DE602006008766D1 - Testpräparierte integrierte schaltung mit interner stromversorgungsdomäne - Google Patents
Testpräparierte integrierte schaltung mit interner stromversorgungsdomäneInfo
- Publication number
- DE602006008766D1 DE602006008766D1 DE602006008766T DE602006008766T DE602006008766D1 DE 602006008766 D1 DE602006008766 D1 DE 602006008766D1 DE 602006008766 T DE602006008766 T DE 602006008766T DE 602006008766 T DE602006008766 T DE 602006008766T DE 602006008766 D1 DE602006008766 D1 DE 602006008766D1
- Authority
- DE
- Germany
- Prior art keywords
- power supply
- supply voltage
- internal power
- during
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05103146 | 2005-04-19 | ||
PCT/IB2006/051168 WO2006111910A2 (en) | 2005-04-19 | 2006-04-13 | Test prepared integrated circuit with an internal power supply domain |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602006008766D1 true DE602006008766D1 (de) | 2009-10-08 |
Family
ID=37115535
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006008766T Active DE602006008766D1 (de) | 2005-04-19 | 2006-04-13 | Testpräparierte integrierte schaltung mit interner stromversorgungsdomäne |
Country Status (7)
Country | Link |
---|---|
US (1) | US8552734B2 (de) |
EP (1) | EP1875258B1 (de) |
JP (1) | JP2008537140A (de) |
CN (1) | CN101163979B (de) |
AT (1) | ATE441118T1 (de) |
DE (1) | DE602006008766D1 (de) |
WO (1) | WO2006111910A2 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2366111A1 (de) | 2008-11-13 | 2011-09-21 | Nxp B.V. | Prüfbare integrierte schaltung und prüfverfahren dafür |
GB2480847B (en) * | 2010-06-03 | 2014-12-10 | St Microelectronics Res & Dev | Remote testing system |
CN105137330B (zh) * | 2014-05-22 | 2018-09-25 | 炬芯(珠海)科技有限公司 | 多电压域数字电路的验证装置及其运行方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4528505A (en) * | 1983-03-29 | 1985-07-09 | Motorola, Inc. | On chip voltage monitor and method for using same |
US5498972A (en) * | 1990-08-15 | 1996-03-12 | Telefonaktiebolaget Lm Ericsson | Device for monitoring the supply voltage on integrated circuits |
US5510748A (en) * | 1994-01-18 | 1996-04-23 | Vivid Semiconductor, Inc. | Integrated circuit having different power supplies for increased output voltage range while retaining small device geometries |
US6177801B1 (en) * | 1999-04-21 | 2001-01-23 | Sunrise Telecom, Inc. | Detection of bridge tap using frequency domain analysis |
WO2001022103A1 (en) | 1999-09-23 | 2001-03-29 | University Of Washington | Charge-based frequency measurement bist |
JP2001257592A (ja) * | 2000-03-09 | 2001-09-21 | Mitsubishi Electric Corp | 計測装置 |
GB2376081B (en) * | 2001-03-14 | 2004-12-08 | Micron Technology Inc | Measurement of the integrity of a power supply |
KR100938039B1 (ko) * | 2002-01-23 | 2010-01-21 | 엔엑스피 비 브이 | 집적 회로 및 배터리 전력 공급형 전자 장치 |
US7309998B2 (en) * | 2002-12-02 | 2007-12-18 | Burns Lawrence M | Process monitor for monitoring an integrated circuit chip |
-
2006
- 2006-04-13 JP JP2008507237A patent/JP2008537140A/ja not_active Withdrawn
- 2006-04-13 WO PCT/IB2006/051168 patent/WO2006111910A2/en active Application Filing
- 2006-04-13 US US11/911,732 patent/US8552734B2/en active Active
- 2006-04-13 CN CN2006800127364A patent/CN101163979B/zh not_active Expired - Fee Related
- 2006-04-13 EP EP06727936A patent/EP1875258B1/de not_active Not-in-force
- 2006-04-13 AT AT06727936T patent/ATE441118T1/de not_active IP Right Cessation
- 2006-04-13 DE DE602006008766T patent/DE602006008766D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
US8552734B2 (en) | 2013-10-08 |
EP1875258B1 (de) | 2009-08-26 |
ATE441118T1 (de) | 2009-09-15 |
JP2008537140A (ja) | 2008-09-11 |
CN101163979A (zh) | 2008-04-16 |
CN101163979B (zh) | 2011-08-31 |
WO2006111910A2 (en) | 2006-10-26 |
US20100013493A1 (en) | 2010-01-21 |
WO2006111910A3 (en) | 2007-03-01 |
EP1875258A2 (de) | 2008-01-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |