ATE274191T1 - Verfahren zur individualisierung eines elements einer integrierten schaltung - Google Patents

Verfahren zur individualisierung eines elements einer integrierten schaltung

Info

Publication number
ATE274191T1
ATE274191T1 AT01949534T AT01949534T ATE274191T1 AT E274191 T1 ATE274191 T1 AT E274191T1 AT 01949534 T AT01949534 T AT 01949534T AT 01949534 T AT01949534 T AT 01949534T AT E274191 T1 ATE274191 T1 AT E274191T1
Authority
AT
Austria
Prior art keywords
vectors
composite
circuit
operators
customized
Prior art date
Application number
AT01949534T
Other languages
English (en)
Inventor
Romain Desplats
Philippe Perdu
Original Assignee
Centre Nat Etd Spatiales
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Nat Etd Spatiales filed Critical Centre Nat Etd Spatiales
Application granted granted Critical
Publication of ATE274191T1 publication Critical patent/ATE274191T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Image Analysis (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Image Processing (AREA)
AT01949534T 2000-06-28 2001-06-26 Verfahren zur individualisierung eines elements einer integrierten schaltung ATE274191T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0008337A FR2811086B1 (fr) 2000-06-28 2000-06-28 Procede d'individualisation d'un element de circuit integre
PCT/FR2001/002024 WO2002001239A1 (fr) 2000-06-28 2001-06-26 Procede d'individualisation d'un element de circuit integre

Publications (1)

Publication Number Publication Date
ATE274191T1 true ATE274191T1 (de) 2004-09-15

Family

ID=8851818

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01949534T ATE274191T1 (de) 2000-06-28 2001-06-26 Verfahren zur individualisierung eines elements einer integrierten schaltung

Country Status (7)

Country Link
US (1) US7190822B2 (de)
EP (1) EP1327156B1 (de)
AT (1) ATE274191T1 (de)
DE (1) DE60105044T2 (de)
ES (1) ES2227237T3 (de)
FR (1) FR2811086B1 (de)
WO (1) WO2002001239A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8792835B2 (en) * 2008-09-22 2014-07-29 Centre National De La Recherche Scientifique System and method for wirelessly testing integrated circuits
US8503972B2 (en) 2008-10-30 2013-08-06 Digital Ally, Inc. Multi-functional remote monitoring system
US8509517B2 (en) * 2010-06-14 2013-08-13 Carnegie Mellon University Method and system for systematic defect identification
US10272848B2 (en) 2012-09-28 2019-04-30 Digital Ally, Inc. Mobile video and imaging system
US9019431B2 (en) 2012-09-28 2015-04-28 Digital Ally, Inc. Portable video and imaging system
US9253452B2 (en) 2013-08-14 2016-02-02 Digital Ally, Inc. Computer program, method, and system for managing multiple data recording devices
US9159371B2 (en) 2013-08-14 2015-10-13 Digital Ally, Inc. Forensic video recording with presence detection
US10075681B2 (en) 2013-08-14 2018-09-11 Digital Ally, Inc. Dual lens camera unit
US9841259B2 (en) 2015-05-26 2017-12-12 Digital Ally, Inc. Wirelessly conducted electronic weapon
US10013883B2 (en) 2015-06-22 2018-07-03 Digital Ally, Inc. Tracking and analysis of drivers within a fleet of vehicles
WO2017136646A1 (en) 2016-02-05 2017-08-10 Digital Ally, Inc. Comprehensive video collection and storage
US10521675B2 (en) 2016-09-19 2019-12-31 Digital Ally, Inc. Systems and methods of legibly capturing vehicle markings
US10911725B2 (en) 2017-03-09 2021-02-02 Digital Ally, Inc. System for automatically triggering a recording
US11024137B2 (en) 2018-08-08 2021-06-01 Digital Ally, Inc. Remote video triggering and tagging
US11950017B2 (en) 2022-05-17 2024-04-02 Digital Ally, Inc. Redundant mobile video recording

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB924432A (en) * 1958-08-18 1963-04-24 Thomas Stephen George Seaward Improved means for the identification of conductors in electric cables or circuits
JP3157674B2 (ja) * 1994-01-10 2001-04-16 日本電気株式会社 半導体集積回路の故障解析装置および方法
US5570376A (en) * 1994-10-05 1996-10-29 Sun Microsystems, Inc. Method and apparatus for identifying faults within a system
KR100212608B1 (ko) * 1996-01-12 1999-08-02 가네꼬 히사시 Cmos 집적 회로 고장 진단 장치 및 진단 방법
FR2786011B1 (fr) * 1998-11-13 2001-01-19 Centre Nat Etd Spatiales Procede de comparaison d'images enregistrees formees de pixels representant des equipotentielles d'au moins une puce de circuit integre
FR2785992B1 (fr) * 1998-11-13 2000-12-22 Centre Nat Etd Spatiales Procede et installation de localisation rapide d'un defaut dans un circuit integre

Also Published As

Publication number Publication date
DE60105044D1 (de) 2004-09-23
FR2811086A1 (fr) 2002-01-04
US20030174171A1 (en) 2003-09-18
ES2227237T3 (es) 2005-04-01
US7190822B2 (en) 2007-03-13
DE60105044T2 (de) 2005-09-08
EP1327156A1 (de) 2003-07-16
WO2002001239A1 (fr) 2002-01-03
FR2811086B1 (fr) 2002-10-11
EP1327156B1 (de) 2004-08-18

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