DE602004008734D1 - Hochspannungsstromdetektor - Google Patents

Hochspannungsstromdetektor

Info

Publication number
DE602004008734D1
DE602004008734D1 DE602004008734T DE602004008734T DE602004008734D1 DE 602004008734 D1 DE602004008734 D1 DE 602004008734D1 DE 602004008734 T DE602004008734 T DE 602004008734T DE 602004008734 T DE602004008734 T DE 602004008734T DE 602004008734 D1 DE602004008734 D1 DE 602004008734D1
Authority
DE
Germany
Prior art keywords
voltage
current
vsense
iout
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004008734T
Other languages
English (en)
Other versions
DE602004008734T2 (de
Inventor
Paul A Brokaw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Publication of DE602004008734D1 publication Critical patent/DE602004008734D1/de
Application granted granted Critical
Publication of DE602004008734T2 publication Critical patent/DE602004008734T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Control Of Electrical Variables (AREA)
DE602004008734T 2004-01-21 2004-12-15 Hochspannungsstromdetektor Active DE602004008734T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US762647 2004-01-21
US10/762,647 US6956727B1 (en) 2004-01-21 2004-01-21 High side current monitor with extended voltage range

Publications (2)

Publication Number Publication Date
DE602004008734D1 true DE602004008734D1 (de) 2007-10-18
DE602004008734T2 DE602004008734T2 (de) 2008-06-12

Family

ID=34634597

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004008734T Active DE602004008734T2 (de) 2004-01-21 2004-12-15 Hochspannungsstromdetektor

Country Status (4)

Country Link
US (1) US6956727B1 (de)
EP (1) EP1557679B1 (de)
AT (1) ATE372520T1 (de)
DE (1) DE602004008734T2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8441325B2 (en) 2004-06-03 2013-05-14 Silicon Laboratories Inc. Isolator with complementary configurable memory
US7447492B2 (en) 2004-06-03 2008-11-04 Silicon Laboratories Inc. On chip transformer isolator
US7737871B2 (en) 2004-06-03 2010-06-15 Silicon Laboratories Inc. MCU with integrated voltage isolator to provide a galvanic isolation between input and output
US7421028B2 (en) 2004-06-03 2008-09-02 Silicon Laboratories Inc. Transformer isolator for digital power supply
US8049573B2 (en) * 2004-06-03 2011-11-01 Silicon Laboratories Inc. Bidirectional multiplexed RF isolator
US7821428B2 (en) 2004-06-03 2010-10-26 Silicon Laboratories Inc. MCU with integrated voltage isolator and integrated galvanically isolated asynchronous serial data link
US8169108B2 (en) * 2004-06-03 2012-05-01 Silicon Laboratories Inc. Capacitive isolator
US8198951B2 (en) 2004-06-03 2012-06-12 Silicon Laboratories Inc. Capacitive isolation circuitry
US7902627B2 (en) 2004-06-03 2011-03-08 Silicon Laboratories Inc. Capacitive isolation circuitry with improved common mode detector
US7302247B2 (en) 2004-06-03 2007-11-27 Silicon Laboratories Inc. Spread spectrum isolator
US7738568B2 (en) 2004-06-03 2010-06-15 Silicon Laboratories Inc. Multiplexed RF isolator
US7376212B2 (en) 2004-06-03 2008-05-20 Silicon Laboratories Inc. RF isolator with differential input/output
US7336122B2 (en) * 2005-12-06 2008-02-26 Supertex, Inc. Low power high side current monitor which operates at high voltages and method therefor
US7928662B2 (en) * 2006-12-18 2011-04-19 Microsemi Corp.—Analog Mixed Signal Group Ltd. Voltage range extender mechanism
DE102007014331A1 (de) * 2007-03-26 2008-10-02 Robert Bosch Gmbh Ansteuerschaltung und Ansteuerverfahren für ein piezoelektrisches Element
GB2447955A (en) * 2007-03-29 2008-10-01 Absl Power Solutions Ltd High side current measurement
US7570114B2 (en) * 2007-07-24 2009-08-04 Analog Devices, Inc. Common mode rejection calibration method for difference amplifiers
US7821245B2 (en) 2007-08-06 2010-10-26 Analog Devices, Inc. Voltage transformation circuit
JP5473531B2 (ja) * 2009-10-22 2014-04-16 ラピスセミコンダクタ株式会社 バイアス電位発生回路
US8264216B2 (en) 2010-09-21 2012-09-11 Sendyne Corp. High-accuracy low-power current sensor with large dynamic range
US8451032B2 (en) 2010-12-22 2013-05-28 Silicon Laboratories Inc. Capacitive isolator with schmitt trigger
US20130009655A1 (en) 2011-03-01 2013-01-10 Sendyne Corporation Current sensor
JP5920088B2 (ja) * 2012-07-24 2016-05-18 コニカミノルタ株式会社 電流検出回路及び電流検出回路を用いた超音波診断装置
US8902005B2 (en) 2012-09-25 2014-12-02 Analog Devices, Inc. Apparatus and method for wide common mode difference
US9264002B2 (en) 2014-02-19 2016-02-16 Analog Devices Global Apparatus and methods for improving common mode rejection ratio
US9729140B2 (en) 2014-03-05 2017-08-08 Analog Devices, Inc. Circuits with floating bias
US9496835B2 (en) 2014-12-15 2016-11-15 Semiconductor Components Industries, Llc Current sense amplifer with extended common mode input voltage range
US9960741B2 (en) 2016-06-27 2018-05-01 Dialog Semiconductor (Uk) Limited High frequency common mode rejection technique for large dynamic common mode signals
EP3293888B1 (de) 2016-09-13 2020-08-26 Allegro MicroSystems, LLC Signalisolator mit bidirektionaler kommunikation zwischen chips
US11115244B2 (en) 2019-09-17 2021-09-07 Allegro Microsystems, Llc Signal isolator with three state data transmission
EP3812873A1 (de) * 2019-10-24 2021-04-28 NXP USA, Inc. Spannungsreferenzerzeugung mit kompensation von temperaturschwankungen
JP2022111592A (ja) * 2021-01-20 2022-08-01 キオクシア株式会社 半導体集積回路
CN113219233B (zh) * 2021-04-30 2023-06-09 石家庄宇飞电子有限公司 高边电流采样的电压扩展电路

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4101492A1 (de) * 1991-01-19 1992-07-23 Telefunken Electronic Gmbh Stromdetektor
US5220207A (en) * 1991-09-03 1993-06-15 Allegro Microsystems, Inc. Load current monitor for MOS driver
US6222922B1 (en) * 1997-04-22 2001-04-24 Silicon Laboratories, Inc. Loop current monitor circuitry and method for a communication system
JP3101998B2 (ja) * 1997-06-26 2000-10-23 富士電機株式会社 過電流検出回路
JP3393203B2 (ja) * 1999-09-13 2003-04-07 株式会社ホンダエレシス 電流検出回路の検査方法
US6785521B2 (en) * 2001-03-21 2004-08-31 Ericsson Inc. System and method for current-mode amplitude modulation

Also Published As

Publication number Publication date
DE602004008734T2 (de) 2008-06-12
EP1557679A2 (de) 2005-07-27
EP1557679A3 (de) 2005-11-02
ATE372520T1 (de) 2007-09-15
US6956727B1 (en) 2005-10-18
EP1557679B1 (de) 2007-09-05

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Legal Events

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