DE60131807D1 - Wandergenerator mit Vorrichtung zum wilkürlichen Setzen der TDEV Maske - Google Patents

Wandergenerator mit Vorrichtung zum wilkürlichen Setzen der TDEV Maske

Info

Publication number
DE60131807D1
DE60131807D1 DE60131807T DE60131807T DE60131807D1 DE 60131807 D1 DE60131807 D1 DE 60131807D1 DE 60131807 T DE60131807 T DE 60131807T DE 60131807 T DE60131807 T DE 60131807T DE 60131807 D1 DE60131807 D1 DE 60131807D1
Authority
DE
Germany
Prior art keywords
wandergenerator
arbitrary setting
tdev mask
tdev
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60131807T
Other languages
English (en)
Other versions
DE60131807T2 (de
Inventor
Kazuhiko Ishibe
Tetsuya Tada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Publication of DE60131807D1 publication Critical patent/DE60131807D1/de
Application granted granted Critical
Publication of DE60131807T2 publication Critical patent/DE60131807T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04J—MULTIPLEX COMMUNICATION
    • H04J3/00—Time-division multiplex systems
    • H04J3/02—Details
    • H04J3/14—Monitoring arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Measuring Phase Differences (AREA)
  • Manipulation Of Pulses (AREA)
  • Optical Communication System (AREA)
DE60131807T 2000-06-20 2001-06-19 Wandergenerator mit Vorrichtung zum willkürlichen Setzen der TDEV Maske Expired - Fee Related DE60131807T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000184962 2000-06-20
JP2000184962A JP3683779B2 (ja) 2000-06-20 2000-06-20 ワンダ発生器のｔｄｅｖマスク特性設定装置

Publications (2)

Publication Number Publication Date
DE60131807D1 true DE60131807D1 (de) 2008-01-24
DE60131807T2 DE60131807T2 (de) 2008-12-04

Family

ID=18685345

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60131807T Expired - Fee Related DE60131807T2 (de) 2000-06-20 2001-06-19 Wandergenerator mit Vorrichtung zum willkürlichen Setzen der TDEV Maske

Country Status (4)

Country Link
US (1) US6854068B2 (de)
EP (1) EP1167985B1 (de)
JP (1) JP3683779B2 (de)
DE (1) DE60131807T2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7206339B2 (en) * 1999-12-24 2007-04-17 Anritsu Corporation Wonder generator, digital line tester comprising the same, and phase noise transfer characteristic analyzer
JP3683779B2 (ja) * 2000-06-20 2005-08-17 アンリツ株式会社 ワンダ発生器のｔｄｅｖマスク特性設定装置
DE60205120T2 (de) 2002-10-18 2006-04-20 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Vorrichtung und Verfahren zur Erzeugung von Wander Noise
US8261120B2 (en) 2009-12-04 2012-09-04 Macronix International Co., Ltd. Clock integrated circuit
JP2012039567A (ja) * 2010-08-11 2012-02-23 Anritsu Corp ジッタ付加装置及びジッタ付加方法
US10775834B2 (en) 2018-10-23 2020-09-15 Macronix International Co., Ltd. Clock period tuning method for RC clock circuits
US11043936B1 (en) 2020-03-27 2021-06-22 Macronix International Co., Ltd. Tuning method for current mode relaxation oscillator

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4521865A (en) * 1982-05-28 1985-06-04 Winkler Dean M Programmable function generator
US5757652A (en) * 1995-12-21 1998-05-26 Tektronix, Inc. Electrical signal jitter and wander measurement system and method
JP2972993B2 (ja) * 1996-12-17 1999-11-08 アンリツ株式会社 タイムデビエーション測定装置
US6246738B1 (en) * 1998-11-19 2001-06-12 Pmc-Sierra Ltd. Phase modulated reduction of clock wander in synchronous wide area networks
JP3683779B2 (ja) * 2000-06-20 2005-08-17 アンリツ株式会社 ワンダ発生器のｔｄｅｖマスク特性設定装置
US6806877B2 (en) * 2001-12-18 2004-10-19 Agilent Technologies, Inc. Method for generating eye masks using a parametric representation

Also Published As

Publication number Publication date
JP2002009595A (ja) 2002-01-11
EP1167985B1 (de) 2007-12-12
US6854068B2 (en) 2005-02-08
JP3683779B2 (ja) 2005-08-17
EP1167985A3 (de) 2005-06-15
US20020007466A1 (en) 2002-01-17
EP1167985A2 (de) 2002-01-02
DE60131807T2 (de) 2008-12-04

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: ANRITSU CORP., ATSUGI-SHI, KANAGAWA, JP

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee