DE60112723D1 - Lssd schnittstelle - Google Patents

Lssd schnittstelle

Info

Publication number
DE60112723D1
DE60112723D1 DE60112723T DE60112723T DE60112723D1 DE 60112723 D1 DE60112723 D1 DE 60112723D1 DE 60112723 T DE60112723 T DE 60112723T DE 60112723 T DE60112723 T DE 60112723T DE 60112723 D1 DE60112723 D1 DE 60112723D1
Authority
DE
Germany
Prior art keywords
lssd
interface
lssd interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60112723T
Other languages
English (en)
Other versions
DE60112723T2 (de
Inventor
D Sanghani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sun Microsystems Inc
Original Assignee
Sun Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc filed Critical Sun Microsystems Inc
Application granted granted Critical
Publication of DE60112723D1 publication Critical patent/DE60112723D1/de
Publication of DE60112723T2 publication Critical patent/DE60112723T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE60112723T 2000-02-15 2001-02-14 Lssd schnittstelle Expired - Fee Related DE60112723T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US504595 1990-04-03
US09/504,595 US6629277B1 (en) 2000-02-15 2000-02-15 LSSD interface
PCT/US2001/004597 WO2001061369A1 (en) 2000-02-15 2001-02-14 Lssd interface

Publications (2)

Publication Number Publication Date
DE60112723D1 true DE60112723D1 (de) 2005-09-22
DE60112723T2 DE60112723T2 (de) 2006-05-18

Family

ID=24006937

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60112723T Expired - Fee Related DE60112723T2 (de) 2000-02-15 2001-02-14 Lssd schnittstelle

Country Status (6)

Country Link
US (1) US6629277B1 (de)
EP (1) EP1256009B1 (de)
JP (1) JP3633901B2 (de)
AU (1) AU2001236968A1 (de)
DE (1) DE60112723T2 (de)
WO (1) WO2001061369A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7047174B2 (en) * 2001-05-02 2006-05-16 Freescale Semiconductor, Inc. Method for producing test patterns for testing an integrated circuit
US7546568B2 (en) 2005-12-19 2009-06-09 Lsi Corporation Automation of tie cell insertion, optimization and replacement by scan flip-flops to increase fault coverage
JP4708269B2 (ja) * 2006-06-22 2011-06-22 シャープ株式会社 半導体装置、及び半導体装置の検査方法
US8239715B2 (en) * 2008-06-24 2012-08-07 International Business Machines Corporation Method and apparatus for a robust embedded interface
US7937632B2 (en) * 2008-06-24 2011-05-03 International Business Machines Corporation Design structure and apparatus for a robust embedded interface
US8538718B2 (en) 2010-12-14 2013-09-17 International Business Machines Corporation Clock edge grouping for at-speed test
CN105631077B (zh) * 2014-11-07 2020-05-15 恩智浦美国有限公司 具有增大的故障覆盖率的集成电路

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761695A (en) 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US3783254A (en) 1972-10-16 1974-01-01 Ibm Level sensitive logic system
US4293919A (en) 1979-08-13 1981-10-06 International Business Machines Corporation Level sensitive scan design (LSSD) system
US4477738A (en) 1982-06-14 1984-10-16 Ibm Corporation LSSD Compatible clock driver
US5172011A (en) * 1989-06-30 1992-12-15 Digital Equipment Corporation Latch circuit and method with complementary clocking and level sensitive scan capability
JP2553292B2 (ja) * 1991-12-20 1996-11-13 インターナショナル・ビジネス・マシーンズ・コーポレイション 論理回路テスト装置及び方法
US5463338A (en) 1993-06-07 1995-10-31 Vlsi Technology, Inc. Dual latch clocked LSSD and method
US5497378A (en) 1993-11-02 1996-03-05 International Business Machines Corporation System and method for testing a circuit network having elements testable by different boundary scan standards
US5783960A (en) * 1995-11-28 1998-07-21 International Business Machines Corporation Integrated circuit device with improved clock signal control
US5748645A (en) * 1996-05-29 1998-05-05 Motorola, Inc. Clock scan design from sizzle global clock and method therefor
US5920575A (en) * 1997-09-19 1999-07-06 International Business Machines Corporation VLSI test circuit apparatus and method
US6040725A (en) * 1998-06-02 2000-03-21 International Business Machines Corporation Dynamically configurable variable frequency and duty cycle clock and signal generation
US6304122B1 (en) * 2000-08-17 2001-10-16 International Business Machines Corporation Low power LSSD flip flops and a flushable single clock splitter for flip flops

Also Published As

Publication number Publication date
DE60112723T2 (de) 2006-05-18
EP1256009A1 (de) 2002-11-13
JP2003523520A (ja) 2003-08-05
AU2001236968A1 (en) 2001-08-27
WO2001061369A1 (en) 2001-08-23
EP1256009B1 (de) 2005-08-17
US6629277B1 (en) 2003-09-30
JP3633901B2 (ja) 2005-03-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee