DE3905848A1 - Spinpolarisationsdetektor - Google Patents
SpinpolarisationsdetektorInfo
- Publication number
- DE3905848A1 DE3905848A1 DE3905848A DE3905848A DE3905848A1 DE 3905848 A1 DE3905848 A1 DE 3905848A1 DE 3905848 A DE3905848 A DE 3905848A DE 3905848 A DE3905848 A DE 3905848A DE 3905848 A1 DE3905848 A1 DE 3905848A1
- Authority
- DE
- Germany
- Prior art keywords
- electron beam
- spin polarization
- detector
- polarization detector
- target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010287 polarization Effects 0.000 title claims description 37
- 238000010894 electron beam technology Methods 0.000 claims description 36
- 238000001514 detection method Methods 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 239000011888 foil Substances 0.000 claims description 6
- 230000001133 acceleration Effects 0.000 claims description 5
- 229910001385 heavy metal Inorganic materials 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000010276 construction Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 241001663154 Electron Species 0.000 description 1
- 101100400378 Mus musculus Marveld2 gene Proteins 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/32—Measuring polarisation of particles
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63041991A JP2680018B2 (ja) | 1988-02-26 | 1988-02-26 | スピン偏極度検出器 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3905848A1 true DE3905848A1 (de) | 1989-08-31 |
DE3905848C2 DE3905848C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-02-25 |
Family
ID=12623661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3905848A Granted DE3905848A1 (de) | 1988-02-26 | 1989-02-24 | Spinpolarisationsdetektor |
Country Status (3)
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04206427A (ja) * | 1990-11-30 | 1992-07-28 | Hitachi Ltd | スピン検出器 |
JP3757263B2 (ja) * | 2000-05-02 | 2006-03-22 | 国立大学法人 北海道大学 | 電子スピン分析器 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59187281A (ja) * | 1984-03-16 | 1984-10-24 | Hitachi Ltd | 低エネルギ−荷電粒子線のスピン状態分析器 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2814730A (en) * | 1955-06-22 | 1957-11-26 | Harry R Fechter | Secondary emission monitor |
SU411359A1 (ru) * | 1972-02-25 | 1983-06-07 | Gambaryan R G | Способ элементного анализа состава вещества |
DE2646394C2 (de) * | 1976-10-14 | 1986-12-11 | Kernforschungsanlage Jülich GmbH, 5170 Jülich | Vorrichtung zur Bestimmung des Spinpolarisationsgrades eines Elektronenstrahls |
JPS5589256U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1978-12-15 | 1980-06-20 | ||
JPS56142383U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1980-03-26 | 1981-10-27 | ||
JPS60121657A (ja) * | 1983-11-11 | 1985-06-29 | Anelva Corp | 測定装置 |
JPS60177539A (ja) * | 1984-02-24 | 1985-09-11 | Hitachi Ltd | 走査型電子顕微鏡 |
US4760254A (en) * | 1985-06-07 | 1988-07-26 | Pierce Daniel T | Apparatus and method for electron spin polarization detection |
DE3532781A1 (de) * | 1985-09-13 | 1987-03-19 | Siemens Ag | Anordnung zur detektion von sekundaer- und/oder rueckstreuelektronen in einem elektronenstrahlgeraet |
JPS6273184A (ja) * | 1985-09-27 | 1987-04-03 | Hitachi Ltd | スピン検出器 |
JPS6273185A (ja) * | 1985-09-27 | 1987-04-03 | Hitachi Ltd | スピン検出器 |
CA2142805C (en) * | 1994-04-12 | 1999-06-01 | Greg Arthur Wendt | Method of making soft tissue products |
JPH087281A (ja) * | 1994-06-24 | 1996-01-12 | Hitachi Ltd | 光学的情報記録再生媒体及び装置 |
-
1988
- 1988-02-26 JP JP63041991A patent/JP2680018B2/ja not_active Expired - Lifetime
-
1989
- 1989-02-16 US US07/310,896 patent/US4954770A/en not_active Expired - Fee Related
- 1989-02-24 DE DE3905848A patent/DE3905848A1/de active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59187281A (ja) * | 1984-03-16 | 1984-10-24 | Hitachi Ltd | 低エネルギ−荷電粒子線のスピン状態分析器 |
Non-Patent Citations (4)
Title |
---|
Japanese J. of Applied Physics, Vol. 23, No. 3, 1984, S. L 187 - L 188 * |
Patents Abstracts of Japan, P-575, 14. Mai 1987, Vol. 11, No. 147 * |
Patents Abstracts of Japan, P-612, 5. Sept. 1987, Vol. 11, No. 274 * |
Phys. Bl. 42, 1986, Nr. 12, S. 400-406 * |
Also Published As
Publication number | Publication date |
---|---|
DE3905848C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-02-25 |
JP2680018B2 (ja) | 1997-11-19 |
JPH01217288A (ja) | 1989-08-30 |
US4954770A (en) | 1990-09-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |