DE60105044D1 - Verfahren zur individualisierung eines elements einer integrierten schaltung - Google Patents

Verfahren zur individualisierung eines elements einer integrierten schaltung

Info

Publication number
DE60105044D1
DE60105044D1 DE60105044T DE60105044T DE60105044D1 DE 60105044 D1 DE60105044 D1 DE 60105044D1 DE 60105044 T DE60105044 T DE 60105044T DE 60105044 T DE60105044 T DE 60105044T DE 60105044 D1 DE60105044 D1 DE 60105044D1
Authority
DE
Germany
Prior art keywords
vectors
composite
circuit
operators
customized
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60105044T
Other languages
English (en)
Other versions
DE60105044T2 (de
Inventor
Romain Desplats
Philippe Perdu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National dEtudes Spatiales CNES
Original Assignee
Centre National dEtudes Spatiales CNES
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National dEtudes Spatiales CNES filed Critical Centre National dEtudes Spatiales CNES
Publication of DE60105044D1 publication Critical patent/DE60105044D1/de
Application granted granted Critical
Publication of DE60105044T2 publication Critical patent/DE60105044T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
DE60105044T 2000-06-28 2001-06-26 Verfahren zur individualisierung eines elements einer integrierten schaltung Expired - Lifetime DE60105044T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0008337A FR2811086B1 (fr) 2000-06-28 2000-06-28 Procede d'individualisation d'un element de circuit integre
FR0008337 2000-06-28
PCT/FR2001/002024 WO2002001239A1 (fr) 2000-06-28 2001-06-26 Procede d'individualisation d'un element de circuit integre

Publications (2)

Publication Number Publication Date
DE60105044D1 true DE60105044D1 (de) 2004-09-23
DE60105044T2 DE60105044T2 (de) 2005-09-08

Family

ID=8851818

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60105044T Expired - Lifetime DE60105044T2 (de) 2000-06-28 2001-06-26 Verfahren zur individualisierung eines elements einer integrierten schaltung

Country Status (7)

Country Link
US (1) US7190822B2 (de)
EP (1) EP1327156B1 (de)
AT (1) ATE274191T1 (de)
DE (1) DE60105044T2 (de)
ES (1) ES2227237T3 (de)
FR (1) FR2811086B1 (de)
WO (1) WO2002001239A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8792835B2 (en) * 2008-09-22 2014-07-29 Centre National De La Recherche Scientifique System and method for wirelessly testing integrated circuits
US8503972B2 (en) 2008-10-30 2013-08-06 Digital Ally, Inc. Multi-functional remote monitoring system
US8509517B2 (en) * 2010-06-14 2013-08-13 Carnegie Mellon University Method and system for systematic defect identification
US9019431B2 (en) 2012-09-28 2015-04-28 Digital Ally, Inc. Portable video and imaging system
US10272848B2 (en) 2012-09-28 2019-04-30 Digital Ally, Inc. Mobile video and imaging system
US9159371B2 (en) 2013-08-14 2015-10-13 Digital Ally, Inc. Forensic video recording with presence detection
US10075681B2 (en) 2013-08-14 2018-09-11 Digital Ally, Inc. Dual lens camera unit
US9253452B2 (en) 2013-08-14 2016-02-02 Digital Ally, Inc. Computer program, method, and system for managing multiple data recording devices
US9841259B2 (en) 2015-05-26 2017-12-12 Digital Ally, Inc. Wirelessly conducted electronic weapon
US10013883B2 (en) 2015-06-22 2018-07-03 Digital Ally, Inc. Tracking and analysis of drivers within a fleet of vehicles
US10904474B2 (en) 2016-02-05 2021-01-26 Digital Ally, Inc. Comprehensive video collection and storage
US10521675B2 (en) 2016-09-19 2019-12-31 Digital Ally, Inc. Systems and methods of legibly capturing vehicle markings
US10911725B2 (en) 2017-03-09 2021-02-02 Digital Ally, Inc. System for automatically triggering a recording
US11024137B2 (en) 2018-08-08 2021-06-01 Digital Ally, Inc. Remote video triggering and tagging
US11950017B2 (en) 2022-05-17 2024-04-02 Digital Ally, Inc. Redundant mobile video recording

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB924432A (en) * 1958-08-18 1963-04-24 Thomas Stephen George Seaward Improved means for the identification of conductors in electric cables or circuits
JP3157674B2 (ja) * 1994-01-10 2001-04-16 日本電気株式会社 半導体集積回路の故障解析装置および方法
US5570376A (en) * 1994-10-05 1996-10-29 Sun Microsystems, Inc. Method and apparatus for identifying faults within a system
KR100212608B1 (ko) * 1996-01-12 1999-08-02 가네꼬 히사시 Cmos 집적 회로 고장 진단 장치 및 진단 방법
FR2786011B1 (fr) * 1998-11-13 2001-01-19 Centre Nat Etd Spatiales Procede de comparaison d'images enregistrees formees de pixels representant des equipotentielles d'au moins une puce de circuit integre
FR2785992B1 (fr) * 1998-11-13 2000-12-22 Centre Nat Etd Spatiales Procede et installation de localisation rapide d'un defaut dans un circuit integre

Also Published As

Publication number Publication date
US7190822B2 (en) 2007-03-13
ES2227237T3 (es) 2005-04-01
ATE274191T1 (de) 2004-09-15
EP1327156B1 (de) 2004-08-18
WO2002001239A1 (fr) 2002-01-03
FR2811086A1 (fr) 2002-01-04
US20030174171A1 (en) 2003-09-18
DE60105044T2 (de) 2005-09-08
FR2811086B1 (fr) 2002-10-11
EP1327156A1 (de) 2003-07-16

Similar Documents

Publication Publication Date Title
DE60105044D1 (de) Verfahren zur individualisierung eines elements einer integrierten schaltung
DE58901772D1 (de) Bauteil, insbesondere einbau-spuele sowie verfahren zu seiner herstellung.
DE502005010558D1 (de) Verfahren zur Bestimmung der Güte einer Menge von Eigenschaften, verwendbar zur Verifikation and zur Spezifikation von Schaltungen
EP0848342A3 (de) Verfahren zum Entwurf von integrierten Schaltungen, Databankgerät zum Entwurf von integrierten Schaltungen und Unterstützungsgerät zum Entwurf von integrierten Schaltungen
EP1114991A3 (de) Verfahren und Systeme zur Beurteilung von Maschinenfehlern
WO2000030070A3 (en) Method and apparatus for improved part-of-speech tagging
ATE286286T1 (de) Verfahren zur 3-d gesichtsmodellerzeugung aus gesichtsbildern
DK1032874T3 (da) Fremgangsmåde til styring af objekter og parameterværdier forbundet med objekterne i en simuleringsmodel
WO2006009591A3 (en) Interactive manual, system and method for vehicles and other complex equipment
EP0838772A3 (de) Verfahren und Vorrichtung zur Verifizierung eines Entwurfs mit Anwendung von Emulation und Simulation
HK1058847A1 (en) Object identification
WO2003090164A3 (en) System and method for providing inferencing services
DE69423061D1 (de) Gasturbinenschaufel, Verfahren zur Herstellung derselben sowie Gasturbine mit dieser Schaufel
CA2347742A1 (en) Generating a nonlinear model and generating drive signals for simulation testing using the same
WO2006029882A3 (de) Verfahren zur suche nach einem ähnlichen konstruktionsmodell
DE50005554D1 (de) Verfahren zur herstellung von formteilen sowie eine vorrichtung zur durchführung dieses verfahrens
ATE268348T1 (de) Wässrige epoxidharzdispersionen und verfahren zu ihrer herstellung
WO2005043278A3 (en) System and method for verifying and testing system requirements
WO2001054070A3 (en) Parametric modelling of shape and high resolution texture
GB2375857A (en) Method of designing a structural element
ATA111889A (de) Ferromagnetische ni-fe-legierung, und verfahren zur herstellung eines legierungsgegenstandes mit ausgezeichneter oberflaechenbeschaffenheit aus dieser legierung
WO2003027696A3 (de) Elektronischer baustein und verfahren zu dessen qualifizierungsmessung
EP1014309A3 (de) Mehrstufige Simulation
DE58901139D1 (de) Handschuh insbesondere fuer einen radioaktive stoffe enthaltenden handschuhkasten und verfahren zu seiner herstellung.
WO2000022553A3 (en) Method and apparatus for managing the configuration and functionality of a semiconductor design

Legal Events

Date Code Title Description
8364 No opposition during term of opposition