01 2000-04-11 Tjandrasuwita; Ignatius B. Data path clock skew management in a dynamic power management environment
AU4211499A (en) * 1998-05-27 1999-12-13 Advanced Testing Technologies, Inc. Automatic test instrument for multi-format video generation and capture
US6057679A (en) * 1998-06-12 2000-05-02 Credence Systems Corporation Integrated circuit tester having amorphous logic for real-time data analysis
US6246971B1 (en) * 1999-01-05 2001-06-12 Lucent Technologies Inc. Testing asynchronous circuits
US6154715A (en) * 1999-01-15 2000-11-28 Credence Systems Corporation Integrated circuit tester with real time branching
US6345373B1 (en) * 1999-03-29 2002-02-05 The University Of California System and method for testing high speed VLSI devices using slower testers
US7047442B2 (en) * 2002-04-23 2006-05-16 Agilent Technologies, Inc. Electronic test program that can distinguish results
ATE389888T1 (de) * 2002-05-29 2008-04-15 Imec Vzw Interuniversitair Mic Gerät und verfahren, um die leistung von mikromaschinen oder mikroelektromechanischen bauelementen zu bestimmen
US7142623B2 (en) * 2002-05-31 2006-11-28 International Business Machines Corporation On-chip system and method for measuring jitter tolerance of a clock and data recovery circuit
JP4241157B2 (ja) * 2003-04-16 2009-03-18 株式会社アドバンテスト 試験装置
US7203875B2 (en) * 2003-05-07 2007-04-10 Credence Systems Corporation Test systems and methods with compensation techniques
CN1615001A (zh) * 2003-11-07 2005-05-11 上海乐金广电电子有限公司 视频编码器的场面转换检出方法及装置
ATE490472T1 (de) * 2005-04-12 2010-12-15 Analog Devices Inc Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung
US7878907B2 (en) * 2005-05-13 2011-02-01 Microsoft Corporation Real-time HD TV/video IP streaming to a game console

Also Published As

Publication number Publication date
CN101044411A (zh) 2007-09-26
US8014968B2 (en) 2011-09-06
EP1869483A1 (de) 2007-12-26
EP1869483B1 (de) 2010-12-01
US20100023825A1 (en) 2010-01-28
CN101044411B (zh) 2010-09-08
US7617064B2 (en) 2009-11-10
WO2006110857A1 (en) 2006-10-19
US20060274563A1 (en) 2006-12-07
JP2008538824A (ja) 2008-11-06
JP5020937B2 (ja) 2012-09-05
DE602006018593D1 (de) 2011-01-13

Similar Documents

Publication Publication Date Title
ATE490472T1 (de) Selbstprüfungsschaltung für integrierte schaltungen von multimediaschnittstellen mit hoher auflösung
ATE510225T1 (de) Integrierte schaltung mit empfängerjittertoleranzmessung
US9749736B2 (en) Signal processing for an acoustic sensor bi-directional communication channel
TW200700755A (en) System and scanout circuits with error resilience circuit
DE602006021305D1 (de) Musterabhängiger phasendetektor zur taktwiedergewinnung
WO2010120446A3 (en) Peak detection with digital conversion
ATE553539T1 (de) Taktmodusbestimmung in einem speichersystem
CN105144587A (zh) 高效时间交织模数转换器
MX2011002953A (es) Prueba concurrente de multiples dispositivos de comunicacion.
DE602004002565D1 (de) Umsetzer von perioden zu digital
WO2013015853A3 (en) Shift register with two-phase non-overlapping clocks
TW200713270A (en) Semiconductor memory device for adjusting impedance of data output driver
GB2462239A (en) Techniques for integrated circuit clock management
WO2007109224A3 (en) Serial interface circuit and apparatus including serial interface circuit
CN204272086U (zh) 一种眼图采样与重建硬件电路
TW200514991A (en) Method and apparatus for testing a bridge circuit
TW200631025A (en) Method and system for timing measurement of embedded macro module
TWI256539B (en) Apparatus and method for generating a clock signal
WO2008084482A3 (en) Finite harmonic oscillator
WO2007146599A3 (en) Integer represenation of relative timing between desired output samples and corresponding input samples
US8381010B2 (en) Glitch-free clock switching circuit
TW200730850A (en) Testing device, program and record medium
DE602006004043D1 (de) Digitalsignalempfänger mit Q-Faktorüberwachung
ATE428272T1 (de) Hírvorrichtung ohne referenztakt-bauteil
US8901938B2 (en) Delay line scheme with no exit tree

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties