DE602005001673D1 - Reaktive Zerstaubungsablagerungsverfahren eines Magnesiumoxidsfilms auf einem Eisen-enthaltenden Film - Google Patents

Reaktive Zerstaubungsablagerungsverfahren eines Magnesiumoxidsfilms auf einem Eisen-enthaltenden Film

Info

Publication number
DE602005001673D1
DE602005001673D1 DE602005001673T DE602005001673T DE602005001673D1 DE 602005001673 D1 DE602005001673 D1 DE 602005001673D1 DE 602005001673 T DE602005001673 T DE 602005001673T DE 602005001673 T DE602005001673 T DE 602005001673T DE 602005001673 D1 DE602005001673 D1 DE 602005001673D1
Authority
DE
Germany
Prior art keywords
film
iron
deposition methods
sputter deposition
magnesia
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005001673T
Other languages
English (en)
Other versions
DE602005001673T2 (de
Inventor
Daniele Mauri
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HGST Netherlands BV
Original Assignee
Hitachi Global Storage Technologies Netherlands BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Global Storage Technologies Netherlands BV filed Critical Hitachi Global Storage Technologies Netherlands BV
Publication of DE602005001673D1 publication Critical patent/DE602005001673D1/de
Application granted granted Critical
Publication of DE602005001673T2 publication Critical patent/DE602005001673T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/02Pretreatment of the material to be coated
    • C23C14/024Deposition of sublayers, e.g. to promote adhesion of the coating
    • C23C14/025Metallic sublayers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/0021Reactive sputtering or evaporation
    • C23C14/0036Reactive sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • C23C14/081Oxides of aluminium, magnesium or beryllium
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • H01F41/14Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
    • H01F41/30Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE]
    • H01F41/302Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F41/305Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices applying the spacer or adjusting its interface, e.g. in order to enable particular effect different from exchange coupling
    • H01F41/307Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices applying the spacer or adjusting its interface, e.g. in order to enable particular effect different from exchange coupling insulating or semiconductive spacer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • H01F41/32Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying conductive, insulating or magnetic material on a magnetic film, specially adapted for a thin magnetic film
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/01Manufacture or treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3254Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3295Spin-exchange coupled multilayers wherein the magnetic pinned or free layers are laminated without anti-parallel coupling within the pinned and free layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • H01F41/14Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
    • H01F41/18Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Power Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Hall/Mr Elements (AREA)
  • Mram Or Spin Memory Techniques (AREA)
DE602005001673T 2004-08-26 2005-05-30 Reaktive Zerstaubungsablagerungsverfahren eines Magnesiumoxidsfilms auf einem Eisen-enthaltenden Film Active DE602005001673T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US927928 2004-08-26
US10/927,928 US20060042930A1 (en) 2004-08-26 2004-08-26 Method for reactive sputter deposition of a magnesium oxide (MgO) tunnel barrier in a magnetic tunnel junction

Publications (2)

Publication Number Publication Date
DE602005001673D1 true DE602005001673D1 (de) 2007-08-30
DE602005001673T2 DE602005001673T2 (de) 2008-04-17

Family

ID=35636633

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005001673T Active DE602005001673T2 (de) 2004-08-26 2005-05-30 Reaktive Zerstaubungsablagerungsverfahren eines Magnesiumoxidsfilms auf einem Eisen-enthaltenden Film

Country Status (4)

Country Link
US (1) US20060042930A1 (de)
EP (1) EP1640472B1 (de)
CN (1) CN100359566C (de)
DE (1) DE602005001673T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4782037B2 (ja) 2006-03-03 2011-09-28 キヤノンアネルバ株式会社 磁気抵抗効果素子の製造方法及び製造装置
US8679301B2 (en) * 2007-08-01 2014-03-25 HGST Netherlands B.V. Repeatability for RF MgO TMR barrier layer process by implementing Ti pasting
US7488609B1 (en) 2007-11-16 2009-02-10 Hitachi Global Storage Technologies Netherlands B.V. Method for forming an MgO barrier layer in a tunneling magnetoresistive (TMR) device
US20130134032A1 (en) * 2008-06-25 2013-05-30 Canon Anelva Corporation Method of fabricating and apparatus of fabricating tunnel magnetic resistive element
US8138561B2 (en) * 2008-09-18 2012-03-20 Magic Technologies, Inc. Structure and method to fabricate high performance MTJ devices for spin-transfer torque (STT)-RAM
US9007818B2 (en) 2012-03-22 2015-04-14 Micron Technology, Inc. Memory cells, semiconductor device structures, systems including such cells, and methods of fabrication
JP5998654B2 (ja) * 2012-05-31 2016-09-28 東京エレクトロン株式会社 真空処理装置、真空処理方法及び記憶媒体
US9054030B2 (en) 2012-06-19 2015-06-09 Micron Technology, Inc. Memory cells, semiconductor device structures, memory systems, and methods of fabrication
US8923038B2 (en) 2012-06-19 2014-12-30 Micron Technology, Inc. Memory cells, semiconductor device structures, memory systems, and methods of fabrication
US9379315B2 (en) 2013-03-12 2016-06-28 Micron Technology, Inc. Memory cells, methods of fabrication, semiconductor device structures, and memory systems
US9368714B2 (en) 2013-07-01 2016-06-14 Micron Technology, Inc. Memory cells, methods of operation and fabrication, semiconductor device structures, and memory systems
DE102013011072A1 (de) 2013-07-03 2015-01-08 Oerlikon Trading Ag, Trübbach Targetpräparation
US9466787B2 (en) 2013-07-23 2016-10-11 Micron Technology, Inc. Memory cells, methods of fabrication, semiconductor device structures, memory systems, and electronic systems
US9461242B2 (en) 2013-09-13 2016-10-04 Micron Technology, Inc. Magnetic memory cells, methods of fabrication, semiconductor devices, memory systems, and electronic systems
US9608197B2 (en) 2013-09-18 2017-03-28 Micron Technology, Inc. Memory cells, methods of fabrication, and semiconductor devices
US10454024B2 (en) 2014-02-28 2019-10-22 Micron Technology, Inc. Memory cells, methods of fabrication, and memory devices
CN103943774A (zh) * 2014-03-27 2014-07-23 西安电子科技大学 基于镁靶的磁隧道结制备方法
US9281466B2 (en) 2014-04-09 2016-03-08 Micron Technology, Inc. Memory cells, semiconductor structures, semiconductor devices, and methods of fabrication
US9269888B2 (en) 2014-04-18 2016-02-23 Micron Technology, Inc. Memory cells, methods of fabrication, and semiconductor devices
US9349945B2 (en) 2014-10-16 2016-05-24 Micron Technology, Inc. Memory cells, semiconductor devices, and methods of fabrication
US9768377B2 (en) 2014-12-02 2017-09-19 Micron Technology, Inc. Magnetic cell structures, and methods of fabrication
US10439131B2 (en) 2015-01-15 2019-10-08 Micron Technology, Inc. Methods of forming semiconductor devices including tunnel barrier materials
US9685201B2 (en) 2015-07-10 2017-06-20 International Business Machines Corporation Corrosion and/or oxidation damage protection for tunnel junctions
US10665426B2 (en) * 2015-10-28 2020-05-26 Applied Materials, Inc. Methods for thin film material deposition using reactive plasma-free physical vapor deposition
US10640865B2 (en) * 2016-09-09 2020-05-05 Samsung Electronics Co., Ltd. Substrate processing apparatus and method for manufacturing semiconductor device using the same
KR102520472B1 (ko) * 2016-09-09 2023-04-12 삼성전자주식회사 기판 처리 장치 및 이를 이용한 반도체 장치의 제조 방법
US11646143B2 (en) 2019-05-21 2023-05-09 International Business Machines Corporation Magnetic multi-layers containing MgO sublayers as perpendicularly magnetized magnetic electrodes for magnetic memory technology

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4166784A (en) * 1978-04-28 1979-09-04 Applied Films Lab, Inc. Feedback control for vacuum deposition apparatus
US4421622A (en) * 1982-09-20 1983-12-20 Advanced Coating Technology, Inc. Method of making sputtered coatings
US5618388A (en) * 1988-02-08 1997-04-08 Optical Coating Laboratory, Inc. Geometries and configurations for magnetron sputtering apparatus
US5227193A (en) * 1990-10-02 1993-07-13 Matsushita Electric Industrial Co., Ltd. Method for manufacturing magnetic head
US5232571A (en) * 1991-12-23 1993-08-03 Iowa State University Research Foundation, Inc. Aluminum nitride deposition using an AlN/Al sputter cycle technique
US5942089A (en) * 1996-04-22 1999-08-24 Northwestern University Method for sputtering compounds on a substrate
US5640343A (en) * 1996-03-18 1997-06-17 International Business Machines Corporation Magnetic memory array using magnetic tunnel junction devices in the memory cells
US5917682A (en) * 1996-09-09 1999-06-29 Matsushita Electric Industrial Co., Ltd. Magnetic head and manufacturing method therefor
US5729410A (en) * 1996-11-27 1998-03-17 International Business Machines Corporation Magnetic tunnel junction device with longitudinal biasing
WO1998042890A1 (en) * 1997-03-21 1998-10-01 Applied Films Corporation Magnesium oxide sputtering apparatus
US5882022A (en) * 1997-03-28 1999-03-16 Convertini; John A. Stroller standing platform
US6952504B2 (en) * 2001-12-21 2005-10-04 Neophotonics Corporation Three dimensional engineering of planar optical structures
US6150030A (en) * 1997-11-20 2000-11-21 Balzers Hochvakuum Ag Substrate coated with an MgO-layer
US6537428B1 (en) * 1999-09-02 2003-03-25 Veeco Instruments, Inc. Stable high rate reactive sputtering
US6480365B1 (en) * 1999-12-09 2002-11-12 International Business Machines Corporation Spin valve transistor using a magnetic tunnel junction
US6727105B1 (en) * 2000-02-28 2004-04-27 Hewlett-Packard Development Company, L.P. Method of fabricating an MRAM device including spin dependent tunneling junction memory cells
JP3468419B2 (ja) * 2000-03-17 2003-11-17 Tdk株式会社 トンネル磁気抵抗効果素子、薄膜磁気ヘッド、磁気ヘッド装置及び磁気ディスク装置
US6281538B1 (en) * 2000-03-22 2001-08-28 Motorola, Inc. Multi-layer tunneling device with a graded stoichiometry insulating layer
GB2361244B (en) * 2000-04-14 2004-02-11 Trikon Holdings Ltd A method of depositing dielectric
US6359289B1 (en) * 2000-04-19 2002-03-19 International Business Machines Corporation Magnetic tunnel junction device with improved insulating tunnel barrier
US6853520B2 (en) * 2000-09-05 2005-02-08 Kabushiki Kaisha Toshiba Magnetoresistance effect element
JP2002167661A (ja) * 2000-11-30 2002-06-11 Anelva Corp 磁性多層膜作製装置
US6721144B2 (en) * 2001-01-04 2004-04-13 International Business Machines Corporation Spin valves with co-ferrite pinning layer
JP4282245B2 (ja) * 2001-01-31 2009-06-17 富士通株式会社 容量素子及びその製造方法並びに半導体装置
WO2002099905A1 (fr) * 2001-05-31 2002-12-12 National Institute Of Advanced Industrial Science And Technology Element de magnetoresistance tunnel
US6735060B2 (en) * 2001-06-20 2004-05-11 International Business Machines Corporation Spin valve sensor with a metal and metal oxide cap layer structure
US6347049B1 (en) * 2001-07-25 2002-02-12 International Business Machines Corporation Low resistance magnetic tunnel junction device with bilayer or multilayer tunnel barrier
US6709767B2 (en) * 2001-07-31 2004-03-23 Hitachi Global Storage Technologies Netherlands B.V. In-situ oxidized films for use as cap and gap layers in a spin-valve sensor and methods of manufacture
EP1488444B1 (de) * 2002-03-15 2016-11-02 Oerlikon Surface Solutions AG, Pfäffikon Vakuumplasmagenerator
US20040082081A1 (en) * 2002-10-29 2004-04-29 Manish Sharma Ultra-violet treatment for a tunnel barrier layer in a tunnel junction device
US6756128B2 (en) * 2002-11-07 2004-06-29 International Business Machines Corporation Low-resistance high-magnetoresistance magnetic tunnel junction device with improved tunnel barrier
US6937448B2 (en) * 2002-11-13 2005-08-30 Hitachi Global Storage Technologies Netherlands, B.V. Spin valve having copper oxide spacer layer with specified coupling field strength between multi-layer free and pinned layer structures
US6652906B1 (en) * 2002-11-19 2003-11-25 Hitachi Global Storage Technologies Netherlands B.V. Fabrication of a magnetoresistance sensor structure having a spacer layer produced by multiple deposition and oxidation steps
US6841395B2 (en) * 2002-11-25 2005-01-11 International Business Machines Corporation Method of forming a barrier layer of a tunneling magnetoresistive sensor
US6960397B2 (en) * 2003-01-29 2005-11-01 Korea Chungang Educational Foundation Magnetoresistance device
JP2005048260A (ja) * 2003-07-31 2005-02-24 Canon Inc 反応性スパッタリング方法

Also Published As

Publication number Publication date
DE602005001673T2 (de) 2008-04-17
CN1746979A (zh) 2006-03-15
EP1640472A2 (de) 2006-03-29
EP1640472A3 (de) 2006-04-05
CN100359566C (zh) 2008-01-02
US20060042930A1 (en) 2006-03-02
EP1640472B1 (de) 2007-07-18

Similar Documents

Publication Publication Date Title
DE602005001673D1 (de) Reaktive Zerstaubungsablagerungsverfahren eines Magnesiumoxidsfilms auf einem Eisen-enthaltenden Film
EP2099949A4 (de) Reaktive sputterablagerung auf einer transparenten leitfähigen folie
NO20045674D0 (no) Thin films prepared with gas phase deposition technique
IL192688A0 (en) Lightweight thin flexible polymer coated glove and a method therefor
DE602006002764D1 (de) Dekorative Mehrschichtabdeckung eines Radargeräts
PL2117730T3 (pl) Sposoby powlekania podłoża metalowego oraz pochodne powlekane podłoża
SG121183A1 (en) Methods of sputtering a protective coating on a semiconductor substrate
DE602005009899D1 (de) Deformation eines computergenerierten Modells
GB0523437D0 (en) A method of patterning a thin film
IL173455A0 (en) Acoustic liner with a nonuniform depth backwall
DK3178792T3 (da) Fremgangsmåde til aflejringshæmning
SG136127A1 (en) Ruthenium alloy magnetic media and sputter targets
GB0504576D0 (en) Turbine blades and methods for depositing an erosion resistant coating on the same
DK2001964T3 (da) Konservesdåser overtrukket med en sammensætning omfattende en acrylpolymer
TWI350006B (en) Plasma enhanced thin film deposition method
HK1202730A1 (en) Systems and methods for determining a flow of data
DE502007004581D1 (de) Anordnung mit einem beschichteten piezoaktor
SG128653A1 (en) Thin film structure having a soft magnetic interolayer
ZA200807801B (en) Coatings and films
EP1999779B8 (de) Vorrichtung und verfahren zum beschichten eines mikro- und/oder nanostrukturierten struktursubstrats sowie beschichtetes struktursubstrat
CH699729C1 (de) Bausatz zur Zusammenstellung eines Aufbewahrungsmöbels oder Regals.
EP2057667A4 (de) Verfahren zur antistatik-abscheidung auf komponenten eines mobiltelefons
GB2434002B (en) Thin film reflective screen
DE502007006844D1 (de) Verfahren zur herstellung eines beschichteten gegenstands durch sputtern eines keramischen targets
FI20040430A0 (fi) Reaktiiviset kalvonmuodostajat

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: PUSCHMANN & BORCHERT, 82041 OBERHACHING