DE602004023434D1 - - Google Patents
Info
- Publication number
- DE602004023434D1 DE602004023434D1 DE602004023434T DE602004023434T DE602004023434D1 DE 602004023434 D1 DE602004023434 D1 DE 602004023434D1 DE 602004023434 T DE602004023434 T DE 602004023434T DE 602004023434 T DE602004023434 T DE 602004023434T DE 602004023434 D1 DE602004023434 D1 DE 602004023434D1
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
- H03F3/45744—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
- H03F1/301—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in MOSFET amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
- H03F3/45695—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by using feedforward means
- H03F3/4573—Measuring at the common source circuit of the differential amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45212—Indexing scheme relating to differential amplifiers the differential amplifier being designed to have a reduced offset
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45406—Indexing scheme relating to differential amplifiers the CMCL comprising a common source node of a long tail FET pair as an addition circuit
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US55840104P | 2004-03-31 | 2004-03-31 | |
US10/911,371 US7049889B2 (en) | 2004-03-31 | 2004-08-03 | Differential stage voltage offset trim circuitry |
PCT/US2004/043313 WO2005104358A1 (en) | 2004-03-31 | 2004-12-16 | Differential stage voltage offset trim circuitry |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602004023434D1 true DE602004023434D1 (de) | 2009-11-12 |
Family
ID=34959841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004023434T Active DE602004023434D1 (de) | 2004-03-31 | 2004-12-16 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7049889B2 (de) |
EP (1) | EP1721386B1 (de) |
JP (1) | JP4638481B2 (de) |
DE (1) | DE602004023434D1 (de) |
WO (1) | WO2005104358A1 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7920017B2 (en) * | 2004-12-16 | 2011-04-05 | Analog Devices, Inc. | Programmable clock booster system |
US7250819B2 (en) * | 2004-12-16 | 2007-07-31 | Analog Devices, Inc. | Input tracking current mirror for a differential amplifier system |
JP2006352272A (ja) * | 2005-06-13 | 2006-12-28 | Renesas Technology Corp | 半導体集積回路装置 |
US8502557B2 (en) | 2006-06-05 | 2013-08-06 | Analog Devices, Inc. | Apparatus and methods for forming electrical networks that approximate desired performance characteristics |
US20080094107A1 (en) * | 2006-10-20 | 2008-04-24 | Cortina Systems, Inc. | Signal magnitude comparison apparatus and methods |
JP4695621B2 (ja) * | 2007-04-25 | 2011-06-08 | ルネサスエレクトロニクス株式会社 | 半導体回路 |
JP2008301083A (ja) * | 2007-05-30 | 2008-12-11 | Mitsubishi Electric Corp | 差動信号生成回路 |
US9356568B2 (en) | 2007-06-05 | 2016-05-31 | Analog Devices, Inc. | Apparatus and methods for chopper amplifiers |
WO2009092475A2 (en) * | 2008-01-25 | 2009-07-30 | International Business Machines Corporation | Method and apparatus for improvement of matching fet currents using a digital to analog converter |
US7944309B2 (en) * | 2009-03-18 | 2011-05-17 | Qualcomm, Incorporated | Transconductance bias circuit, amplifier and method |
US7956679B2 (en) * | 2009-07-29 | 2011-06-07 | Freescale Semiconductor, Inc. | Differential amplifier with offset voltage trimming |
US10720919B2 (en) | 2011-11-16 | 2020-07-21 | Analog Devices, Inc. | Apparatus and methods for reducing charge injection mismatch in electronic circuits |
US8816773B2 (en) | 2012-10-04 | 2014-08-26 | Analog Devices, Inc. | Offset current trim circuit |
US9887552B2 (en) * | 2013-03-14 | 2018-02-06 | Analog Devices, Inc. | Fine timing adjustment method |
EP2851762B1 (de) * | 2013-09-24 | 2017-12-06 | STMicroelectronics International N.V. | Rückkopplungsnetzwerk für Generator mit geringer Abfallspannung |
US9444405B1 (en) * | 2015-09-24 | 2016-09-13 | Freescale Semiconductor, Inc. | Methods and structures for dynamically reducing DC offset |
CN108781060B (zh) * | 2016-01-25 | 2023-04-14 | 康杜实验室公司 | 具有增强的高频增益的电压采样驱动器 |
TWI600271B (zh) * | 2016-11-04 | 2017-09-21 | 茂達電子股份有限公司 | 運算放大器及降低其偏移電壓的方法 |
JP6830079B2 (ja) * | 2018-03-30 | 2021-02-17 | 日本電信電話株式会社 | トラック・アンド・ホールド回路 |
US10931249B2 (en) | 2018-06-12 | 2021-02-23 | Kandou Labs, S.A. | Amplifier with adjustable high-frequency gain using varactor diodes |
EP3808044A1 (de) | 2018-06-12 | 2021-04-21 | Kandou Labs, S.A. | Passiver mehrfacheingangskomparator für orthogonale codes auf einem multi-wire-bus |
US10587228B2 (en) * | 2018-07-12 | 2020-03-10 | Analog Devices, Inc. | Common mode rejection including temperature drift correction |
EP3850751A1 (de) | 2018-09-10 | 2021-07-21 | Kandou Labs, S.A. | Programmierbarer, zeitstetiger linearer entzerrer mit stabilisierten hochfrequenzspitzen zur steuerung des betriebsstroms eines slicers |
US10574487B1 (en) | 2019-04-08 | 2020-02-25 | Kandou Labs, S.A. | Sampler offset calibration during operation |
US10608849B1 (en) | 2019-04-08 | 2020-03-31 | Kandou Labs, S.A. | Variable gain amplifier and sampler offset calibration without clock recovery |
US10680634B1 (en) | 2019-04-08 | 2020-06-09 | Kandou Labs, S.A. | Dynamic integration time adjustment of a clocked data sampler using a static analog calibration circuit |
US11082012B2 (en) * | 2019-05-10 | 2021-08-03 | Cirrus Logic, Inc. | Highly linear input and output rail-to-rail amplifier |
JPWO2021070246A1 (de) * | 2019-10-08 | 2021-04-15 | ||
US11303484B1 (en) | 2021-04-02 | 2022-04-12 | Kandou Labs SA | Continuous time linear equalization and bandwidth adaptation using asynchronous sampling |
US11374800B1 (en) | 2021-04-14 | 2022-06-28 | Kandou Labs SA | Continuous time linear equalization and bandwidth adaptation using peak detector |
US11456708B1 (en) | 2021-04-30 | 2022-09-27 | Kandou Labs SA | Reference generation circuit for maintaining temperature-tracked linearity in amplifier with adjustable high-frequency gain |
US11914410B2 (en) | 2021-06-07 | 2024-02-27 | Texas Instruments Incorporated | Accuracy trim architecture for high precision voltage reference |
CN117097272B (zh) * | 2023-08-18 | 2024-05-03 | 北京中科格励微科技有限公司 | 一种运算放大器组合电路及自调整运算放大器 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5573114A (en) * | 1978-11-28 | 1980-06-02 | Nippon Gakki Seizo Kk | Output offset control circuit for full step direct-coupled amplifier |
JPS60213108A (ja) * | 1984-04-06 | 1985-10-25 | Hitachi Ltd | 増幅回路 |
JPS63260206A (ja) * | 1987-04-16 | 1988-10-27 | Nec Corp | オフセツト電圧制御回路 |
US4827222A (en) * | 1987-12-11 | 1989-05-02 | Vtc Incorporated | Input offset voltage trimming network and method |
JPH02112307A (ja) * | 1988-10-20 | 1990-04-25 | Fujitsu Ltd | 差動増幅器のオフセット調整回路 |
JPH0446709U (de) * | 1990-08-27 | 1992-04-21 | ||
JPH04130808A (ja) * | 1990-09-21 | 1992-05-01 | Toshiba Corp | 差動増幅器 |
DE19706985B4 (de) * | 1997-02-21 | 2004-03-18 | Telefonaktiebolaget L M Ericsson (Publ) | Eingangspufferschaltkreis |
JP3788660B2 (ja) * | 1997-06-12 | 2006-06-21 | 松下電器産業株式会社 | 漏洩電流減衰装置 |
JPH11251848A (ja) * | 1998-03-05 | 1999-09-17 | Nec Corp | チューナブルmos線形トランスコンダクタンス・アンプ |
JPH11272786A (ja) * | 1998-03-25 | 1999-10-08 | Seiko Instruments Inc | 差動増幅回路 |
US6194962B1 (en) | 1999-04-13 | 2001-02-27 | Analog Devices, Inc. | Adaptive operational amplifier offset voltage trimming system |
US6229394B1 (en) * | 1999-09-17 | 2001-05-08 | Elantec Semiconductor, Inc. | Circuit providing a negative resistance to offset error voltage for use with a folded cascode amplifier |
US6310519B1 (en) * | 2000-06-08 | 2001-10-30 | Mitsubishi Electric & Electronics U.S.A., Inc. | Method and apparatus for amplifier output biasing for improved overall temperature stability |
US6400219B1 (en) * | 2000-08-16 | 2002-06-04 | Texas Instruments Incorporated | High-speed offset comparator |
US6522200B2 (en) | 2000-12-11 | 2003-02-18 | Texas Instruments Incorporated | Process-insensitive, highly-linear constant transconductance circuit |
US6617926B2 (en) * | 2001-06-29 | 2003-09-09 | Intel Corporation | Tail current node equalization for a variable offset amplifier |
US6696894B1 (en) | 2002-06-12 | 2004-02-24 | Analog Devices, Inc. | Operational amplifier with independent input offset trim for high and low common mode input voltages |
-
2004
- 2004-08-03 US US10/911,371 patent/US7049889B2/en active Active
- 2004-12-16 EP EP04815394A patent/EP1721386B1/de not_active Ceased
- 2004-12-16 DE DE602004023434T patent/DE602004023434D1/de active Active
- 2004-12-16 JP JP2007506141A patent/JP4638481B2/ja not_active Expired - Fee Related
- 2004-12-16 WO PCT/US2004/043313 patent/WO2005104358A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
EP1721386B1 (de) | 2009-09-30 |
WO2005104358A1 (en) | 2005-11-03 |
JP2007531459A (ja) | 2007-11-01 |
JP4638481B2 (ja) | 2011-02-23 |
EP1721386A1 (de) | 2006-11-15 |
US7049889B2 (en) | 2006-05-23 |
US20050218980A1 (en) | 2005-10-06 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |