DE602005003530D1 - Verfahren und Vorrichtung zur Bestimmung der Linearität eines optischen Detektors - Google Patents

Verfahren und Vorrichtung zur Bestimmung der Linearität eines optischen Detektors

Info

Publication number
DE602005003530D1
DE602005003530D1 DE602005003530T DE602005003530T DE602005003530D1 DE 602005003530 D1 DE602005003530 D1 DE 602005003530D1 DE 602005003530 T DE602005003530 T DE 602005003530T DE 602005003530 T DE602005003530 T DE 602005003530T DE 602005003530 D1 DE602005003530 D1 DE 602005003530D1
Authority
DE
Germany
Prior art keywords
linearity
determining
optical detector
detector
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005003530T
Other languages
English (en)
Other versions
DE602005003530T2 (de
Inventor
Joe Paul Predina
Frederik Lee Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Exelis Inc
Original Assignee
ITT Manufacturing Enterprises LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ITT Manufacturing Enterprises LLC filed Critical ITT Manufacturing Enterprises LLC
Publication of DE602005003530D1 publication Critical patent/DE602005003530D1/de
Application granted granted Critical
Publication of DE602005003530T2 publication Critical patent/DE602005003530T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535—Devices with moving mirror
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/124—Sensitivity
DE602005003530T 2004-09-21 2005-09-16 Verfahren und Vorrichtung zur Bestimmung der Linearität eines optischen Detektors Active DE602005003530T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/944,807 US7095007B2 (en) 2004-09-21 2004-09-21 Method and apparatus for measurement of optical detector linearity
US944807 2004-09-21

Publications (2)

Publication Number Publication Date
DE602005003530D1 true DE602005003530D1 (de) 2008-01-10
DE602005003530T2 DE602005003530T2 (de) 2008-10-23

Family

ID=35501217

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005003530T Active DE602005003530T2 (de) 2004-09-21 2005-09-16 Verfahren und Vorrichtung zur Bestimmung der Linearität eines optischen Detektors

Country Status (3)

Country Link
US (1) US7095007B2 (de)
EP (1) EP1645854B1 (de)
DE (1) DE602005003530T2 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7511624B2 (en) * 2005-01-25 2009-03-31 Montana State University Optical detection of oscillating targets using modulation of scattered laser light
TWI393858B (zh) * 2009-02-04 2013-04-21 Univ Nat Yunlin Sci & Tech 具有高精密度之位移感測干涉儀
CN101609209B (zh) * 2009-07-21 2010-11-03 中国科学院长春光学精密机械与物理研究所 高集成度的空间摆镜驱动装置
US8995793B1 (en) * 2009-10-09 2015-03-31 Lockheed Martin Corporation Moving object super-resolution systems and methods
US20120101614A1 (en) * 2010-10-22 2012-04-26 Allan Ghaemi System and Method for Manufacturing Optical Network Components
US20130135622A1 (en) * 2011-11-23 2013-05-30 Ftrx Llc Quasi-translator, fourier modulator, fourier spectrometer, motion control system and methods for controlling same, and signal processor circuit
JP6257098B2 (ja) * 2012-05-25 2018-01-10 コーニング インコーポレイテッド 差動光信号送信システム
JP6278205B2 (ja) * 2015-01-29 2018-02-14 株式会社島津製作所 フーリエ変換型分光光度計
CN109187437B (zh) * 2018-09-11 2023-12-22 安徽省大气探测技术保障中心 前向散射能见度仪线性度检测装置
JP7014192B2 (ja) * 2019-01-25 2022-02-01 横河電機株式会社 フーリエ分光分析装置
CN110411579B (zh) * 2019-08-29 2023-04-07 河南师范大学 一种基于积分球的双调制发射率实时测量系统

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US2143094A (en) * 1937-05-29 1939-01-10 Rca Corp Electrical testing instrument
US3238449A (en) * 1961-12-27 1966-03-01 Ibm Pulse comparing device for digital measurement of signal shape
JPS5925446B2 (ja) 1977-11-25 1984-06-18 工業技術院長 受光素子の直線性を測定する方法および装置
JPS55130222A (en) * 1979-03-30 1980-10-08 Takayoshi Hirata Generator of composite pulse for distortion measurement
JPS6455836A (en) 1987-08-27 1989-03-02 Fujitsu Ltd Measuring method for sensitivity linearity of optical photodetector
US4975635A (en) * 1987-11-05 1990-12-04 Hironori Takahashi Voltage detector using a sampling type high-speed photodetector
US4927269A (en) 1989-01-31 1990-05-22 Bruke Analytische Messtechnik Gmbh Correction of non-linearities in detectors in fourier transform spectroscopy
JP2724505B2 (ja) * 1989-10-31 1998-03-09 アンリツ株式会社 光減衰量校正方法及び光校正装置
GB2248497B (en) * 1990-09-26 1994-05-25 Marconi Gec Ltd An optical sensor
JPH09264780A (ja) 1996-03-29 1997-10-07 Ando Electric Co Ltd 光検出器の直線性試験装置
US5831731A (en) * 1997-02-24 1998-11-03 Massachusetts Institute Of Technology Apparatus and method for comparing optical bits
US6252668B1 (en) * 1999-11-19 2001-06-26 Zygo Corporation Systems and methods for quantifying nonlinearities in interferometry systems
US6608293B2 (en) * 1999-12-17 2003-08-19 Agilent Technologies Inc. Method of and apparatus for testing a photosensor
US6342947B1 (en) * 2000-04-10 2002-01-29 The United States Of America As Represented By The Secretary Of The Army Optical power high accuracy standard enhancement (OPHASE) system
US20030030816A1 (en) * 2001-08-11 2003-02-13 Eom Tae Bong Nonlinearity error correcting method and phase angle measuring method for displacement measurement in two-freqency laser interferometer and displacement measurement system using the same

Also Published As

Publication number Publication date
US20060060759A1 (en) 2006-03-23
US7095007B2 (en) 2006-08-22
EP1645854A1 (de) 2006-04-12
DE602005003530T2 (de) 2008-10-23
EP1645854B1 (de) 2007-11-28

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