DE60041233D1 - GaAs MOSFET mit niedrigem Anschaltwiderstand und niedriger Kapazität - Google Patents

GaAs MOSFET mit niedrigem Anschaltwiderstand und niedriger Kapazität

Info

Publication number
DE60041233D1
DE60041233D1 DE60041233T DE60041233T DE60041233D1 DE 60041233 D1 DE60041233 D1 DE 60041233D1 DE 60041233 T DE60041233 T DE 60041233T DE 60041233 T DE60041233 T DE 60041233T DE 60041233 D1 DE60041233 D1 DE 60041233D1
Authority
DE
Germany
Prior art keywords
low
resistance
capacitance
gaas mosfet
gaas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60041233T
Other languages
English (en)
Inventor
Ashraf W Lotfi
Jian Tan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia of America Corp
Original Assignee
Lucent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lucent Technologies Inc filed Critical Lucent Technologies Inc
Application granted granted Critical
Publication of DE60041233D1 publication Critical patent/DE60041233D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66522—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with an active layer made of a group 13/15 material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
    • H01L29/7835—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with asymmetrical source and drain regions, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/20—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Junction Field-Effect Transistors (AREA)
DE60041233T 1999-10-06 2000-10-03 GaAs MOSFET mit niedrigem Anschaltwiderstand und niedriger Kapazität Expired - Lifetime DE60041233D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/412,847 US6369408B1 (en) 1999-10-06 1999-10-06 GaAs MOSFET having low capacitance and on-resistance and method of manufacturing the same

Publications (1)

Publication Number Publication Date
DE60041233D1 true DE60041233D1 (de) 2009-02-12

Family

ID=23634740

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60041233T Expired - Lifetime DE60041233D1 (de) 1999-10-06 2000-10-03 GaAs MOSFET mit niedrigem Anschaltwiderstand und niedriger Kapazität

Country Status (4)

Country Link
US (2) US6369408B1 (de)
EP (1) EP1091416B1 (de)
JP (1) JP4558911B2 (de)
DE (1) DE60041233D1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7038295B2 (en) * 2003-07-18 2006-05-02 Semiconductor Components Industries, L.L.C. DC/DC converter with depletion mode compound semiconductor field effect transistor switching device
US7429506B2 (en) * 2005-09-27 2008-09-30 Freescale Semiconductor, Inc. Process of making a III-V compound semiconductor heterostructure MOSFET
US20070090405A1 (en) * 2005-09-27 2007-04-26 Matthias Passlack Charge compensated dielectric layer structure and method of making the same
US7432565B2 (en) * 2005-09-27 2008-10-07 Freescale Semiconductor, Inc. III-V compound semiconductor heterostructure MOSFET device
US7682912B2 (en) 2006-10-31 2010-03-23 Freescale Semiconductor, Inc. III-V compound semiconductor device with a surface layer in access regions having charge of polarity opposite to channel charge and method of making the same
US20100088855A1 (en) * 2008-10-14 2010-04-15 Magna Mirrors Of America, Inc. Vehicle door handle assembly

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3890215A (en) * 1974-02-08 1975-06-17 Bell Telephone Labor Inc Electrochemical thinning of semiconductor devices
JPS5587483A (en) * 1978-12-25 1980-07-02 Fujitsu Ltd Mis type semiconductor device
US4805003A (en) * 1987-11-10 1989-02-14 Motorola Inc. GaAs MESFET
AU2864692A (en) * 1989-03-02 1994-02-14 Thunderbird Technologies, Inc. Fermi threshold silicon-on-insulator field effect transistor
US5132753A (en) * 1990-03-23 1992-07-21 Siliconix Incorporated Optimization of BV and RDS-on by graded doping in LDD and other high voltage ICs
DE69209678T2 (de) * 1991-02-01 1996-10-10 Philips Electronics Nv Halbleiteranordnung für Hochspannungsverwendung und Verfahren zur Herstellung
JP2746482B2 (ja) * 1991-02-14 1998-05-06 三菱電機株式会社 電界効果型トランジスタ及びその製造方法
US5543654A (en) * 1992-01-28 1996-08-06 Thunderbird Technologies, Inc. Contoured-tub fermi-threshold field effect transistor and method of forming same
US5357130A (en) * 1992-07-24 1994-10-18 Hughes Aircraft Company Low-noise cryogenic MOSFET
US5406096A (en) * 1993-02-22 1995-04-11 Texas Instruments Incorporated Device and method for high performance high voltage operation
US5303138A (en) * 1993-04-29 1994-04-12 At&T Bell Laboratories Low loss synchronous rectifier for application to clamped-mode power converters
US5550089A (en) * 1994-03-23 1996-08-27 Lucent Technologies Inc. Gallium oxide coatings for optoelectronic devices using electron beam evaporation of a high purity single crystal Gd3 Ga5 O12 source.
TW360982B (en) * 1996-01-26 1999-06-11 Matsushita Electric Works Ltd Thin film transistor of silicon-on-insulator type
US5781420A (en) * 1996-07-18 1998-07-14 International Power Devices, Inc. Single ended forward DC-to-DC converter providing enhanced resetting for synchronous rectification

Also Published As

Publication number Publication date
EP1091416A3 (de) 2003-03-05
JP4558911B2 (ja) 2010-10-06
EP1091416B1 (de) 2008-12-31
EP1091416A2 (de) 2001-04-11
US6369408B1 (en) 2002-04-09
JP2001189452A (ja) 2001-07-10
US6682962B2 (en) 2004-01-27
US20010050393A1 (en) 2001-12-13

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Legal Events

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